APPARATUS AND METHOD FOR MEASURING ELECTRICAL PARAMETERS OF CIRCUIT
    2.
    发明申请
    APPARATUS AND METHOD FOR MEASURING ELECTRICAL PARAMETERS OF CIRCUIT 有权
    用于测量电路电气参数的装置和方法

    公开(公告)号:US20120262153A1

    公开(公告)日:2012-10-18

    申请号:US13422618

    申请日:2012-03-16

    IPC分类号: G01R1/00 G01R11/02 G01R19/00

    摘要: An apparatus for measuring an electrical parameter of a circuit includes a measuring unit, a plurality of connection terminals and a selection switch. The measuring unit measures the electrical parameter. The selection switch selectively causes a conduction between the selection switch and at least one of the plurality of connection terminals.

    摘要翻译: 一种用于测量电路的电参数的装置包括测量单元,多个连接端子和选择开关。 测量单元测量电气参数。 选择开关选择性地导致选择开关与多个连接端子中的至少一个之间的导通。