公开(公告)号：US10571484B2

公开(公告)日：2020-02-25

申请号：US14686834

申请日：2015-04-15

Applicant: Cirrus Logic, Inc.

Inventor： John L. Melanson ,  Anindya Bhattacharya ,  Roderick D. Holley ,  Ruoxin Jiang ,  Stephen T. Hodapp ,  John C. Tucker

IPC: G01P15/125

Abstract: In accordance with embodiments of the present disclosure, an apparatus for measuring acceleration may include a spring-mounted mass, a positional encoder configured to measure a position of the spring-mounted mass and output one or more signals indicative of a sine and a cosine of the position, a driver to set and maintain an oscillation of the spring-mounted mass, and a decoder configured to process the one or more signals to calculate an acceleration of the spring-mounted mass.

公开(公告)号：US20150301077A1

公开(公告)日：2015-10-22

申请号：US14686834

申请日：2015-04-15

Applicant: Cirrus Logic, Inc.

Inventor： John L. Melanson ,  Anindya Bhattacharya ,  Roderick D. Holley ,  Ruoxin Jiang ,  Stephen T. Hodapp ,  John C. Tucker

IPC: G01P15/125

CPC classification number: G01P15/125

Abstract: In accordance with embodiments of the present disclosure, an apparatus for measuring acceleration may include a spring-mounted mass, a positional encoder configured to measure a position of the spring-mounted mass and output one or more signals indicative of a sine and a cosine of the position, a driver to set and maintain an oscillation of the spring-mounted mass, and a decoder configured to process the one or more signals to calculate an acceleration of the spring-mounted mass.

Abstract translation: 根据本公开的实施例，用于测量加速度的装置可以包括弹簧安装的质量块，位置编码器被配置为测量弹簧安装质量块的位置，并输出一个或多个指示正弦和余弦的信号 所述位置，设置和保持所述弹簧安装的质量的振荡的驱动器，以及被配置为处理所述一个或多个信号以计算所述弹簧安装的质量块的加速度的解码器。

公开(公告)号：US09329614B1

公开(公告)日：2016-05-03

申请号：US13837830

申请日：2013-03-15

Applicant: Cirrus Logic, Inc.

Inventor： Prashanth Drakshapalli ,  John L. Melanson ,  Rod Holley ,  Thirumalai Rengachari ,  Ruoxin Jiang ,  Eric Swanson

IPC: G05F3/02 ,  G01R31/28 ,  G01R31/30 ,  G01R31/317 ,  H01L21/66

CPC classification number: G05F3/02 ,  G01R31/2875 ,  G01R31/2884 ,  G01R31/3004 ,  G01R31/31701 ,  H01L22/34

Abstract: In one embodiment a heating mechanism is provided with an integrated circuit for testing and calibration purposes. During production testing, heating elements may be activated in order to quickly bring an integrated circuit up to operating temperature for temperature testing or calibration. Once the operating test temperature has been reached, the circuit can be quickly and easily tested to show it is operable within the design temperature range and/or to obtain calibration data to correct for temperature drift. Calibration data may be used to create correction data, which may be stored within the integrated circuit. During normal operation, the correction data may be used to compensate for variations in operation due to temperature.

Abstract translation: 在一个实施例中，加热机构设置有用于测试和校准目的的集成电路。 在生产测试期间，可以激活加热元件，以便快速将集成电路带到工作温度进行温度测试或校准。 一旦达到了工作测试温度，该电路就可以快速方便地进行测试，以显示其在设计温度范围内可操作和/或获得校准数据以校正温度漂移。 可以使用校准数据来创建可以存储在集成电路内的校正数据。 在正常操作期间，可以使用校正数据来补偿由于温度导致的操作变化。