DEFECT DETECTION METHOD, DEVICE AND SYSTEM
    1.
    发明公开

    公开(公告)号:US20230419472A1

    公开(公告)日:2023-12-28

    申请号:US18465557

    申请日:2023-09-12

    Abstract: A defect detection method includes: obtaining an average grayscale value of an image; constructing a mapping table, where elements of the mapping table include a mapped value corresponding to each grayscale value within a grayscale value range of the image, a mapped value corresponding to a grayscale value greater than or equal to a reference value is a first value, a mapped value corresponding to a grayscale value less than the reference value is a second value, and the reference value is an absolute value of a difference between the average grayscale value and a preset grayscale value; searching for a mapped value corresponding to a grayscale value of each pixel in the image from the mapping table; segmenting the image to obtain a suspicious defect sub-image based on the mapped value corresponding to the grayscale value of each pixel; and inputting the suspicious defect sub-image into a machine learning model.

    Defect detection method and apparatus

    公开(公告)号:US11978189B2

    公开(公告)日:2024-05-07

    申请号:US18129819

    申请日:2023-03-31

    CPC classification number: G06T7/0002 G06T7/11 G06T7/136 G06T2207/20081

    Abstract: Embodiments of this application provide a defect detection method and apparatus. The method includes: obtaining an image for inspection; performing anomaly detection on the image for inspection to obtain an anomaly region image corresponding to the image for inspection; and performing defect classification on the anomaly region image to obtain defect detection information of the image for inspection. The defect detection method of the embodiments of this application is divided into two steps of anomaly detection and defect classification. Anomaly detection is performed on the image for inspection first, and then defect classification needs to be performed only on an anomaly region, reducing the workload of defect classification, thereby improving the efficiency of defect detection.

    DEFECT DETECTION METHOD AND APPARATUS
    7.
    发明公开

    公开(公告)号:US20240005469A1

    公开(公告)日:2024-01-04

    申请号:US18129819

    申请日:2023-03-31

    CPC classification number: G06T7/0002 G06T2207/20081 G06T7/136 G06T7/11

    Abstract: Embodiments of this application provide a defect detection method and apparatus. The method includes: obtaining an image for inspection; performing anomaly detection on the image for inspection to obtain an anomaly region image corresponding to the image for inspection; and performing defect classification on the anomaly region image to obtain defect detection information of the image for inspection. The defect detection method of the embodiments of this application is divided into two steps of anomaly detection and defect classification. Anomaly detection is performed on the image for inspection first, and then defect classification needs to be performed only on an anomaly region, reducing the workload of defect classification, thereby improving the efficiency of defect detection.

Patent Agency Ranking