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公开(公告)号：US06750899B1
公开(公告)日：2004-06-15
申请号：US09524133
申请日：2000-03-10
IPC分类号： H04N718
CPC分类号： G06T7/0004 , G01B11/2518 , G01B11/30 , G01N21/95684 , G06T2207/10152 , G06T2207/30152 , H04N5/372
摘要： A novel inspection system for inspecting an article of manufacture, such as a printed circuit board, is disclosed, where the system includes a strobed illuminator adapted to project light through a reticle so as to project a pattern of light onto an area of the printed circuit board. A board transport responsively positions the board to at least two distinct positions, where each position corresponding to a different phase of the projected light. Also included is a detector adapted to acquire at least two images of the area, each image corresponding to one of the at least two different phases. An encoder monitors the movement of the board and outputs a position output, and a processor connected to the encoder, the board transport, the illuminator and the detector controlledly energizes the illuminator to expose the area as a function of the position output, the processor co-siting the at least two images and constructing a height map image with the co-sited images.
摘要翻译： 公开了一种用于检查诸如印刷电路板的制品的新型检查系统，其中系统包括频闪照明器，其适用于通过掩模版投射光以将光线投射到印刷电路的区域上 板。 板传输响应地将板定位到至少两个不同的位置，其中每个位置对应于投影光的不同相位。 还包括检测器，其适于获取该区域的至少两个图像，每个图像对应于至少两个不同相中的一个。 编码器监视电路板的移动并输出位置输出，连接到编码器的处理器，电路板传输，照明器和检测器控制地照亮照明器，使位置输出的函数露出该区域，处理器 选择所述至少两个图像并且使用所述共同图像构建高度图图像。
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2.发明申请HIGH SPEED, HIGH RESOLUTION, THREE DIMENSIONAL PRINTED CIRCUIT BOARD INSPECTION SYSTEM 审中-公开高速，高分辨率，三维印刷电路板检测系统公开(公告)号：US20120133920A1
公开(公告)日：2012-05-31
申请号：US13309211
申请日：2011-12-01
申请人： Timothy A. Skunes , Carl E. Haugan , Paul R. Haugan , Eric P. Rudd , Steven K. Case , Beverly Caruso
发明人： Timothy A. Skunes , Carl E. Haugan , Paul R. Haugan , Eric P. Rudd , Steven K. Case , Beverly Caruso
IPC分类号： G01P3/40
CPC分类号： G01P3/40 , G01N21/8806 , G01N21/956 , H04N7/188 , H04N13/243 , H04N2013/0081
摘要： An optical inspection system includes a printed circuit board (PCB) transport and an illuminator that provides at least a first strobed illumination field. The illuminator includes a light pipe having a first end proximate the PCB, and a second end opposite the first end and spaced from the first end. An array of cameras is configured to digitally image the PCB and to generate a plurality of images of the PCB with the at least first strobed illumination field type. At least one structured light projector is disposed to project structured illumination on the PCB. The at least one array of cameras is configured to digitally image the PCB while the PCB is illuminated with structured light, to provide a plurality of structured light images. A processing device is configured to generate an inspection result as a function of the plurality of images and the plurality of structured light images.
摘要翻译： 光学检查系统包括印刷电路板（PCB）传输和提供至少第一选通照明场的照明器。 照明器包括具有靠近PCB的第一端的光管和与第一端相对并与第一端间隔开的第二端。 摄像机阵列被配置为对PCB进行数字成像并利用至少第一选通的照明场类型生成PCB的多个图像。 设置至少一个结构化的投光器以将结构化照明投影到PCB上。 所述至少一个相机阵列被配置为在PCB被结构化光照射的同时对PCB进行数字成像，以提供多个结构化的光图像。 处理装置被配置为产生作为多个图像和多个结构光图像的函数的检查结果。
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3.发明授权公开(公告)号：US08388204B2
公开(公告)日：2013-03-05
申请号：US12886784
申请日：2010-09-21
IPC分类号： F21V8/00
CPC分类号： H04N7/188 , G01N21/9501 , G01N21/956 , H04N13/243 , H04N2013/0081
摘要： An optical inspection system and method are provided. A workpiece transport moves a workpiece in a nonstop manner. An illuminator includes a light pipe and is configured to provide a first and second strobed illumination field types. First and second arrays of cameras are arranged to provide stereoscopic imaging of the workpiece. The first array of cameras is configured to generate a first plurality of images of the workpiece with the first illumination field and a second plurality of images of the feature with the second illumination field. The second array of cameras is configured to generate a third plurality of images of the workpiece with the first illumination field and a fourth plurality of images of the feature with the second illumination field. A processing device stores at least some of the first, second, third, and fourth pluralities of images and provides the images to an other device.
摘要翻译： 提供光学检查系统和方法。 工件传送以不间断的方式移动工件。 照明器包括光管并且被配置为提供第一和第二选通照明场类型。 照相机的第一和第二阵列被布置成提供工件的立体成像。 第一阵列相机被配置为利用第一照明场和具有第二照明场的特征的第二多个图像来生成工件的第一多个图像。 第二阵列相机被配置为利用第一照明场和具有第二照明场的特征的第四多个图像来生成工件的第三多个图像。 处理装置存储第一，第二，第三和第四多个图像中的至少一些，并将图像提供给另一个装置。
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公开(公告)号：US20110102575A1
公开(公告)日：2011-05-05
申请号：US12940214
申请日：2010-11-05
申请人： Steven K. Case , Beverly Caruso , Todd D. Liberty , Timothy A. Skunes , Carl E. Haugan , Chuanqi Chen
发明人： Steven K. Case , Beverly Caruso , Todd D. Liberty , Timothy A. Skunes , Carl E. Haugan , Chuanqi Chen
IPC分类号： H04N7/18
CPC分类号： H05K13/08 , G01N21/8806 , G01N21/956 , G06K9/2036
摘要： An electronics assembly line includes a first electronics assembly machine and a second electronics assembly machine. The first electronics assembly machine has a first electronics assembly machine outlet. The second electronics assembly machine has a second electronics assembly machine inlet and outlet. The inlet of the second electronics assembly machine is coupled to the outlet of the first electronics assembly machine by a conveyor. A first optical inspection sensor is disposed over the conveyor before the inlet of the second electronics assembly and is configured to provide first sensor inspection image data relative to a substrate that passes beneath the first optical inspection sensor in a non-stop fashion. A second optical inspection sensor is disposed over the conveyor after the outlet of the second electronics assembly machine and is configured to provide second sensor inspection image data relative to a substrate that passes beneath the second optical inspection sensor in a non-stop fashion. A computer is operably coupled to the first and second optical inspection sensors and is configured to provide an inspection result based upon at least one of the first and second inspection image data.
摘要翻译： 电子装配线包括第一电子组装机和第二电子组装机。 第一个电子组装机器具有第一电子组装机出口。 第二电子组装机具有第二电子组装机入口和出口。 第二电子组装机的入口通过输送机联接到第一电子组装机的出口。 在第二电子组件的入口之前，第一光学检测传感器设置在输送机之上，并且被配置为相对于以第一光学检测传感器以不间断方式通过的基板提供第一传感器检查图像数据。 在第二电子组装机器的出口之后，第二光学检测传感器设置在传送器上方并且被配置为相对于在第二光学检测传感器下方以不间断的方式通过的基板提供第二传感器检查图像数据。 计算机可操作地耦合到第一和第二光学检测传感器，并且被配置为基于第一和第二检查图像数据中的至少一个提供检查结果。
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公开(公告)号：US20110090333A1
公开(公告)日：2011-04-21
申请号：US12939267
申请日：2010-11-04
IPC分类号： H04N7/18
CPC分类号： H05K13/08 , G01N21/8806 , G01N21/956 , G06K9/2036 , G06K2009/2045 , G06T7/557 , G06T7/593 , G06T2207/10021 , G06T2207/30141
摘要： An optical inspection system for inspecting a substrate is provided. The system includes an array of cameras configured to acquire a plurality of sets of images as the substrate and the array undergo relative motion with respect to each other. At least one focus actuator is operably coupled to each camera of the array of cameras to cause displacement of at least a portion of each camera that affects focus. A substrate range calculator is configured to receive at least portions of images from the array and to calculate range between the array of cameras and the substrate. A controller is coupled to the array of cameras and to the range calculator. The controller is configured to provide a control signal to each of the at least one focus actuator to adaptively focus each camera of the array during the relative motion.
摘要翻译： 提供了一种用于检查基板的光学检查系统。 该系统包括被配置为获取多组图像作为基板并且阵列相对于彼此经历相对运动的相机阵列。 至少一个聚焦致动器可操作地耦合到相机阵列的每个相机，以引起影响焦点的每个相机的至少一部分的位移。 衬底范围计算器被配置为从阵列接收至少部分图像并计算相机阵列和衬底之间的范围。 控制器耦合到相机阵列和距离计算器。 控制器被配置为向至少一个聚焦致动器中的每一个提供控制信号，以在相对运动期间自适应地对准阵列的每个相机。
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公开(公告)号：US20120327215A1
公开(公告)日：2012-12-27
申请号：US13480079
申请日：2012-05-24
申请人： Steven K. Case , Beverly Caruso , Todd D. Liberty , Timothy A. Skunes , Carl E. Haugan , Chuanqi Chen , Hiroshi Anzai
发明人： Steven K. Case , Beverly Caruso , Todd D. Liberty , Timothy A. Skunes , Carl E. Haugan , Chuanqi Chen , Hiroshi Anzai
CPC分类号： G06K9/2036 , G01N21/8806 , G01N21/8903 , G01N21/956 , G06K2009/2045 , H05K13/0815
摘要： An optical inspection sensor is provided. The sensor includes an array of cameras configured to acquire image data relative to a workpiece that moves relative to the array of cameras in a non-stop fashion. An illumination system is disposed to provide a pulse of illumination when the array of cameras acquires the image data. At least some image data includes data regarding a skip mark or barcode on the workpiece.
摘要翻译： 提供光学检测传感器。 该传感器包括相机相机相对于摄像机阵列以不间断的方式移动的图像数据的摄像机阵列。 照明系统设置成当相机阵列获取图像数据时提供照明脉冲。 至少一些图像数据包括关于工件上的跳过标记或条形码的数据。
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7.发明申请公开(公告)号：US20110069154A1
公开(公告)日：2011-03-24
申请号：US12886784
申请日：2010-09-21
CPC分类号： H04N7/188 , G01N21/9501 , G01N21/956 , H04N13/243 , H04N2013/0081
摘要： An optical inspection system and method are provided. A workpiece transport moves a workpiece in a nonstop manner. An illuminator includes a light pipe and is configured to provide a first and second strobed illumination field types. First and second arrays of cameras are arranged to provide stereoscopic imaging of the workpiece. The first array of cameras is configured to generate a first plurality of images of the workpiece with the first illumination field and a second plurality of images of the feature with the second illumination field. The second array of cameras is configured to generate a third plurality of images of the workpiece with the first illumination field and a fourth plurality of images of the feature with the second illumination field. A processing device stores at least some of the first, second, third, and fourth pluralities of images and provides the images to an other device.
摘要翻译： 提供光学检查系统和方法。 工件传送以不间断的方式移动工件。 照明器包括光管并且被配置为提供第一和第二选通照明场类型。 照相机的第一和第二阵列被布置成提供工件的立体成像。 第一阵列相机被配置为利用第一照明场和具有第二照明场的特征的第二多个图像来生成工件的第一多个图像。 第二阵列相机被配置为利用第一照明场和具有第二照明场的特征的第四多个图像来生成工件的第三多个图像。 处理装置存储第一，第二，第三和第四多个图像中的至少一些，并将图像提供给另一个装置。
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公开(公告)号：US08681211B2
公开(公告)日：2014-03-25
申请号：US12939267
申请日：2010-11-04
CPC分类号： H05K13/08 , G01N21/8806 , G01N21/956 , G06K9/2036 , G06K2009/2045 , G06T7/557 , G06T7/593 , G06T2207/10021 , G06T2207/30141
摘要： An optical inspection system for inspecting a substrate is provided. The system includes an array of cameras configured to acquire a plurality of sets of images as the substrate and the array undergo relative motion with respect to each other. At least one focus actuator is operably coupled to each camera of the array of cameras to cause displacement of at least a portion of each camera that affects focus. A substrate range calculator is configured to receive at least portions of images from the array and to calculate range between the array of cameras and the substrate. A controller is coupled to the array of cameras and to the range calculator. The controller is configured to provide a control signal to each of the at least one focus actuator to adaptively focus each camera of the array during the relative motion.
摘要翻译： 提供了一种用于检查基板的光学检查系统。 该系统包括被配置为获取多组图像作为基板并且阵列相对于彼此经历相对运动的相机阵列。 至少一个聚焦致动器可操作地耦合到相机阵列的每个相机，以引起影响焦点的每个相机的至少一部分的位移。 衬底范围计算器被配置为从阵列接收至少部分图像并计算相机阵列和衬底之间的范围。 控制器耦合到相机阵列和距离计算器。 控制器被配置为向至少一个聚焦致动器中的每一个提供控制信号，以在相对运动期间自适应地对准阵列的每个相机。
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公开(公告)号：US08872912B2
公开(公告)日：2014-10-28
申请号：US12940214
申请日：2010-11-05
CPC分类号： H05K13/08 , G01N21/8806 , G01N21/956 , G06K9/2036
摘要： An electronics assembly line includes a first electronics assembly machine and a second electronics assembly machine. The first electronics assembly machine has a first electronics assembly machine outlet. The second electronics assembly machine has a second electronics assembly machine inlet and outlet. The inlet of the second electronics assembly machine is coupled to the outlet of the first electronics assembly machine by a conveyor. A first optical inspection sensor is disposed over the conveyor before the inlet of the second electronics assembly and is configured to provide first sensor inspection image data relative to a substrate that passes beneath the first optical inspection sensor in a non-stop fashion. A second optical inspection sensor is disposed over the conveyor after the outlet of the second electronics assembly machine and is configured to provide second sensor inspection image data relative to a substrate that passes beneath the second optical inspection sensor in a non-stop fashion. A computer is operably coupled to the first and second optical inspection sensors and is configured to provide an inspection result based upon at least one of the first and second inspection image data.
摘要翻译： 电子装配线包括第一电子组装机和第二电子组装机。 第一个电子组装机器具有第一电子组装机出口。 第二电子组装机具有第二电子组装机入口和出口。 第二电子组装机的入口通过输送机联接到第一电子组装机的出口。 在第二电子组件的入口之前，第一光学检测传感器设置在输送机之上，并且被配置为相对于在第一光学检测传感器下方以不间断的方式通过的基板提供第一传感器检查图像数据。 在第二电子组装机器的出口之后，第二光学检测传感器设置在传送器上方并且被配置为相对于在第二光学检测传感器下方以不间断的方式通过的基板提供第二传感器检查图像数据。 计算机可操作地耦合到第一和第二光学检测传感器，并且被配置为基于第一和第二检查图像数据中的至少一个提供检查结果。
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10.发明授权Method and apparatus for exposure control in light-based measurement instruments 失效光度测量仪器中曝光控制的方法和装置
公开(公告)号：US5519204A
公开(公告)日：1996-05-21
申请号：US232738
申请日：1994-04-25
申请人： Eric P. Rudd , Timothy A. Skunes
发明人： Eric P. Rudd , Timothy A. Skunes
CPC分类号： H04N5/335 , G01J1/32 , G01J1/44 , H04N5/3592
摘要： A method and apparatus for nearly instantaneous and wide dynamic range exposure control in light-based measurement instruments. The excess charge drained from a CCD array by anti-blooming circuitry is effectively monitored and distinguished from leakage current. Detection of the drained charge generates a signal to deactivate the light source exposing the CCD array. The exposure control device includes a unique circuit for detecting the operating state of an anti-blooming circuit associated with a CCD array, and a unique laser light driver that ramps up the light intensity of the laser light source in an approximately exponential manner.
摘要翻译： 一种用于光基测量仪器中几乎瞬时和宽动态范围曝光控制的方法和装置。 通过抗晕电路从CCD阵列排出的过量电荷被有效地监测并与漏电流区分开来。 排出的电荷的检测产生一个信号，以去激活曝光CCD阵列的光源。 曝光控制装置包括用于检测与CCD阵列相关联的防晕电路的操作状态的唯一电路，以及以近似指数的方式使激光光源的光强度上升的独特的激光驱动器。
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