Low leakage current operation of integrated circuit using scan chain
    10.
    发明授权
    Low leakage current operation of integrated circuit using scan chain 有权
    使用扫描链的集成电路的低漏电流操作

    公开(公告)号:US08689068B2

    公开(公告)日:2014-04-01

    申请号:US13305702

    申请日:2011-11-28

    IPC分类号: G01R31/28

    摘要: An integrated circuit (IC) having a low leakage current mode of operation has a number of modules for running respective applications. The modules have respective cells and respective test scan chain elements. The IC also has a controller for configuring an active module to operate in a functional mode and a selected inactive module to operate in a low leakage current mode. Configuring the selected inactive module to operate in low leakage current mode includes enabling scan mode of the selected inactive module, and applying a low leakage vector of input signals from the controller to the cells of the inactive module using the scan chain. Functional data outputs of the inactive module are disabled during low leakage current mode. In the meantime, the active modules continue to operate in the functional mode.

    摘要翻译: 具有低泄漏电流操作模式的集成电路(IC)具有用于运行各种应用的多个模块。 模块具有各自的单元和相应的测试扫描链元件。 该IC还具有用于配置有源模块以在功能模式下操作的控制器和所选择的非活动模块以低泄漏电流模式操作。 将所选择的非活动模块配置为以低泄漏电流模式工作,包括启用所选非活动模块的扫描模式,以及使用扫描链将来自控制器的输入信号的低泄漏矢量应用于非活动模块的单元。 低电流模式下禁用模块的功能数据输出。 同时,主动模块继续在功能模式下运行。