摘要:
A method for deposition of at least one electrically conducting film on a substrate, wherein the method includes the steps of: selecting a layer of a film material, wherein the layer includes a mask on a front side, and wherein the layer and the mask are one piece; positioning the front side of the layer upon the substrate; applying at least one laser pulse onto a back side of the layer, so as to melt and to vaporize at least parts of the layer such that melt droplets are propelled toward and deposited upon the substrate; and forming the film, wherein at least one slot of the mask limits the distribution of the melt droplets.
摘要:
The invention relates to a method for deposition of at least one electrically conducting film (20) on a substrate (30), comprising the steps: selecting a layer (10) of a film material, wherein the layer (10) comprises a mask (40) on a front side (11) and wherein the layer (10) and the mask (40) are one piece, positioning the front side (11) of the layer (10) upon the substrate (30), applying at least one laser pulse (120) onto a back side (12) of the layer (10), so as to melt and to vaporize at least parts of the layer (10) such that melt droplets (110) are propelled toward and deposited upon said substrate (30), forming the film (20), wherein at least one slot (45) of the mask (40) limits the distribution of said melt droplets (110).
摘要:
A package (1; 20) for protecting a device (2; 21) from ambient substances, the package comprising an enclosure surrounding the device (2; 21). The enclosure includes a multi-layer barrier (7; 24) and an internal substance binding member (14; 27) which is provided inside the enclosure to bind at least one of said ambient substances having penetrated the enclosure. The package (1; 20) further comprises an intermediate substance binding member (14; 29) which is provided between an inner (11a-b; 25) and an outer (16a-b; 28) barrier layer of the multi-layer barrier (7; 24) to bind a fraction of the substance having penetrated the outer barrier layer (16a-b; 28).
摘要:
A light emitting device includes a stack of layers having a basic layer, a first electrode layer and a second electrode layer. An organic light-emitting layer is sandwiched between the first and second electrode layers. At least one shunt element has a connection-end and a free-end. The connection-end is connected with one of the electrode layers, and the free-end is jutting out of the stack of layers.
摘要:
A package (1; 20) for protecting a device (2; 21) from ambient substances, the package comprising an enclosure surrounding the device (2; 21). The enclosure includes a multi-layer barrier (7; 24) and an internal substance binding member (14; 27) which is provided inside the enclosure to bind at least one of said ambient substances having penetrated the enclosure. The package (1; 20) further comprises an intermediate substance binding member (14; 29) which is provided between an inner (11a-b; 25) and an outer (16a-b; 28) barrier layer of the multi-layer barrier (7; 24) to bind a fraction of the substance having penetrated the outer barrier layer (16a-b; 28).
摘要:
The invention relates to a light emitting device (10), comprising a stack of layers (15) comprising a basic layer (20), a first electrode layer (30) and a second electrode layer (40), wherein an organic light-emitting layer (50) is sandwiched between the first (30) and the second electrode layer (40), with at least one shunt element (60,60′), comprising a connection-end (65) and a free-end (66), wherein the connection-end (65) is connected with one of the electrode layers (30,40), and wherein the free-end (66) is jutting out of the stack of layers (15). The invention further relates to a method to manufacture such a device.
摘要:
In vapor deposition applications, especially OLED mass production, where it is necessary to measure and/or control the deposition rate of evaporation sources within specific tolerances, a measurement system is adapted to use robust and accurate optical thickness measurement methods at high and low rate sources, so that the thickness of a layer deposited on a substrate can be measured and controlled. A first evaporation source (11) deposits a layer of material on a substrate (20). A mobile element (41) is provided, On which a film is deposited from a second evaporation source (12b) in a deposition location (D1). Subsequently the mobile element is conveyed to a measurement location (D2) where the thickness of the film is measured by a thickness detector (45). The measurement apparatus is arranged to control the deposition of the first evaporation source in dependence on the thickness of the film deposited on the mobile element.
摘要:
An arrangement (1) for holding a substrate (10) in a material deposition apparatus, which substrate (10) has a deposition side (10a) upon which material (M) is to be deposited, and which arrangement (1) comprises: a shadow mask (20) comprising a number of deposition openings (Di); a support structure (30) comprising a number of surround openings (Si); and a support structure holding means (6) for holding the support mask (30) and/or a substrate holding means (5) for holding the substrate (10), such that the support structure (30) is on the same side as the deposition side (10a) of the substrate (10), and the shadow mask (20) is positioned between the substrate (10) and the support structure (30) such that at least one deposition opening (Di) of the shadow mask (10) lies within a corresponding surround opening (Si) of the support structure (30).
摘要:
In vapour deposition applications, especially OLED mass production, where it is necessary to measure and/or control the deposition rate of evaporation sources within specific tolerances, a measurement system is adapted to use robust and accurate optical thickness measurement methods at high and low rate sources, so that the thickness of a layer deposited on a substrate can be measured and controlled. A first evaporation source (11) deposits a layer of material on a substrate (20). A mobile element (41) is provided, On which a film is deposited from a second evaporation source (12b) in a deposition location (D1). Subsequently the mobile element is conveyed to a measurement location (D2) where the thickness of the film is measured by a thickness detector (45). The measurement apparatus is arranged to control the deposition of the first evaporation source in dependence on the thickness of the film deposited on the mobile element.
摘要:
An arrangement (1) for holding a substrate (10) in a material deposition apparatus, which substrate (10) has a deposition side (10a) upon which material (M) is to be deposited, and which arrangement (1) comprises: a shadow mask (20) comprising a number of deposition openings (Di); a support structure (30) comprising a number of surround openings (Si); and a support structure holding means (6) for holding the support mask (30) and/or a substrate holding means (5) for holding the substrate (10), such that the support structure (30) is on the same side as the deposition side (10a) of the substrate (10), and the shadow mask (20) is positioned between the substrate (10) and the support structure (30) such that at least one deposition opening (Di) of the shadow mask (10) lies within a corresponding surround opening (Si) of the support structure (30).