Method and apparatus for decomposing semiconductor device patterns into phase and chrome regions for chromeless phase lithography
    1.
    发明授权
    Method and apparatus for decomposing semiconductor device patterns into phase and chrome regions for chromeless phase lithography 有权
    将半导体器件图案分解为无铬相光刻的相位和铬区域的方法和装置

    公开(公告)号:US07549140B2

    公开(公告)日:2009-06-16

    申请号:US11035737

    申请日:2005-01-18

    摘要: A method of generating a mask of use in printing a target pattern on a substrate. The method includes the steps of (a) determining a maximum width of features to be imaged on the substrate utilizing phase-structures formed in the mask; (b) identifying all features contained in the target pattern having a width which is equal to or less than the maximum width; (c) extracting all features having a width which is equal to or less than the maximum width from the target pattern; (d) forming phase-structures in the mask corresponding to all features identified in step (b); and (e) forming opaque structures in the mask for all features remaining in target pattern after performing step (c).

    摘要翻译: 一种生成用于在基板上印刷目标图案的掩模的方法。 该方法包括以下步骤:(a)使用形成在掩模中的相位结构来确定要在基板上成像的特征的最大宽度; (b)识别具有等于或小于最大宽度的宽度的目标图案中包含的所有特征; (c)从目标图案提取具有等于或小于最大宽度的宽度的所有特征; (d)在对应于在步骤(b)中识别的所有特征的掩模中形成相位结构; 和(e)在执行步骤(c)之后,在掩模中形成不透明结构以保持目标图案中的所有特征。

    Method and apparatus for performing model-based OPC for pattern decomposed features
    3.
    发明授权
    Method and apparatus for performing model-based OPC for pattern decomposed features 失效
    用于模式分解特征执行基于模型的OPC的方法和装置

    公开(公告)号:US08644589B2

    公开(公告)日:2014-02-04

    申请号:US13786249

    申请日:2013-03-05

    IPC分类号: G06K9/00 G06F17/50

    摘要: A method for decomposing a target circuit pattern containing features to be imaged into multiple patterns. The process includes the steps of separating the features to be printed into a first pattern and a second pattern; performing a first optical proximity correction process on the first pattern and the second pattern; determining an imaging performance of the first pattern and the second pattern; determining a first error between the first pattern and the imaging performance of the first pattern, and a second error between the second pattern and the imaging performance of said second pattern; utilizing the first error to adjust the first pattern to generate a modified first pattern; utilizing the second error to adjust the second pattern to generate a modified second pattern; and applying a second optical proximity correction process to the modified first pattern and the modified second pattern.

    摘要翻译: 一种用于将包含要成像的特征的目标电路图案分解为多个图案的方法。 该方法包括将待印刷的特征分离成第一图案和第二图案的步骤; 对所述第一图案和所述第二图案执行第一光学邻近校正处理; 确定所述第一图案和所述第二图案的成像性能; 确定所述第一图案和所述第一图案的成像性能之间的第一误差,以及所述第二图案和所述第二图案的成像性能之间的第二误差; 利用第一误差来调整第一图案以产生修改的第一图案; 利用第二误差来调整第二图案以产生修改的第二图案; 以及对修改的第一图案和修改的第二图案应用第二光学邻近校正处理。

    Method of achieving CD linearity control for full-chip CPL manufacturing
    4.
    发明授权
    Method of achieving CD linearity control for full-chip CPL manufacturing 有权
    实现全芯片CPL制造的CD线性控制的方法

    公开(公告)号:US07667216B2

    公开(公告)日:2010-02-23

    申请号:US11708029

    申请日:2007-02-20

    IPC分类号: G01N21/86 G03F1/00 G06F17/50

    CPC分类号: G03F1/36 G03F1/34

    摘要: A method of generating masks for printing a pattern including a plurality of features having varying critical dimensions. The method includes the steps of: (1) obtaining data representing the pattern; (2) defining a plurality of distinct zones based on the critical dimensions of the plurality of features; (3) categorizing each of the features into one of the plurality of distinct zones; and (4) modifying the mask pattern for each feature categorized into a predefined distinct zone of the plurality of distinct zones.

    摘要翻译: 一种生成用于打印包括具有不同临界尺寸的多个特征的图案的掩模的方法。 该方法包括以下步骤:(1)获取表示图案的数据; (2)基于所述多个特征的临界尺寸定义多个不同区域; (3)将每个特征分类为多个不同区域中的一个; 以及(4)对于分类为所述多个不同区域中的预定义的不同区域的每个特征修改所述掩模图案。

    Method of achieving CD linearity control for full-chip CPL manufacturing
    5.
    发明授权
    Method of achieving CD linearity control for full-chip CPL manufacturing 有权
    实现全芯片CPL制造的CD线性控制的方法

    公开(公告)号:US07211815B2

    公开(公告)日:2007-05-01

    申请号:US10659715

    申请日:2003-09-11

    IPC分类号: G01N21/86 G06F17/50

    CPC分类号: G03F1/36 G03F1/34

    摘要: A method of generating masks for printing a pattern including a plurality of features having varying critical dimensions. The method includes the steps of: (1) obtaining data representing the pattern; (2) defining a plurality of distinct zones based on the critical dimensions of the plurality of features; (3) categorizing each of the features into one of the plurality of distinct zones; and (4) modifying the mask pattern for each feature categorized into a predefined distinct zone of the plurality of distinct zones.

    摘要翻译: 一种生成用于打印包括具有不同临界尺寸的多个特征的图案的掩模的方法。 该方法包括以下步骤:(1)获取表示图案的数据; (2)基于所述多个特征的临界尺寸来定义多个不同区域; (3)将每个特征分类为多个不同区域中的一个; 以及(4)对于分类为所述多个不同区域中的预定义的不同区域的每个特征修改所述掩模图案。

    Illuminator controlled tone reversal printing
    6.
    发明授权
    Illuminator controlled tone reversal printing 失效
    照明器控制色调反转打印

    公开(公告)号:US07421677B2

    公开(公告)日:2008-09-02

    申请号:US10986118

    申请日:2004-11-12

    IPC分类号: G06F17/50

    摘要: A method of reversing the tone of an image to be printed in a layer of radiation sensitive material formed on a substrate includes defining a lithographic problem, designing a patterning device, determining a first illumination arrangement and a radiation sensitive material process capable of printing a positive tone of the lithographic feature; and determining a second illumination arrangement capable of printing a negative tone of the lithographic feature with the radiation sensitive material process.

    摘要翻译: 将形成在基板上的要被印刷的图像的色调反转的方法包括限定光刻问题,设计图案形成装置,确定第一照明装置和能够印刷正面的辐射敏感材料处理 光刻特征的色调; 以及确定能够用所述辐射敏感材料工艺印刷所述光刻特征的负色调的第二照明装置。

    Illuminator controlled tone reversal printing
    7.
    发明申请
    Illuminator controlled tone reversal printing 失效
    照明器控制色调反转打印

    公开(公告)号:US20050094121A1

    公开(公告)日:2005-05-05

    申请号:US10986118

    申请日:2004-11-12

    摘要: A method of reversing the tone of an image to be printed in a layer of radiation sensitive material formed on a substrate includes defining a lithographic problem, designing a patterning device, determining a first illumination arrangement and a radiation sensitive material process capable of printing a positive tone of the lithographic feature; and determining a second illumination arrangement capable of printing a negative tone of the lithographic feature with the radiation sensitive material process.

    摘要翻译: 将形成在基板上的要被印刷的图像的色调反转的方法包括限定光刻问题,设计图案形成装置,确定第一照明装置和能够印刷正面的辐射敏感材料处理 光刻特征的色调; 以及确定能够用所述辐射敏感材料工艺印刷所述光刻特征的负色调的第二照明装置。

    Method for creating and improved image on a photomask by negatively and positively overscanning the boundaries of an image pattern at inside corner locations
    8.
    发明授权
    Method for creating and improved image on a photomask by negatively and positively overscanning the boundaries of an image pattern at inside corner locations 失效
    通过负面地,积极地超越内部角落位置处的图像图案的边界来在光掩模上创建和改进图像的方法

    公开(公告)号:US06360134B1

    公开(公告)日:2002-03-19

    申请号:US09119103

    申请日:1998-07-20

    IPC分类号: G06F1900

    CPC分类号: G03F1/68

    摘要: An method for creating an image on a photosensitive material with enhanced inside corner resolution using a raster scan exposure system. The photosensitive material may comprise a layer of an unexposed photomask. An energy beam scan is extended by one or more addressable locations beyond the boundaries of the desire pattern at inside corner locations in both X and Y axes. Thus, the image formed in the photosensitive material and, in turn, the attenuator material more accurately reflects the desired image as defined in a data file.

    摘要翻译: 一种使用光栅扫描曝光系统在具有增强的内角分辨率的感光材料上创建图像的方法。 感光材料可以包括未曝光的光掩模层。 能量束扫描由位于X和Y轴内的角位置处的期望图案的边界之外的一个或多个可寻址位置延伸。 因此,形成在感光材料中的图像又是衰减材料更准确地反映了数据文件中所定义的所需图像。

    Use of intersecting subresolution features for microlithography
    9.
    发明授权
    Use of intersecting subresolution features for microlithography 有权
    使用相交的分解特征进行微光刻

    公开(公告)号:US6139994A

    公开(公告)日:2000-10-31

    申请号:US344251

    申请日:1999-06-25

    IPC分类号: G03F1/00 G03F7/20 G03F9/00

    CPC分类号: G03F7/70433 G03F1/50

    摘要: A method for creating an image on an image plane utilizing a photomask comprised of a plurality of intersecting subresolution features. Energy created by an energy source is projected through the subresolution features which diffract the light to produce constructive or positive interference thereby resulting in an image being formed on the image plane that is different than the image or pattern of subresolution features on the photomask.

    摘要翻译: 一种利用由多个相交的子分解特征组成的光掩模在图像平面上创建图像的方法。 由能量产生的能量通过衍射光的子分解特征投影,从而产生建构性或正面的干涉,从而导致图像平面上形成的图像不同于光掩模上的分解特征的图像或图案。

    Lithographic apparatus and device manufacturing method
    10.
    发明申请
    Lithographic apparatus and device manufacturing method 审中-公开
    平版印刷设备和器件制造方法

    公开(公告)号:US20060146307A1

    公开(公告)日:2006-07-06

    申请号:US11025602

    申请日:2004-12-30

    IPC分类号: G03B27/54

    CPC分类号: G03F7/70283 G03F7/70125

    摘要: A lithographic apparatus includes a support structure configured to hold a phase shift mask, the phase shift mask configured to pattern a beam of unpolarized radiation according to a desired pattern and a substrate table configured to hold a substrate. The lithographic apparatus also includes a projection system configured to project the patterned beam onto a target portion of the substrate on which a negative resist layer is deposited to form an image of the pattern on the negative resist layer.

    摘要翻译: 光刻设备包括被配置为保持相移掩模的支撑结构,所述相移掩模被配置为根据期望的图案对非偏振辐射束进行图案化,以及被配置为保持基板的基板台。 光刻设备还包括投影系统,该投影系统配置成将图案化的光束投影到其上沉积有负的抗蚀剂层的基板的目标部分上,以在负的抗蚀剂层上形成图案的图像。