公开(公告)号：US20150079722A1

公开(公告)日：2015-03-19

申请号：US14553968

申请日：2014-11-25

Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE

Inventor： Bongki MHEEN ,  Myoungsook OH ,  Kisoo KIM ,  Jae-Sik SIM ,  Yong-Hwan KWON ,  Eun Soo NAM

IPC: H01L31/18 ,  H01L31/0352 ,  H01L31/107

CPC classification number: H01L31/18 ,  H01L31/02002 ,  H01L31/035272 ,  H01L31/107

Abstract: Disclosed are an avalanche photodiode with a guard ring structure that relieves edge breakdown by an external voltage which is applied through a metal pad which is attached to the guard ring and a manufacturing method thereof. An avalanche photodiode with a guard ring structure includes a plurality of semiconductor layers laminated on a substrate; an active region partially formed above the semiconductor layers; a guard ring which is formed above the semiconductor layers and disposed so as to be spaced apart from the active region and have a ring shape that encloses the active region; and a connecting unit formed on the semiconductor layers to be electrically connected to the guard ring so as to apply an external voltage to the guard ring region. Therefore, the external voltage is applied to the guard ring of the avalanche diode through the connecting unit to relieve the edge breakdown.

Abstract translation: 本发明公开了一种具有保护环结构的雪崩光电二极管及其制造方法，所述雪崩光电二极管通过外部电压消除边缘击穿，所述外部电压通过附着于保护环的金属焊盘而施加。 具有保护环结构的雪崩光电二极管包括层叠在基板上的多个半导体层; 部分地形成在半导体层之上的有源区; 保护环，其形成在半导体层上方并且被设置成与有源区间隔开并且具有包围有源区的环形形状; 以及连接单元，其形成在所述半导体层上以与所述保护环电连接，以将外部电压施加到所述保护环区域。 因此，通过连接单元将外部电压施加到雪崩二极管的保护环，以缓解边缘故障。

公开(公告)号：US20140169786A1

公开(公告)日：2014-06-19

申请号：US14027445

申请日：2013-09-16

Applicant: Electronics and Telecommunications Research Institute

Inventor： Chun Ju YOUN ,  Jong-Hoi KIM ,  Joong-Seon CHOE ,  Duk Jun KIM ,  Yong-Hwan KWON ,  Eun Soo NAM

IPC: H04B10/077

CPC classification number: H04B10/0731 ,  H04B10/613 ,  H04L27/223 ,  H04L27/364 ,  H04L2027/0083

Abstract: Provided is an apparatus and method for measuring IQ imbalance, and in particular, is an apparatus and method for measuring IQ imbalance for an optical receiver. The apparatus for measuring IQ imbalance for an optical receiver includes a light generating unit generating optical and reference signals to provide the optical and reference signals to an optical receiver, a graph creating unit creating a Lissajous figure by using an in-phase (I) signal and a quadrature-phase (Q) signal output from the optical receiver in response to the optical and reference signals, and a calculating unit calculating IQ imbalance for the optical receiver with reference to the Lissajous figure.

Abstract translation: 提供了一种用于测量IQ不平衡的装置和方法，特别是用于测量光接收机的IQ不平衡的装置和方法。 用于测量光接收机的IQ不平衡的装置包括产生光学和参考信号以向光学接收器提供光学参考信号的光产生单元，通过使用同相（I）信号产生李萨诸图形的图形创建单元 以及响应于光学参考信号从光学接收器输出的正交相位（Q）信号，以及计算单元，参考利萨如图来计算光学接收机的IQ不平衡。

公开(公告)号：US20130308949A1

公开(公告)日：2013-11-21

申请号：US13950334

申请日：2013-07-25

Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE

Inventor： Chun Ju YOUN ,  Yong-Hwan KWON ,  Eun Soo NAM ,  Jong-Hoi KIM ,  Joong-Seon CHOE ,  Kwang-Seong CHOI

IPC: H04J14/00

CPC classification number: H04J14/00 ,  H04B10/6971 ,  H04L27/2096 ,  H04L27/2649 ,  H04L27/2697 ,  H04L2025/03375

Abstract: Provided is an optical OFDM receiver. The optical OFDM receiver receives an optical signal dependent on the nonlinearity of a transmitter. The optical OFDM receives includes an optical down converter, a nonlinearity compensator, and an OFDM demodulator. The optical down converter converts the optical signal into an electrical signal. The nonlinearity compensator filters the electrical signal, for compensating distortion which is added to the optical signal when the transmitter performs optical modulation. The OFDM demodulator demodulates the distortion-compensated electrical signal in an OFDM scheme.

Abstract translation: 提供了一种光学OFDM接收机。 光OFDM接收机根据发射机的非线性接收光信号。 光OFDM接收包括光下变频器，非线性补偿器和OFDM解调器。 光学下变频器将光信号转换成电信号。 非线性补偿器对电信号进行滤波，用于补偿当发射机执行光调制时加到光信号上的失真。 OFDM解调器以OFDM方案解调失真补偿电信号。

公开(公告)号：US20170236909A1

公开(公告)日：2017-08-17

申请号：US15248676

申请日：2016-08-26

Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE

Inventor： Ho Kyun AHN ,  Dong Min KANG ,  Yong-Hwan KWON ,  Dong-Young KIM ,  SEONG IL KIM ,  Hae Cheon KIM ,  Eun Soo NAM ,  Jae Won DO ,  Byoung-Gue MIN ,  Hyung Sup YOON ,  Sang-Heung LEE ,  Jong Min LEE ,  Jong-Won LIM ,  Hyun Wook JUNG ,  Kyu Jun CHO

IPC: H01L29/40 ,  H01L29/66 ,  H01L29/778 ,  H01L29/20 ,  H01L29/205

CPC classification number: H01L29/404 ,  H01L21/6835 ,  H01L29/0619 ,  H01L29/0657 ,  H01L29/2003 ,  H01L29/205 ,  H01L29/401 ,  H01L29/4175 ,  H01L29/66462 ,  H01L29/7786 ,  H01L29/7787 ,  H01L2221/68327 ,  H01L2221/6834

Abstract: A high electron mobility transistor includes a substrate including a first surface and a second surface facing each other and having a via hole passing through the first surface and the second surface, an active layer on the first surface, a cap layer on the active layer and including a gate recess region exposing a portion of the active layer, a source electrode and a drain electrode on one of the cap layer and the active layer, an insulating layer on the source electrode and the drain electrode and having on opening corresponding to the gate recess region to expose the gate recess region, a first field electrode on the insulating layer, a gate electrode electrically connected to the first field electrode on the insulating layer, and a second field electrode on the second surface and contacting the active layer through the via hole.

公开(公告)号：US20140205280A1

公开(公告)日：2014-07-24

申请号：US13934589

申请日：2013-07-03

Applicant: Electronics and Telecommunications Research Institute

Inventor： Joong-Seon CHOE ,  Chun Ju YOUN ,  Jong-Hoi KIM ,  Duk Jun KIM ,  Yong-Hwan KWON ,  Kwang-Seong CHOI ,  Eun Soo NAM

IPC: H04B10/07

CPC classification number: H04B10/0779

Abstract: Provided is a method of measuring signal transmission time difference of a measuring device. The measuring device according to embodiments, by measuring a skew on two optical paths through signal delays of sufficient sizes for skew measurement on the optical paths, even a skew having a minute size can be measured within a measureable range.

Abstract translation: 提供了测量装置的信号传输时间差的测量方法。 根据实施例的测量装置可以在可测量的范围内测量通过在光路上经过足够尺寸的信号延迟的两个光路上的偏斜，甚至具有微小尺寸的偏斜。

公开(公告)号：US20130341486A1

公开(公告)日：2013-12-26

申请号：US13755470

申请日：2013-01-31

Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE

Inventor： MyoungSook OH ,  Bongki MHEEN ,  Jae-Sik SIM ,  Kisoo KIM ,  Yun Jeong LEE ,  Yong-Hwan KWON ,  Eun Soo NAM

IPC: G01J1/42

CPC classification number: G01J1/42 ,  G01S7/481 ,  G01S7/4863 ,  G01S7/4914 ,  G01S17/42 ,  G01S17/89

Abstract: The present disclosure relates to an apparatus for obtaining 3D information using a photodetector array. The apparatus for obtaining 3D information includes: a light source unit configured to generate an optical signal of a predetermined wavelength band; a light transmission optical lens unit provided on a path of the optical signal and configured to emit the optical signal output from the light source unit in parallel or at a predetermined angle; an optical scanning unit configured to scan the light output from the light transmission optical lens unit to a surface of an object to be measured; a light reception optical lens unit configured to collect the light reflected from the surface of the object; and a photodetection unit configured to convert collected optical signals into respective electrical signals by arraying one or more photodetectors such that light reception portions thereof are collected at a center.

Abstract translation: 本公开涉及一种使用光电检测器阵列获得3D信息的装置。 用于获得3D信息的装置包括：光源单元，被配置为产生预定波长带的光信号; 光传输光学透镜单元，设置在所述光信号的路径上并被配置为平行地或以预定角度发射从所述光源单元输出的光信号; 光扫描单元，被配置为将从所述光传输光学透镜单元输出的光扫描到待测量对象的表面; 光接收光学透镜单元，被配置为收集从所述物体的表面反射的光; 以及光检测单元，被配置为通过排列一个或多个光电检测器将收集的光信号转换成各个电信号，使得其中的光接收部分被收集。