-
公开(公告)号:US12062732B2
公开(公告)日:2024-08-13
申请号:US16538733
申请日:2019-08-12
Applicant: The Boeing Company
Inventor: Richard R. King , Christopher M. Fetzer , Daniel C. Law , Xing-Quan Liu , William D. Hong , Kenneth M. Edmondson , Dimitri D. Krut , Joseph C. Boisvert , Nasser H. Karam
IPC: H01L31/044 , H01L31/0352 , H01L31/0687 , H01L31/0725 , H01L31/0735
CPC classification number: H01L31/0725 , H01L31/0352 , H01L31/035209 , H01L31/035218 , H01L31/035227 , H01L31/035272 , H01L31/0687 , H01L31/0735 , Y02E10/544
Abstract: In one aspect, optoelectronic devices are described herein. In some implementations, an optoelectronic device comprises a photovoltaic cell. The photovoltaic cell comprises a space-charge region, a quasi-neutral region, and a low bandgap absorber region (LBAR) layer or an improved transport (IT) layer at least partially positioned in the quasi-neutral region of the cell.
-
公开(公告)号:US20240213385A1
公开(公告)日:2024-06-27
申请号:US18602023
申请日:2024-03-12
Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Inventor: Guodong CHEN , Zhaohui LIU , Weile LIN , Wenming GUO , Yongsheng GUO , Yandong WANG , Shuojian SU , Yanfen WANG , Chuying OUYANG
IPC: H01L31/0352 , H01L31/0475
CPC classification number: H01L31/035272 , H01L31/0475
Abstract: A solar cell includes a plurality of sub-cells. The plurality of sub-cells are disposed sequentially along a first direction. The plurality of sub-cells each include a first photovoltaic conversion layer for performing photovoltaic conversion. The first direction is perpendicular to a thickness direction of the sub-cells. Along the first direction, a trend of change in a thickness of the first photovoltaic conversion layer of each sub-cell is negatively correlated to a trend of change in a cross-sectional area, perpendicular to the thickness direction, of each first photovoltaic conversion layer, so as to improve uniformity of photocurrents output by the sub-cells and uniformity of electrical current.
-
公开(公告)号:US20240204121A1
公开(公告)日:2024-06-20
申请号:US18457333
申请日:2023-08-28
Applicant: ZHEJIANG JINKO SOLAR CO., LTD.
Inventor: Changming LIU , Jingsheng JIN , Bike ZHANG , Xinyu ZHANG
IPC: H01L31/0352 , H01L31/0224 , H01L31/075
CPC classification number: H01L31/035272 , H01L31/022425 , H01L31/075
Abstract: Provided are a solar cell and a photovoltaic module. The solar cell includes a body and a first electrode. The body has a first region and a second region, and at least part of the first region covers the first electrode. The body includes a substrate, a first tunneling layer, a first doped conductive layer, and a second doped conductive layer. The first tunneling layer has a greater thickness in the first region than in the second region. The first tunneling layer is arranged between the first doped conductive layer and the second doped conductive layer. The first electrode is electrically connected to the first doped conductive layer. The second doped conductive layer is located on a side of the substrate close to the first tunneling layer. The second doped conductive layer has a less thickness in the first region than in the second region.
-
公开(公告)号:US12002906B2
公开(公告)日:2024-06-04
申请号:US17406521
申请日:2021-08-19
Applicant: EPISTAR CORPORATION
Inventor: Hao-Chun Liang , Wei-Shan Yeoh , Yao-Ning Chan , Yi-Ming Chen , Shih-Chang Lee
IPC: H01L33/44 , H01L31/02 , H01L31/0216 , H01L31/0352 , H01L33/20 , H01L33/46 , H01L33/62 , H01L31/0224 , H01L33/38
CPC classification number: H01L33/44 , H01L31/02005 , H01L31/02161 , H01L31/035272 , H01L33/20 , H01L33/46 , H01L33/62 , H01L31/022408 , H01L33/38
Abstract: The present disclosure provides a semiconductor device and a semiconductor component. The semiconductor device includes an active structure, a ring-shaped semiconductor contact layer, a first electrode, and an insulating layer. The active structure has a first-conductivity-type semiconductor layer, a second-conductivity-type semiconductor layer, and an active layer located between the first-conductivity-type semiconductor layer and the second-conductivity-type semiconductor layer. The ring-shaped semiconductor contact layer is located on the second-conductivity-type semiconductor layer and having a first inner sidewall and a first outer sidewall. The first electrode has an upper surface and covers the ring-shaped semiconductor contact layer. The insulating layer covers the first electrode and the active structure and has a second inner sidewall and a second outer sidewall. The first inner sidewall is not flush with the second inner sidewall in a vertical direction.
-
公开(公告)号:US11973159B2
公开(公告)日:2024-04-30
申请号:US17633717
申请日:2019-08-28
Applicant: Nippon Telegraph and Telephone Corporation
Inventor: Kotaro Takeda , Kiyofumi Kikuchi , Yoshiho Maeda , Tatsuro Hiraki
IPC: H01L31/107 , H01L31/0232 , H01L31/028 , H01L31/0352
CPC classification number: H01L31/1075 , H01L31/02327 , H01L31/028 , H01L31/035272
Abstract: Provided is a photodetector which can be manufactured in a standard process of a mass-produced CMOS foundry. The photodetector includes a silicon (Si) substrate; a lower clad layer; a core layer including a waveguide layer configured to guide signal light, and including a first Si slab doped with first conductive impurity ions and a second Si slab doped with second conductive impurity ions; a germanium (Ge) layer configured to absorb light and including a Ge region doped with the first conductive impurity ions; an upper clad layer; and electrodes respectively connected to the first and second Si slabs and the Ge region. A region of the core layer sandwiched between the first Si slab and the second Si slab operates as an amplification layer.
-
公开(公告)号:US20240088195A1
公开(公告)日:2024-03-14
申请号:US18511731
申请日:2023-11-16
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Chia-Yu WEI , Yen-Liang LIN , Kuo-Cheng LEE , Hsun-Ying HUANG , Hsin-Chi CHEN
IPC: H01L27/146 , H01L31/0352 , H01L31/103
CPC classification number: H01L27/14649 , H01L27/1461 , H01L27/1463 , H01L27/1464 , H01L27/14645 , H01L27/14698 , H01L31/035272 , H01L31/103 , H01L27/14621 , H01L27/14627 , H01L31/0336
Abstract: An image sensor device includes a semiconductor substrate, a radiation sensing member, a shallow trench isolation, and a color filter layer. The radiation sensing member is in the semiconductor substrate. An interface between the radiation sensing member and the semiconductor substrate includes a direct band gap material. The shallow trench isolation is in the semiconductor substrate and surrounds the radiation sensing member. The color filter layer covers the radiation sensing member.
-
公开(公告)号:US20240063317A1
公开(公告)日:2024-02-22
申请号:US18385213
申请日:2023-10-30
Applicant: W&W Sens Devices, Inc.
Inventor: Shih-Yuan WANG , Shih-Ping WANG
IPC: H01L31/0352 , H01L31/075 , H01L31/105 , G02B6/136 , H01L31/028 , H01L31/0224 , H01L31/0312 , H01L31/036 , H01L31/077 , H01L31/18 , H01L31/107 , H01L31/054 , G02B6/122 , H01L23/66 , H01L31/02 , H01L31/0232 , H01L31/0236 , H01L31/024 , H01L31/0304 , H01L31/0745
CPC classification number: H01L31/035272 , H01L31/035281 , H01L31/075 , H01L31/105 , G02B6/136 , H01L31/0284 , H01L31/035227 , H01L31/022475 , H01L31/035209 , H01L31/0312 , H01L31/036 , H01L31/077 , H01L31/1808 , H01L31/1812 , H01L31/1075 , H01L31/028 , H01L31/1055 , H01L31/107 , H01L31/054 , G02B6/122 , H01L23/66 , H01L31/02005 , H01L31/02019 , H01L31/022408 , H01L31/02327 , H01L31/02363 , H01L31/024 , H01L31/0304 , H01L31/03046 , H01L31/0745 , H01L31/1804 , H01L31/184 , H01L31/1844 , H01L31/02016 , G02B2006/12176
Abstract: Techniques for enhancing the absorption of photons in semiconductors with the use of microstructures are described. The microstructures, such as pillars and/or holes, effectively increase the effective absorption length resulting in a greater absorption of the photons. Using microstructures for absorption enhancement for silicon photodiodes and silicon avalanche photodiodes can result in bandwidths in excess of 10 Gb/s at photons with wavelengths of 850 nm, and with quantum efficiencies of approximately 90% or more.
-
公开(公告)号:US20230395740A1
公开(公告)日:2023-12-07
申请号:US17859975
申请日:2022-07-07
Applicant: JINKO SOLAR (HAINING) CO., LTD.
Inventor: Jie MAO , Menglei XU , Peiting ZHENG , Jie YANG , Xinyu ZHANG
IPC: H01L31/06 , H01L31/05 , H01L31/0352
CPC classification number: H01L31/06 , H01L31/0504 , H01L31/035272
Abstract: A photovoltaic cell is provided, including: a substrate; a tunneling layer, a field passivation layer and a first passivation film that are sequentially disposed on a rear surface of the substrate; and a first electrode. The first electrode penetrates the first passivation film and is in contact with the field passivation layer. A doping concentration of the first doping element in the tunneling layer is less than a doping concentration of the first doping element in the field passivation layer, and the doping concentration of the first doping element in the tunneling layer is greater than a doping concentration of the first doping element in the substrate. The field passivation layer includes a first doped region and a second doped region, and a doping curve slope of the first doped region is greater than a doping curve slope of the second doped region.
-
公开(公告)号:US11837681B2
公开(公告)日:2023-12-05
申请号:US17414420
申请日:2019-12-09
Applicant: NATIONAL RESEARCH COUNCIL OF CANADA
Inventor: Oliver Pitts , Omid Salehzadeh Einabad
IPC: H01L31/18 , H01L31/0304 , H01L31/0352 , H01L31/107
CPC classification number: H01L31/1844 , H01L31/03042 , H01L31/03046 , H01L31/035272 , H01L31/1075 , H01L31/1864
Abstract: An avalanche photodiode with a diffused junction and the method for its fabrication are disclosed. The method comprising forming, on a substrate, a first high-doped region and a low-doped region; performing selective area growth (SAG) with in-situ etchant on the low-doped region to grow a SAG structure; and diffusing through the SAG structure to form a second high-doped region in the low-doped region.
-
公开(公告)号:US20230170425A1
公开(公告)日:2023-06-01
申请号:US17662944
申请日:2022-05-11
Applicant: RAYNERGY TEK INCORPORATION
Inventor: YI-MING CHANG , JHAO-LIN WU , ZI-WAN SUN
IPC: H01L31/0224 , H01L31/10 , H01L31/0352 , H01L51/44
CPC classification number: H01L31/022408 , H01L31/10 , H01L31/035272 , H01L51/441
Abstract: An optoelectronic semiconductor structure is revealed. The optoelectronic semiconductor structure includes a substrate, a first electrode, an electrode contact, a semiconductor layer, and a second electrode. After a photoactive layer of the semiconductor structure absorbs energy from a light source to generate an exciton, the exciton dissociates into a first carrier and a second carrier. The first carrier is transferred to the first electrode through the first interface layer while the second carrier is transferred from the second electrode to the electrode contact directly by a tunneling effect.
-
-
-
-
-
-
-
-
-