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1.发明申请IMPEDANCE MATCHING CIRCUIT, POWER AMPLIFIER AND MANUFACTURING METHOD FOR VARIABLE CAPACITOR 审中-公开阻抗匹配电路，功率放大器和可变电容器的制造方法公开(公告)号：US20160020147A1
公开(公告)日：2016-01-21
申请号：US14862123
申请日：2015-09-22
Inventor： Jongmin LEE , Byoung-Gue MIN , Seong-il KIM , Hyung Sup YOON , Jae Kyoung MUN , Eun Soo NAM
IPC: H01L21/8222 , H01L27/06
CPC classification number: H01L21/8222 , H01G7/00 , H01L27/0647 , H01L27/0658 , H01L29/93 , H03F1/565 , H03F3/21 , H03F2200/36 , H03F2200/378 , H03F2200/387 , H03F2200/391 , H03H7/38 , Y10T29/43
Abstract: A manufacturing method for a variable capacitor includes forming a first element of which a capacitance value depends on a voltage applied to both of two terminals of a first area on a substrate, forming a second element having a capacitance value fixed to a second area on the substrate adjacent to the first area, and forming metallic wires for connecting the first element and the second element and connecting the first element and the second element with the outside. The first element maybe a bipolar transistor that may include a diode. The second element maybe a capacitor that includes a dielectric.
Abstract translation: 一种可变电容器的制造方法，包括：形成电容值取决于施加到基板上的第一区域的两端的电压的第一元件，形成具有固定在第二区域上的电容值的第二元件 基板，与第一区域相邻，并且形成用于连接第一元件和第二元件的金属线，并且将第一元件和第二元件与外部连接。 第一个元件可以是可以包括二极管的双极晶体管。 第二元件可以是包括电介质的电容器。
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公开(公告)号：US20150171188A1
公开(公告)日：2015-06-18
申请号：US14633984
申请日：2015-02-27
Inventor： Hyung Sup YOON , Byoung-Gue MIN , Jong-Won LIM , Hokyun AHN , Seong-Il Kim , Sang Heung LEE , Dong Min KANG , Chull Won JU , Jae Kyoung MUN
IPC: H01L29/66 , H01L29/201 , H01L21/02 , H01L21/28 , H01L21/311 , H01L29/423 , H01L29/20 , H01L29/205
CPC classification number: H01L29/66462 , H01L21/02118 , H01L21/0217 , H01L21/02178 , H01L21/0254 , H01L21/28264 , H01L21/28593 , H01L21/31111 , H01L21/31144 , H01L29/2003 , H01L29/201 , H01L29/205 , H01L29/404 , H01L29/42316 , H01L29/42376 , H01L29/778 , H01L29/7786
Abstract: A field effect transistor is provided. The field effect transistor may include a capping layer on a substrate, a source ohmic electrode and a drain ohmic electrode on the capping layer, a first insulating layer and a second insulating layer stacked on the capping layer to cover the source and drain ohmic electrodes, a Γ-shaped gate electrode including a leg portion and a head portion, the leg portion being connected to the substrate between the source ohmic electrode and the drain ohmic electrode, and the head portion extending from the leg portion to cover a top surface of the second insulating layer, a first planarization layer on the second insulating layer to cover the Γ-shaped gate electrode, and a first electrode on the first planarization layer, the first electrode being connected to the source ohmic electrode or the drain ohmic electrode.
Abstract translation: 提供场效应晶体管。 场效应晶体管可以包括衬底上的覆盖层，覆盖层上的源欧姆电极和漏极欧姆电极，堆叠在覆盖层上以覆盖源极和漏极欧姆电极的第一绝缘层和第二绝缘层， 包括脚部和头部的栅格电极，所述脚部分连接到所述源欧姆电极和所述漏极欧姆电极之间的衬底，并且所述头部从所述腿部延伸以覆盖所述源极欧姆电极和所述漏极欧姆电极的顶表面 所述第二绝缘层，在所述第二绝缘层上覆盖所述栅格电极的第一平坦化层和所述第一平坦化层上的第一电极，所述第一电极连接到所述源欧姆电极或所述漏极欧姆电极。
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公开(公告)号：US20150349736A1
公开(公告)日：2015-12-03
申请号：US14666163
申请日：2015-03-23
Inventor： Sang Heung LEE , Dong Min KANG , SEONG IL KIM , Ho Kyun AHN , Hyung Sup YOON , Jong Won LIM , Chull Won JU
CPC classification number: H03G1/0088 , H03F1/083 , H03F3/08 , H03F2200/153 , H03G3/12
Abstract: Provided herein is a feedback amplifier including an amplifier circuit configured to amplify an input signal input from an input terminal and output the amplified input signal to an output terminal; a feedback circuit configured to apply a feedback resistance value to a signal output to the output terminal, and to control a gain of the amplifier circuit by adjusting the input signal by a bias voltage applied with a feedback resistance value determined; a packet signal sensor configured to generate a fixed resistance control signal for controlling a fixed resistance value included in the feedback resistance value through a comparison between the output from the output terminal with a minimum signal level; and a fixed resistance controller configured to control the fixed resistance value included in the feedback resistance value in response to the fixed resistance control signal.
Abstract translation: 本文提供了一种反馈放大器，包括：放大器电路，被配置为放大从输入端输入的输入信号，并将放大的输入信号输出到输出端; 反馈电路，被配置为向输出端子输出的信号施加反馈电阻值，并且通过利用所确定的反馈电阻值施加的偏置电压来调节所述输入信号来控制所述放大器电路的增益; 分组信号传感器，被配置为通过比较来自所述输出端子的输出与最小信号电平之间的比较，产生用于控制所述反馈电阻值中包括的固定电阻值的固定电阻控制信号; 以及固定电阻控制器，其被配置为响应于所述固定电阻控制信号来控制包括在所述反馈电阻值中的所述固定电阻值。
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4.发明申请GaN TRANSISTOR WITH IMPROVED BONDING PAD STRUCTURE AND METHOD OF FABRICATING THE SAME 有权具有改进的粘结片结构的GaN晶体管及其制造方法公开(公告)号：US20150206847A1
公开(公告)日：2015-07-23
申请号：US14453969
申请日：2014-08-07
Inventor： Hae Cheon KIM , Ho Kyun AHN , Byoung Gue MIN , Hyung Sup YOON , Jong Won LIM
IPC: H01L23/00
CPC classification number: H01L24/05 , H01L24/03 , H01L24/48 , H01L2224/0225 , H01L2224/03466 , H01L2224/03848 , H01L2224/0401 , H01L2224/04042 , H01L2224/05083 , H01L2224/05084 , H01L2224/05124 , H01L2224/05144 , H01L2224/05155 , H01L2224/05166 , H01L2224/05644 , H01L2224/48463 , H01L2924/00014 , H01L2924/10158 , H01L2924/1033 , H01L2924/1304 , H01L2924/13091 , H01L2924/1423 , H01L2924/201 , H01L2924/37001 , H01L2224/45099
Abstract: The present invention relates to a GaN transistor, and a method of fabricating the same, in which a structure of a bonding pad is improved by forming an ohmic metal layer at edges of the bonding pad of a source, a drain, and a gate so as to be appropriate to wire-bonding or a back-side via-hole forming process. Accordingly, adhesive force between a metal layer of the bonding pad and a GaN substrate is enhanced by forming the ohmic metal at the edges of the bonding pad during manufacturing of the GaN transistor, thereby minimizing a separation phenomenon of a pad layer during the wire-bonding or back-side via-hole forming process, and improving reliability of a device.
Abstract translation: 本发明涉及一种GaN晶体管及其制造方法，其中通过在源极，漏极和栅极的焊盘的边缘处形成欧姆金属层来改善焊盘的结构，因此 适于引线接合或背面通孔形成工艺。 因此，通过在制造GaN晶体管期间在焊盘的边缘处形成欧姆金属，可以增强焊盘的金属层与GaN基板之间的粘合力， 接合或背面通孔形成工艺，并提高器件的可靠性。
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公开(公告)号：US20150087142A1
公开(公告)日：2015-03-26
申请号：US14555182
申请日：2014-11-26
Inventor： Jong-Won LIM , Ho Kyun AHN , Young Rak PARK , Dong Min KANG , Woo Jin CHANG , Seong-il KIM , Sung Bum BAE , Sang-Heung LEE , Hyung Sup YOON , Chull Won JU , Jae Kyoung MUN , Eun Soo NAM
IPC: H01L29/66 , H01L21/311 , H01L21/28 , H01L29/423
CPC classification number: H01L29/66431 , H01L21/28255 , H01L21/31116 , H01L21/31144 , H01L29/1608 , H01L29/42316 , H01L29/42376 , H01L29/66068 , H01L29/7787
Abstract: Disclosed is a manufacturing method of a high electron mobility transistor. The method includes: forming a source electrode and a drain electrode on a substrate; forming a first insulating film having a first opening on an entire surface of the substrate, the first opening exposing a part of the substrate; forming a second insulating film having a second opening within the first opening, the second opening exposing a part of the substrate; forming a third insulating film having a third opening within the second opening, the third opening exposing a part of the substrate; etching a part of the first insulating film, the second insulating film and the third insulating film so as to expose the source electrode and the drain electrode; and forming a T-gate electrode on a support structure including the first insulating film, the second insulating film and the third insulating film.
Abstract translation: 公开了一种高电子迁移率晶体管的制造方法。 该方法包括：在基板上形成源电极和漏电极; 在所述基板的整个表面上形成具有第一开口的第一绝缘膜，所述第一开口暴露所述基板的一部分; 在所述第一开口内形成具有第二开口的第二绝缘膜，所述第二开口暴露所述基板的一部分; 在所述第二开口内形成具有第三开口的第三绝缘膜，所述第三开口暴露所述基板的一部分; 蚀刻第一绝缘膜，第二绝缘膜和第三绝缘膜的一部分，以使源电极和漏电极露出; 以及在包括第一绝缘膜，第二绝缘膜和第三绝缘膜的支撑结构上形成T栅电极。
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Patent Agency Ranking
公开(公告)号：US20210143182A1
公开(公告)日：2021-05-13
申请号：US17094931
申请日：2020-11-11
Inventor： Sung-Jae CHANG , Dong Min KANG , Sung-Bum BAE , Hyung Sup YOON , Kyu Jun CHO
IPC: H01L27/12 , H01L21/84 , H01L21/683
Abstract: Provided are a semiconductor device and a method of fabricating the same. The semiconductor device includes a substrate having a first region and a second region, a buffer layer disposed on the substrate, a semiconductor layer disposed on the buffer layer, a barrier layer disposed on the semiconductor layer, a first source electrode, a first drain electrode, and a first gate electrode disposed therebetween, which are disposed on the barrier layer in the first region, a second source electrode, a second drain electrode, and a second gate electrode disposed therebetween, which are disposed on the barrier layer in the second region, and a ferroelectric pattern interposed between the first gate electrode and the barrier layer.
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公开(公告)号：US20170236909A1
公开(公告)日：2017-08-17
申请号：US15248676
申请日：2016-08-26
Inventor： Ho Kyun AHN , Dong Min KANG , Yong-Hwan KWON , Dong-Young KIM , SEONG IL KIM , Hae Cheon KIM , Eun Soo NAM , Jae Won DO , Byoung-Gue MIN , Hyung Sup YOON , Sang-Heung LEE , Jong Min LEE , Jong-Won LIM , Hyun Wook JUNG , Kyu Jun CHO
IPC: H01L29/40 , H01L29/66 , H01L29/778 , H01L29/20 , H01L29/205
CPC classification number: H01L29/404 , H01L21/6835 , H01L29/0619 , H01L29/0657 , H01L29/2003 , H01L29/205 , H01L29/401 , H01L29/4175 , H01L29/66462 , H01L29/7786 , H01L29/7787 , H01L2221/68327 , H01L2221/6834
Abstract: A high electron mobility transistor includes a substrate including a first surface and a second surface facing each other and having a via hole passing through the first surface and the second surface, an active layer on the first surface, a cap layer on the active layer and including a gate recess region exposing a portion of the active layer, a source electrode and a drain electrode on one of the cap layer and the active layer, an insulating layer on the source electrode and the drain electrode and having on opening corresponding to the gate recess region to expose the gate recess region, a first field electrode on the insulating layer, a gate electrode electrically connected to the first field electrode on the insulating layer, and a second field electrode on the second surface and contacting the active layer through the via hole.
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公开(公告)号：US20170133471A1
公开(公告)日：2017-05-11
申请号：US15238492
申请日：2016-08-16
Inventor： Jong Min LEE , Byoung-Gue MIN , Hyung Sup YOON , Dong Min KANG , Dong-Young KIM , SEONG-IL KIM , Hae Cheon KIM , Jae Won DO , Ho Kyun AHN , Sang-Heung LEE , Jong-Won LIM , Hyun Wook JUNG , Kyu Jun CHO , Chull Won JU
IPC: H01L29/40 , H01L29/66 , H01L29/778 , H01L29/20 , H01L29/205
CPC classification number: H01L29/408 , H01L29/2003 , H01L29/205 , H01L29/66462 , H01L29/7786 , H01L29/7787
Abstract: The present invention relates to a high reliability field effect power device and a manufacturing method thereof. A method of manufacturing a field effect power device includes sequentially forming a transfer layer, a buffer layer, a barrier layer and a passivation layer on a substrate, patterning the passivation layer by etching a first region of the passivation layer, and forming at least one electrode on the first region of the barrier layer exposed by patterning the passivation layer, wherein the first region is provided to form the at least one electrode, and the passivation layer may include a material having a wider bandgap than the barrier layer to prevent a trapping effect and a leakage current of the field effect power device.
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公开(公告)号：US20140159050A1
公开(公告)日：2014-06-12
申请号：US13935096
申请日：2013-07-03
Inventor： Hyung Sup YOON , Byoung-Gue Min , Jong-Won Lim , Hokyun Ahn , Seong-ll Kim , Sang-Heung Lee , Dong Min Kang , Chull Won Ju , Jae Kyoung Mun
IPC: H01L29/778 , H01L29/66
CPC classification number: H01L29/66462 , H01L21/02118 , H01L21/0217 , H01L21/02178 , H01L21/0254 , H01L21/28264 , H01L21/28593 , H01L21/31111 , H01L21/31144 , H01L29/2003 , H01L29/201 , H01L29/205 , H01L29/404 , H01L29/42316 , H01L29/42376 , H01L29/778 , H01L29/7786
Abstract: A field effect transistor is provided. The field effect transistor may include a capping layer on a substrate, a source ohmic electrode and a drain ohmic electrode on the capping layer, a first insulating layer and a second insulating layer stacked on the capping layer to cover the source and drain ohmic electrodes, a Γ-shaped gate electrode including a leg portion and a head portion, the leg portion being connected to the substrate between the source ohmic electrode and the drain ohmic electrode, and the head portion extending from the leg portion to cover a top surface of the second insulating layer, a first planarization layer on the second insulating layer to cover the Γ-shaped gate electrode, and a first electrode on the first planarization layer, the first electrode being connected to the source ohmic electrode or the drain ohmic electrode.
Abstract translation: 提供场效应晶体管。 场效应晶体管可以包括衬底上的覆盖层，覆盖层上的源欧姆电极和漏极欧姆电极，堆叠在覆盖层上以覆盖源极和漏极欧姆电极的第一绝缘层和第二绝缘层， 包括脚部和头部的栅格电极，所述脚部分连接到所述源欧姆电极和所述漏极欧姆电极之间的衬底，并且所述头部从所述腿部延伸以覆盖所述源极欧姆电极和所述漏极欧姆电极的顶表面 所述第二绝缘层，在所述第二绝缘层上覆盖所述栅格电极的第一平坦化层和所述第一平坦化层上的第一电极，所述第一电极连接到所述源欧姆电极或所述漏极欧姆电极。
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公开(公告)号：US20150380482A1
公开(公告)日：2015-12-31
申请号：US14658121
申请日：2015-03-13
Inventor： Ho Kyun AHN , Hae Cheon KIM , Jong Won LIM , Dong Min KANG , Yong Hwan KWON , SEONG IL KIM , Zin Sig KIM , Eun Soo NAM , Byoung Gue MIN , Hyung Sup YOON , Kyung Ho LEE , Jong Min LEE , Kyu Jun CHO
IPC: H01L29/06 , H01L29/66 , H01L29/205 , H01L29/20 , H01L21/28 , H01L29/49 , H01L29/423 , H01L21/02 , H01L21/311 , H01L21/31 , H01L29/778 , H01L29/45
CPC classification number: H01L21/28264 , H01L29/2003 , H01L29/407 , H01L29/42316 , H01L29/4236 , H01L29/452 , H01L29/51 , H01L29/513 , H01L29/517 , H01L29/518 , H01L29/66462 , H01L29/7786
Abstract: Provided herein is a semiconductor device including a substrate; an active layer formed on top of the substrate; a protective layer formed on top of the active layer and having a first aperture; a source electrode, driving gate electrode and drain electrode formed on top of the protective layer; and a first additional gate electrode formed on top of the first aperture, wherein an electric field is applied to the active layer, protective layer and driving gate electrode due to a voltage applied to each of the source electrode, drain electrode and driving gate electrode, and the first additional gate electrode is configured to attenuate a size of the electric field applied to at least a portion of the active layer, protective layer and driving gate electrode.
Abstract translation: 本文提供了包括基板的半导体器件; 形成在所述基板的顶部上的有源层; 形成在所述有源层的顶部上并具有第一孔的保护层; 源电极，形成在保护层顶部的驱动栅电极和漏电极; 以及形成在所述第一孔的顶部上的第一附加栅电极，其中由于施加到所述源电极，漏电极和驱动栅电极中的每一个的电压，向所述有源层，保护层和驱动栅电极施加电场， 并且第一附加栅电极被配置为衰减施加到有源层，保护层和驱动栅电极的至少一部分的电场的尺寸。
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