DETECTING SWITCHING OF ACCESS ELEMENTS OF PHASE CHANGE MEMORY CELLS
    1.
    发明申请
    DETECTING SWITCHING OF ACCESS ELEMENTS OF PHASE CHANGE MEMORY CELLS 有权
    检测相变记忆细胞存取元件的切换

    公开(公告)号:US20060221734A1

    公开(公告)日:2006-10-05

    申请号:US11093709

    申请日:2005-03-30

    IPC分类号: G11C29/00

    摘要: A memory includes a storage element (OUM) made of a phase-change material for storing a logic value and an access element (OTS) switching from a higher resistance condition to a lower resistance condition in response to a selection of the memory cell, the access element in the higher resistance condition decoupling the storage element from a read circuit and in the lower resistance condition coupling the storage element to the read circuit. The read circuit includes a sense amplifier to determine the logic value stored in the memory cell according to an electrical quantity associated with the memory cell. The read circuit further includes a detector that detects the switching of the access element by comparison to a delayed waveform or sensing a change in the column rate of change, and a circuit to enable the sense amplifier in response to the detection of the switching of the access element.

    摘要翻译: 存储器包括由相变材料制成的用于存储逻辑值的存储元件(OUM)和响应于存储单元的选择从较高电阻状态切换到较低电阻状态的存取元件(OTS), 较高电阻条件下的存取元件将存储元件与读取电路分离,并将该存储元件耦合到读取电路的较低电阻条件。 读取电路包括读出放大器,用于根据与存储器单元相关联的电量确定存储单元中存储的逻辑值。 读取电路还包括检测器,其通过与延迟波形进行比较来检测接入元件的切换,或者检测列变化率的变化;以及电路,用于响应于检测到的切换 访问元素

    Detecting switching of access elements of phase change memory cells
    2.
    发明申请
    Detecting switching of access elements of phase change memory cells 有权
    检测相变存储单元存取单元的切换

    公开(公告)号:US20070019465A1

    公开(公告)日:2007-01-25

    申请号:US11527147

    申请日:2006-09-26

    IPC分类号: G11C11/00

    摘要: A memory includes a storage element (OUM) made of a phase-change material for storing a logic value and an access element (OTS) switching from a higher resistance condition to a lower resistance condition in response to a selection of the memory cell, the access element in the higher resistance condition decoupling the storage element from a read circuit and in the lower resistance condition coupling the storage element to the read circuit. The read circuit includes a sense amplifier to determine the logic value stored in the memory cell according to an electrical quantity associated with the memory cell. The read circuit further includes a detector that detects the switching of the access element by comparison to a delayed waveform or sensing a change in the column rate of change, and a circuit to enable the sense amplifier in response to the detection of the switching of the access element.

    摘要翻译: 存储器包括由相变材料制成的用于存储逻辑值的存储元件(OUM)和响应于存储单元的选择从较高电阻状态切换到较低电阻状态的存取元件(OTS), 较高电阻条件下的存取元件将存储元件与读取电路分离,并将该存储元件耦合到读取电路的较低电阻条件。 读取电路包括读出放大器,用于根据与存储器单元相关联的电量确定存储单元中存储的逻辑值。 读取电路还包括检测器,其通过与延迟波形进行比较来检测接入元件的切换,或者检测列变化率的变化;以及电路,用于响应于检测到的切换 访问元素

    METHOD FOR MULTILEVEL PROGRAMMING OF PHASE CHANGE CELLS USING ADAPTIVE RESET PULSES
    9.
    发明申请
    METHOD FOR MULTILEVEL PROGRAMMING OF PHASE CHANGE CELLS USING ADAPTIVE RESET PULSES 有权
    使用自适应复位脉冲进行相位变化的多重编程的方法

    公开(公告)号:US20100284212A1

    公开(公告)日:2010-11-11

    申请号:US12780580

    申请日:2010-05-14

    IPC分类号: G11C11/00

    摘要: A method for programming multilevel PCM cells envisages: forming an amorphous region of amorphous phase change material in a storage element of a PCM cell by applying one or more reset pulse; and forming a conductive path of crystalline phase change material through the amorphous region by applying one or more set pulse, a size of the conductive path defining a programmed state of the PCM cell and an output electrical quantity associated thereto, and being controlled by the value of the reset pulse and set pulse. The step of forming an amorphous region envisages adaptively and iteratively determining, during the programming operations, a value of the reset pulse optimized for electrical and/or physical properties of the PCM cell, and in particular determining a minimum amplitude value of the reset pulse, which allows programming a desired programmed state and a desired value of the output electrical quantity.

    摘要翻译: 用于编程多电平PCM单元的方法设想:通过施加一个或多个复位脉冲,在PCM单元的存储元件中形成非晶相变材料的非晶区域; 以及通过施加一个或多个设定脉冲,形成所述PCM单元的编程状态的导电路径的大小和与其相关联的输出电量,并通过所述值来控制所述晶体相变材料的导电路径通过所述非晶区域 的复位脉冲和设定脉冲。 形成非晶区域的步骤设想在编程操作期间自适应地和迭代地确定针对PCM单元的电气和/或物理特性优化的复位脉冲的值,特别是确定复位脉冲的最小振幅值, 这允许编程期望的编程状态和输出电量的期望值。