SYSTEMS AND METHODS FOR MONITORING OBSTRUCTIONS IN A CONDUIT OF A STAMPING ENVIRONMENT

    公开(公告)号:US20240293856A1

    公开(公告)日:2024-09-05

    申请号:US18176743

    申请日:2023-03-01

    IPC分类号: B21C51/00 B21D22/02

    CPC分类号: B21C51/00 B21D22/025

    摘要: A method includes obtaining stamping system data from a stamping system data controller and vibration data from one or more vibration sensors disposed at the conduit; selecting a baseline vibration threshold and a frequency filter from among a plurality of frequency filters based on the stamping system data; generating a plurality of measured vibration values based on the vibration data and the frequency filter, where each measured vibration value from among the plurality of measured vibration values is associated with a given iteration from among a plurality of iterations of a stamping process; determining whether the conduit is in an obstructed state based on a comparison between a set of measured vibration values from among the plurality of measured vibration values and the baseline vibration threshold; and performing a corrective action in response to the conduit being in the obstructed state.

    System and method for performing a spindle runout diagnostic

    公开(公告)号:US10684607B2

    公开(公告)日:2020-06-16

    申请号:US15946321

    申请日:2018-04-05

    IPC分类号: G05B19/406

    摘要: The present disclosure is directed toward a diagnostic method for a spindle arm of a machine. The method includes rotating the spindle arm of the machine at a first rotational speed, and acquiring, from an accelerometer, data indicative of a vibrational response of the spindle arm operating at the first rotational speed. The accelerometer is disposed along the spindle arm. The method further includes converting the vibrational response to a frequency based response to obtain a first frequency response, determining whether an amplitude of the first frequency response exceeds a diagnostic threshold, and performing a designated correction on the machine in response to the frequency response exceeding the diagnostic threshold.

    Method for generating CNC machine offset based on thermal model

    公开(公告)号:US10365633B2

    公开(公告)日:2019-07-30

    申请号:US15622382

    申请日:2017-06-14

    摘要: The present disclosure generally describes a method for processing a workpiece in a machine, where the method determines an offset of the machine and adjusts for the offset during production operation. In one form, the method includes logging offset data of the machine over a period of operational time having varying thermal conditions, and comparing the logged offset data against a thermal model, where the thermal model is generated based on a probing routine and dry cycling for a plurality of test cycles on a calibration artifact. Based on the comparing, the method estimates offsets for the machine and adjusts offsets of the machine during operation.