CONNECTOR, PROBE, AND METHOD OF MANUFACTURING PROBE
    1.
    发明申请
    CONNECTOR, PROBE, AND METHOD OF MANUFACTURING PROBE 审中-公开
    连接器,探头和制造方法

    公开(公告)号:US20150054540A1

    公开(公告)日:2015-02-26

    申请号:US14528016

    申请日:2014-10-30

    Abstract: A connector includes multiple probes and a first insulator part and a second insulator part joined to cover the probes. Each of the probes has a monolithic structure of a single bent metal plate. Each of the probes includes an end part configured to come into contact with an electrode terminal; a spring part having a meandering shape and connected to the end part; a housing part bent to enclose the spring part; and a bent part provided between the spring part and the housing part. The end parts of the probes are at least partially projecting outward from first openings provided in the first insulator part, and the bent parts of the probes are at least partially projecting outward from second openings provided in the second insulator part.

    Abstract translation: 连接器包括多个探针和连接以覆盖探针的第一绝缘体部分和第二绝缘体部分。 每个探针具有单个弯曲金属板的整体结构。 每个探针包括构造成与电极端子接触的端部; 具有弯曲形状并连接到端部的弹簧部分; 弯曲以包围弹簧部分的壳体部分; 以及设置在弹簧部和壳体部之间的弯曲部。 探针的端部至少部分地从设置在第一绝缘体部分中的第一开口向外突出,并且探针的弯曲部分至少部分地从设置在第二绝缘体部分中的第二开口向外突出。

    Probe and method of manufacturing probe
    2.
    发明授权
    Probe and method of manufacturing probe 有权
    探头和探头的制造方法

    公开(公告)号:US08698513B2

    公开(公告)日:2014-04-15

    申请号:US14053747

    申请日:2013-10-15

    Abstract: A probe used for electrical measurement includes first and second internal electrically-conductive parts; first and second terminal contact parts configured to contact first and second external electrode terminals, respectively; first and second spring parts each having a meandering pattern; a housing part configured to surround the first and second internal electrically-conductive parts. The first internal electrically-conductive part, the first terminal contact part, the first spring part, the housing part, the second spring part, the second terminal contact part, and the second internal electrically-conductive part are successively connected in a single metal plate from a first end to a second end thereof. The first and second terminal contact parts are in first and second bent portions, respectively, of the single metal plate. The first and second internal electrically-conductive parts are configured to contact each other at the time of performing the electrical measurement.

    Abstract translation: 用于电测量的探针包括第一和第二内部导电部件; 分别与第一和第二外部电极端子接触的第一和第二端子接触部分; 第一和第二弹簧部件各自具有曲折图案; 壳体部分,其构造成围绕所述第一和第二内部导电部件。 第一内部导电部分,第一端子接触部分,第一弹簧部分,壳体部分,第二弹簧部分,第二端子接触部分和第二内部导电部分连续地连接在单个金属板 从第一端到第二端。 第一和第二端子接触部分分别在单个金属板的第一和第二弯曲部分中。 第一和第二内部导电部件被配置为在执行电测量时彼此接触。

    Probe and method of manufacturing probe
    3.
    发明授权
    Probe and method of manufacturing probe 有权
    探头和探头的制造方法

    公开(公告)号:US08674716B2

    公开(公告)日:2014-03-18

    申请号:US13901863

    申请日:2013-05-24

    Abstract: A probe is made to contact an electrode terminal in an electric circuit or an electronic part for an electric measurement of the electric circuit or the electronic part. The probe includes a terminal portion which is brought in contact with the electrode terminal at one end of the probe, a spring portion in which U-shaped unit portions are arrayed in a zigzag formation, and a housing portion which surrounds the spring portion. The probe is formed of a sheet of a metal sheet which is bent multiple times, the metal sheet having a predetermined configuration in which a portion corresponding to the terminal portion, a portion corresponding to the spring portion, and a portion corresponding to the housing portion are continuously linked together.

    Abstract translation: 探针用于接触电路或电子部件中的电极端子,用于电路或电子部件的电测量。 探针包括在探针的一端与电极端子接触的端子部分,其中U形单元部分以锯齿形阵列排列的弹簧部分和围绕弹簧部分的壳体部分。 探针由多次弯曲的金属片的片材形成,金属片具有预定的构造,其中对应于端子部分的部分,对应于弹簧部分的部分和对应于壳体部分的部分 连续在一起。

    PROBE AND METHOD OF MANUFACTURING PROBE
    4.
    发明申请
    PROBE AND METHOD OF MANUFACTURING PROBE 有权
    探索和制造探针的方法

    公开(公告)号:US20140033792A1

    公开(公告)日:2014-02-06

    申请号:US14053747

    申请日:2013-10-15

    Abstract: A probe used for electrical measurement includes first and second internal electrically-conductive parts; first and second terminal contact parts configured to contact first and second external electrode terminals, respectively; first and second spring parts each having a meandering pattern; a housing part configured to surround the first and second internal electrically-conductive parts. The first internal electrically-conductive part, the first terminal contact part, the first spring part, the housing part, the second spring part, the second terminal contact part, and the second internal electrically-conductive part are successively connected in a single metal plate from a first end to a second end thereof. The first and second terminal contact parts are in first and second bent portions, respectively, of the single metal plate. The first and second internal electrically-conductive parts are configured to contact each other at the time of performing the electrical measurement.

    Abstract translation: 用于电测量的探针包括第一和第二内部导电部件; 分别与第一和第二外部电极端子接触的第一和第二端子接触部分; 第一和第二弹簧部件各自具有曲折图案; 壳体部分,其构造成围绕所述第一和第二内部导电部件。 第一内部导电部分,第一端子接触部分,第一弹簧部分,壳体部分,第二弹簧部分,第二端子接触部分和第二内部导电部分连续地连接在单个金属板 从第一端到第二端。 第一和第二端子接触部分分别在单个金属板的第一和第二弯曲部分中。 第一和第二内部导电部件被配置为在执行电测量时彼此接触。

    PROBE AND METHOD OF MANUFACTURING PROBE
    5.
    发明申请
    PROBE AND METHOD OF MANUFACTURING PROBE 有权
    探索和制造探针的方法

    公开(公告)号:US20130247375A1

    公开(公告)日:2013-09-26

    申请号:US13901863

    申请日:2013-05-24

    Abstract: A probe is made to contact an electrode terminal in an electric circuit or an electronic part for an electric measurement of the electric circuit or the electronic part. The probe includes a terminal portion which is brought in contact with the electrode terminal at one end of the probe, a spring portion in which U-shaped unit portions are arrayed in a zigzag formation, and a housing portion which surrounds the spring portion. The probe is formed of a sheet of a metal sheet which is bent multiple times, the metal sheet having a predetermined configuration in which a portion corresponding to the terminal portion, a portion corresponding to the spring portion, and a portion corresponding to the housing portion are continuously linked together.

    Abstract translation: 探针用于接触电路或电子部件中的电极端子,用于电路或电子部件的电测量。 探针包括在探针的一端与电极端子接触的端子部分,其中U形单元部分以锯齿形阵列排列的弹簧部分和围绕弹簧部分的壳体部分。 探针由多次弯曲的金属片的片材形成,金属片具有预定的构造,其中对应于端子部分的部分,对应于弹簧部分的部分和对应于壳体部分的部分 连续在一起。

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