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公开(公告)号：US3550094A
公开(公告)日：1970-12-22
申请号：US3550094D
申请日：1968-04-01
Applicant: GEN ELECTRIC
Inventor： NORTON JAMES F
CPC classification number: H01L29/00 , G11C13/048 , H01J29/44 , H01L31/00
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Patent Agency Ranking2.发明授权Method and apparatus for testing circuits by measuring secondary emission electrons generated by electron beam bombardment of the pulsed circuit 失效通过测量脉冲电路的电子束波导产生的二次发射电子来测试电路的方法和装置
公开(公告)号：US3549999A
公开(公告)日：1970-12-22
申请号：US3549999D
申请日：1968-06-05
Applicant: GEN ELECTRIC
Inventor： NORTON JAMES F
IPC: G01R31/305 , G01R31/307 , H01J37/26 , G01R31/22 , G01R31/02
CPC classification number: H01J37/268 , G01R31/305 , G01R31/307
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公开(公告)号：US3120991A
公开(公告)日：1964-02-11
申请号：US75708158
申请日：1958-08-25
Applicant: GEN ELECTRIC
Inventor： NEWBERRY STERLING P , NORTON JAMES F
IPC: G06K17/00 , G11B7/0045 , G11B7/12 , G11B7/24 , G11B9/10 , G11B13/00 , G11B27/36 , G11C13/04 , H04N5/82
CPC classification number: H04N5/82 , G06K17/00 , G11B7/0045 , G11B7/12 , G11B7/24 , G11B9/10 , G11B13/00 , G11B27/36 , G11C13/04 , G11C13/048
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公开(公告)号：US3005098A
公开(公告)日：1961-10-17
申请号：US72543158
申请日：1958-03-31
Applicant: GEN ELECTRIC
Inventor： BUSCHMANN ERWIN C , NORTON JAMES F
IPC: G01N23/225
CPC classification number: G01N23/2252
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公开(公告)号：US2985866A
公开(公告)日：1961-05-23
申请号：US76407658
申请日：1958-09-29
Applicant: GEN ELECTRIC
Inventor： NORTON JAMES F
IPC: G06K17/00 , G11B7/0045 , G11B7/12 , G11B7/24 , G11B9/10 , G11B13/00 , G11B27/36 , G11C13/04 , H04N5/82
CPC classification number: H04N5/82 , G06K17/00 , G11B7/0045 , G11B7/12 , G11B7/24 , G11B9/10 , G11B13/00 , G11B27/36 , G11C13/04 , G11C13/048
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公开(公告)号：US2834888A
公开(公告)日：1958-05-13
申请号：US47916654
申请日：1954-12-31
Applicant: GEN ELECTRIC
Inventor： NORTON JAMES F
IPC: H01J49/02
CPC classification number: H01J49/022
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