RESISTIVE NONVOLATILE MEMORY STRUCTURE EMPLOYING A STATISTICAL SENSING SCHEME AND METHOD

    公开(公告)号:US20200243126A1

    公开(公告)日:2020-07-30

    申请号:US16261617

    申请日:2019-01-30

    Abstract: A memory structure includes a first memory array with two transistor-two variable resistor memory cells and a second memory array with one transistor-one variable resistor memory cells, which are each selectively operable in read, write and standby modes. The first memory array and the second memory array are interleaved so that, when the second memory operates in the read mode, the first memory array automatically and concurrently operates in a reference mode. A method of operating the memory structure includes, when the second memory array operates in the read mode, automatically and concurrently operating the first memory array in the reference mode so that the first memory array generates and outputs a statistical reference voltage, which is between the low and high voltages of a nominal memory cell within the second memory array and which is employed by the second memory array to sense a stored data value.

    Resistive nonvolatile memory structure employing a statistical sensing scheme and method

    公开(公告)号:US10726896B1

    公开(公告)日:2020-07-28

    申请号:US16261617

    申请日:2019-01-30

    Abstract: A memory structure includes a first memory array with two transistor-two variable resistor memory cells and a second memory array with one transistor-one variable resistor memory cells, which are each selectively operable in read, write and standby modes. The first memory array and the second memory array are interleaved so that, when the second memory operates in the read mode, the first memory array automatically and concurrently operates in a reference mode. A method of operating the memory structure includes, when the second memory array operates in the read mode, automatically and concurrently operating the first memory array in the reference mode so that the first memory array generates and outputs a statistical reference voltage, which is between the low and high voltages of a nominal memory cell within the second memory array and which is employed by the second memory array to sense a stored data value.

Patent Agency Ranking