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公开(公告)号:US20180182671A1
公开(公告)日:2018-06-28
申请号:US15858691
申请日:2017-12-29
Applicant: GLOBALFOUNDRIES Inc.
Inventor: Ivan HUANG , Elavarasan PANNERSELVAM , Vijay SUKUMARAN
IPC: H01L21/78 , H01L21/027 , H01L21/02 , H01L21/3065 , H01L21/263 , H01L21/56 , H01L23/00 , H01L21/268
CPC classification number: H01L21/78 , H01L21/02118 , H01L21/0273 , H01L21/2633 , H01L21/268 , H01L21/3065 , H01L21/561 , H01L23/562
Abstract: A method of forming a 3D crack-stop structure in, through, and wrapped around the edges of a substrate to prevent through-substrate cracks from propagating and breaking the substrate and the resulting device are provided. Embodiments include providing a substrate including one or more dies; forming a continuous first trench near an outer edge of the substrate; forming a continuous second trench parallel to and on an opposite side of the first trench from the outer edge; forming a continuous row of vias parallel to and on an opposite side of the second trench from the first trench, forming a continuous third trench parallel to and near an outer edge of each of the dies; forming a protective layer wrapping around the outer edge of the substrate and over and filling the trenches and vias; and patterning active areas of the substrate between the vias and the third trench.
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公开(公告)号:US20180254239A1
公开(公告)日:2018-09-06
申请号:US15446109
申请日:2017-03-01
Applicant: GLOBALFOUNDRIES Inc.
Inventor: Vijay SUKUMARAN , Ivan Junju HUANG , Saket CHADDA , Elavarasan T. PANNERSELVAM , Chok W. HO
IPC: H01L23/498 , H01L21/48
CPC classification number: H01L23/49827 , H01L21/486 , H01L23/15
Abstract: Methods for reliable interconnect structures between thin metal capture pads and TGV metallization and resulting devices are provided. Embodiments include forming a TGV in a glass substrate; filling with metal conductive paste; forming a metal layer on top and bottom surfaces of the substrate; patterning the metal layer, leaving at least a portion over the TGV top surface and an area surrounding the TGV; forming a dielectric layer on the metal layer and on the substrate top and bottom surfaces; patterning the dielectric layer, including exposing the metal layer over the TGV top surface and the area surrounding the TGV; forming a second metal layer on the dielectric layer and on the exposed portion of the first metal layer over the TGV top surface and the area surrounding the TGV; patterning the second metal layer exposing the dielectric layer; and forming a third metal layer on the second metal layer.
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