公开(公告)号：US20240136400A1

公开(公告)日：2024-04-25

申请号：US18405621

申请日：2024-01-05

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Alexander Derrickson ,  Vibhor Jain ,  Judson R. Holt ,  Jagar Singh ,  Mankyu Yang

IPC: H01L29/08 ,  H01L29/06 ,  H01L29/10 ,  H01L29/417 ,  H01L29/735 ,  H01L29/737

CPC classification number: H01L29/0821 ,  H01L29/0649 ,  H01L29/0808 ,  H01L29/0817 ,  H01L29/1008 ,  H01L29/41708 ,  H01L29/735 ,  H01L29/737

Abstract: The present disclosure relates to semiconductor structures and, more particularly, to a lateral bipolar transistor with gated collector and methods of manufacture. The structure includes: an extrinsic base region vertically over a semiconductor substrate and comprising asymmetrical sidewall spacers on opposing sidewalls of the extrinsic base region; a collector region on the semiconductor substrate and separated from the extrinsic base region by at least a first spacer of the asymmetrical sidewall spacers; and an emitter region on the semiconductor substrate and separated from the extrinsic base region by a second spacer of the asymmetrical sidewall spacers.

公开(公告)号：US11804542B2

公开(公告)日：2023-10-31

申请号：US17557176

申请日：2021-12-21

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Alexander M. Derrickson ,  Arkadiusz Malinowski ,  Jagar Singh ,  Mankyu Yang ,  Judson R. Holt

IPC: H01L29/737 ,  H01L29/165 ,  H01L29/66 ,  H01L29/10 ,  H01L29/08

CPC classification number: H01L29/7371 ,  H01L29/0817 ,  H01L29/0821 ,  H01L29/1004 ,  H01L29/165 ,  H01L29/66242

Abstract: The present disclosure relates to semiconductor structures and, more particularly, to annular bipolar transistors and methods of manufacture. The structure includes: a substate material; a collector region parallel to and above the substrate material; an intrinsic base region surrounding the collector region; an emitter region above the intrinsic base region; and an extrinsic base region contacting the intrinsic base region.

公开(公告)号：US20230032080A1

公开(公告)日：2023-02-02

申请号：US17388284

申请日：2021-07-29

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Alexander M. Derrickson ,  Mankyu Yang ,  Judson R. Holt ,  Jagar Singh ,  Alexander L. Martin ,  Richard F. Taylor, III

IPC: H01L29/735 ,  H01L29/417 ,  H01L29/08 ,  H01L29/66

Abstract: Disclosed is a semiconductor structure that includes an asymmetric lateral bipolar junction transistor (BJT). The BJT includes an emitter, a base, a collector extension and a collector arranged side-by-side (i.e., laterally) across a semiconductor layer. The emitter, collector and collector extension have a first type conductivity with the collector extension having a lower conductivity level than either the emitter or the collector. The base has a second type conductivity that is different from the first type conductivity. With such a lateral configuration, the BJT can be easily integrated with CMOS devices on advanced SOI technology platforms. With such an asymmetric configuration and, particularly, given the inclusion of the collector extension but not an emitter extension, the BJT can achieve a relatively high collector-emitter breakdown voltage (Vbr-CEO) without a significant risk of leakage currents at high voltages. Also disclosed are method embodiments for forming such a semiconductor structure.

公开(公告)号：US11652142B2

公开(公告)日：2023-05-16

申请号：US17482374

申请日：2021-09-22

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Mankyu Yang ,  Richard Taylor, III ,  Alexander Derrickson ,  Alexander Martin ,  Jagar Singh ,  Judson Robert Holt ,  Haiting Wang

IPC: H01L29/08 ,  H01L29/66 ,  H01L29/735 ,  H01L29/10

CPC classification number: H01L29/0804 ,  H01L29/0808 ,  H01L29/0821 ,  H01L29/1008 ,  H01L29/6625 ,  H01L29/735

Abstract: A structure for a lateral bipolar junction transistor is provided. The structure comprising an emitter including a first concentration of a first dopant. A collector including a second concentration of the first dopant, the first concentration of the first dopant may be different from the second concentration of the first dopant. An intrinsic base may be laterally arranged between the emitter and the collector, and an extrinsic base region may be above the intrinsic base. An emitter extension may be arranged adjacent to the emitter, whereby the emitter extension laterally extends under a portion of the extrinsic base region. A halo region may be arranged adjacent to the emitter extension, whereby the halo region laterally extends under another portion of the extrinsic base region.

公开(公告)号：US20230067486A1

公开(公告)日：2023-03-02

申请号：US17525256

申请日：2021-11-12

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Alexander Derrickson ,  Vibhor Jain ,  Judson R. Holt ,  Jagar Singh ,  Mankyu Yang

IPC: H01L29/08 ,  H01L29/735 ,  H01L29/737 ,  H01L29/06 ,  H01L29/10 ,  H01L29/417

Abstract: The present disclosure relates to semiconductor structures and, more particularly, to a lateral bipolar transistor with gated collector and methods of manufacture. The structure includes: an extrinsic base region vertically over a semiconductor substrate and comprising asymmetrical sidewall spacers on opposing sidewalls of the extrinsic base region; a collector region on the semiconductor substrate and separated from the extrinsic base region by at least a first spacer of the asymmetrical sidewall spacers; and an emitter region on the semiconductor substrate and separated from the extrinsic base region by a second spacer of the asymmetrical sidewall spacers.

公开(公告)号：US11588044B2

公开(公告)日：2023-02-21

申请号：US17109464

申请日：2020-12-02

Applicant: GLOBALFOUNDRIES U.S. INC.

Inventor： Alexander M. Derrickson ,  Mankyu Yang ,  Richard F. Taylor, III ,  Jagar Singh ,  Alexander L. Martin

IPC: H01L29/739 ,  H03K17/60 ,  H01L29/10 ,  H01L29/06

Abstract: Embodiments of the disclosure provide a bipolar junction transistor (BJT) structure and related method. A BJT according to the disclosure may include a base over a semiconductor substrate. A collector is over the semiconductor substrate and laterally abuts a first horizontal end of the base. An emitter is over the semiconductor substrate and laterally abuts a second horizontal end of the base opposite the first horizontal end. A horizontal interface between the emitter and the base is smaller than a horizontal interface between the collector and the base.

公开(公告)号：US20220173230A1

公开(公告)日：2022-06-02

申请号：US17109464

申请日：2020-12-02

Applicant: GLOBALFOUNDRIES U.S. INC.

Inventor： Alexander M. Derrickson ,  Mankyu Yang ,  Richard F. Taylor, III ,  Jagar Singh ,  Alexander L. Martin

IPC: H01L29/739 ,  H01L29/06 ,  H01L29/10 ,  H03K17/60

Abstract: Embodiments of the disclosure provide a bipolar junction transistor (BJT) structure and related method. A BJT according to the disclosure may include a base over a semiconductor substrate. A collector is over the semiconductor substrate and laterally abuts a first horizontal end of the base. An emitter is over the semiconductor substrate and laterally abuts a second horizontal end of the base opposite the first horizontal end. A horizontal interface between the emitter and the base is smaller than a horizontal interface between the collector and the base.

公开(公告)号：US11935923B2

公开(公告)日：2024-03-19

申请号：US17525256

申请日：2021-11-12

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Alexander Derrickson ,  Vibhor Jain ,  Judson R. Holt ,  Jagar Singh ,  Mankyu Yang

IPC: H01L29/08 ,  H01L29/06 ,  H01L29/10 ,  H01L29/417 ,  H01L29/735 ,  H01L29/737

CPC classification number: H01L29/0821 ,  H01L29/0649 ,  H01L29/0808 ,  H01L29/0817 ,  H01L29/1008 ,  H01L29/41708 ,  H01L29/735 ,  H01L29/737

Abstract: The present disclosure relates to semiconductor structures and, more particularly, to a lateral bipolar transistor with gated collector and methods of manufacture. The structure includes: an extrinsic base region vertically over a semiconductor substrate and comprising asymmetrical sidewall spacers on opposing sidewalls of the extrinsic base region; a collector region on the semiconductor substrate and separated from the extrinsic base region by at least a first spacer of the asymmetrical sidewall spacers; and an emitter region on the semiconductor substrate and separated from the extrinsic base region by a second spacer of the asymmetrical sidewall spacers.

公开(公告)号：US20230063301A1

公开(公告)日：2023-03-02

申请号：US17557176

申请日：2021-12-21

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Alexander M. Derrickson ,  Arkadiusz Malinowski ,  Jagar Singh ,  Mankyu Yang ,  Judson R. Holt

IPC: H01L29/737 ,  H01L29/165 ,  H01L29/08 ,  H01L29/10 ,  H01L29/66

Abstract: The present disclosure relates to semiconductor structures and, more particularly, to annular bipolar transistors and methods of manufacture. The structure includes: a substate material; a collector region parallel to and above the substrate material; an intrinsic base region surrounding the collector region; an emitter region above the intrinsic base region; and an extrinsic base region contacting the intrinsic base region

公开(公告)号：US11575029B2

公开(公告)日：2023-02-07

申请号：US17324183

申请日：2021-05-19

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Alexander M. Derrickson ,  Richard F. Taylor, III ,  Mankyu Yang ,  Alexander L. Martin ,  Judson R. Holt ,  Jagar Singh

IPC: H01L27/082 ,  H01L27/12 ,  H01L29/78 ,  H01L21/84 ,  H01L21/8238 ,  H01L21/768 ,  H01L29/735 ,  H01L29/739 ,  H01L29/66 ,  H01L29/08 ,  H01L29/10

Abstract: Disclosed is a semiconductor structure including at least one bipolar junction transistor (BJT), which is uniquely configured so that fabrication of the BJT can be readily integrated with fabrication of complementary metal oxide semiconductor (CMOS) devices on an advanced silicon-on-insulator (SOI) wafer. The BJT has an emitter, a base, and a collector laid out horizontally across an insulator layer and physically separated. Extension regions extend laterally between the emitter and the base and between the base and the collector and are doped to provide junctions between the emitter and the base and between the base and the collector. Gate structures are on the extension regions. The emitter, base, and collector are contacted. Optionally, the gate structures and a substrate below the insulator layer are contacted and can be biased to optimize BJT performance. Optionally, the structure further includes one or more CMOS devices. Also disclosed is a method of forming the structure.