摘要:
A semiconductor circuit arrangement includes at least one first and a second field effect transistor, where the field effect respectively have at least two active regions with, respectively, a source region, a drain region and an intermediate channel region, the surface of the channel regions having a gate formed on it, insulated by a gate dielectric, for actuating the channeel regions. At least one active region of the second field effect transistor is arranged between the at least two active regions of the first field effect transistor, which results in a reduced mismatch between the two transistors, caused by temperature and local distances.
摘要:
A semiconductor circuit arrangement and a method for temperature detection is disclosed. One embodiment includes a semiconductor substrate, on which is formed a first insulating layer and thereon a thin active semiconductor region, which is laterally delimited by a second insulating layer. In the active semiconductor region, a first and second doping zone are formed on the surface of the first insulating layer for the definition of a channel zone, wherein there is formed at the surface of the channel zone a gate dielectric and thereon a control electrode for the realization of a field effect transistor. In the active semiconductor region, a diode doping zone is formed on the surface of the first insulating layer, which zone realizes a measuring diode via a diode side area with the first or second doping zone and is delimited by the second insulating layer at its further side areas.
摘要:
One or more embodiments relate to an apparatus comprising: a first transistor including a fin; and a second transistor including a fin, the fin of the first transistor having a lower charge carrier mobility than the fin of the second transistor.
摘要:
A circuit array includes a plurality cells, wherein each cell has at least one group of odd fins. The cells may be arranged in a repeating pattern that includes mirror images of the pattern. A plurality of fin forming regions are provided about which the fins are formed for the dual fin and single fin transistors.
摘要:
In an embodiment of the invention, a CMOS circuit arrangement is provided. The CMOS circuit arrangement includes a PMOS logic circuit providing a logic function, having PMOS field effect transistors, wherein a first operating potential is fed to an input of a PMOS logic circuit, an NMOS logic circuit providing the logic function, having NMOS field effect transistors, a first clock transistor, the first source/drain terminal of which is coupled to an input of the NMOS logic circuit, wherein a clock signal is applied to the gate terminal of the first clock transistor, and wherein a second operating potential is fed to the second source/drain terminal. An output of the PMOS logic circuit and an output of the NMOS logic circuit are coupled to one another. Furthermore, an inverter circuit is coupled to the output of the PMOS logic circuit and to the output of the NMOS logic circuit. At least a portion of the NMOS field effect transistors of the NMOS logic circuit have a first threshold voltage and at least a portion of the PMOS field effect transistors of the PMOS logic circuit have a third threshold voltage. The first clock transistor has a second threshold voltage. The first threshold voltage is lower than the second threshold voltage.
摘要:
A semiconductor circuit arrangement and a method for temperature detection is disclosed. One embodiment includes a semiconductor substrate, on which is formed a first insulating layer and thereon a thin active semiconductor region, which is laterally delimited by a second insulating layer. In the active semiconductor region, a first and second doping zone are formed on the surface of the first insulating layer for the definition of a channel zone, wherein there is formed at the surface of the channel zone a gate dielectric and thereon a control electrode for the realization of a field effect transistor. In the active semiconductor region, a diode doping zone is formed on the surface of the first insulating layer, which zone realizes a measuring diode via a diode side area with the first or second doping zone and is delimited by the second insulating layer at its further side areas.
摘要:
Pulse-generator circuit for generating an input signal for a flip-flop circuit from a clock-pulse signal and a data signal. The circuit includes a control unit for controlling a clock-pulse field effect transistor, a logic field effect transistor and a feedback field effect transistor. To generate the input signal, the control unit is configured in such a way that the clock-pulse field effect transistor is controlled chronologically after the logic field effect transistor and the feedback field effect transistor, thus generating the flip-flop signal.
摘要:
In a first embodiment, a multi-fin component arrangement has a plurality of multi-fin component partial arrangements. Each of the multi-fin component partial arrangements has a plurality of electronic components, which electronic components have a multi-fin structure. At least one multi-fin component partial arrangement has at least one dummy structure, which at least one dummy structure is formed between at least two of the electronic components formed in the at least one multi-fin component partial arrangement. The dummy structure is formed in such a way that electrical characteristics of the electronic components formed in the multi-fin component partial arrangements are adapted to one another.
摘要:
Pulse-generator circuit for generating an input signal for a flip-flop circuit from a clock-pulse signal and a data signal. The circuit includes a control unit for controlling a clock-pulse field effect transistor, a logic field effect transistor and a feedback field effect transistor. To generate the input signal, the control unit is configured in such a way that the clock-pulse field effect transistor is controlled chronologically after the logic field effect transistor and the feedback field effect transistor, thus generating the flip-flop signal.