INSPECTION SYSTEM AND METHOD WITH MULTI-IMAGE PHASE SHIFT ANALYSIS
    1.
    发明申请
    INSPECTION SYSTEM AND METHOD WITH MULTI-IMAGE PHASE SHIFT ANALYSIS 有权
    检测系统和方法与多图像相位移动分析

    公开(公告)号:US20100296104A1

    公开(公告)日:2010-11-25

    申请号:US12469893

    申请日:2009-05-21

    IPC分类号: G01B11/24

    摘要: An inspection system is provided. The inspection system comprises a light source, a grating, a phase shifting unit, an imager, and a processor. The light source is configured to generate light. The grating is in a path of the generated light and is configured to produce a grating image after the light passes through the grating. The phase shifting unit is configured to form and reflect a plurality of phase shifted patterns of the grating image onto an object surface to form a plurality of projected phase shifting patterns. The imager is configured to obtain image data of the projected phase shifted patterns. The processor is configured to reconstruct the object surface from the image data. An inspection method and a phase shifting projector are also presented.

    摘要翻译: 提供检查系统。 检查系统包括光源,光栅,相移单元,成像器和处理器。 光源被配置为产生光。 光栅处于所生成的光的路径中,并且被配置为在光通过光栅之后产生光栅图像。 相移单元被配置为将光栅图像的多个相移图案形成并反射到物体表面上以形成多个投影相移图案。 成像器被配置为获得投影的相移图案的图像数据。 处理器被配置为从图像数据重建物体表面。 还提出了检测方法和移相投影机。

    Inspection system and methods with autocompensation for edge break gauging orientation
    2.
    发明授权
    Inspection system and methods with autocompensation for edge break gauging orientation 失效
    用于边缘断裂测量方向的自动补偿检测系统和方法

    公开(公告)号:US07925075B2

    公开(公告)日:2011-04-12

    申请号:US11745010

    申请日:2007-05-07

    IPC分类号: G06K9/00 G06K9/48 G06C9/00

    CPC分类号: G01B11/25 G01B21/20

    摘要: A method for inspecting a feature of a part is provided. The method includes obtaining a profile corresponding to the feature using a sensor and projecting the profile onto a compensation plane normal to the feature for generating an updated profile. The method also includes using the updated profile for reducing a measurement error caused by an orientation of the sensor. An inspection system is also provided. The inspection system includes a sensor configured to capture a fringe image of a feature on a part. The inspection system further includes a processor configured to process the fringe image to obtain an initial profile of the feature and to project the initial profile onto a compensation plane normal to the feature.

    摘要翻译: 提供了一种用于检查零件特征的方法。 该方法包括使用传感器获得与特征对应的轮廓,并将轮廓投影到与该特征垂直的补偿平面上,以生成更新轮廓。 该方法还包括使用更新的轮廓来减少由传感器的取向引起的测量误差。 还提供检查系统。 检查系统包括被配置为捕获部件上的特征的条纹图像的传感器。 检查系统还包括处理器,其被配置为处理边缘图像以获得特征的初始轮廓并且将初始轮廓投影到垂直于特征的补偿平面上。

    INSPECTION SYSTEM AND METHODS WITH AUTOCOMPENSATION FOR EDGE BREAK GAUGING ORIENTATION
    3.
    发明申请
    INSPECTION SYSTEM AND METHODS WITH AUTOCOMPENSATION FOR EDGE BREAK GAUGING ORIENTATION 失效
    检查系统和方法与自动化的边缘测量方向

    公开(公告)号:US20080281543A1

    公开(公告)日:2008-11-13

    申请号:US11745010

    申请日:2007-05-07

    IPC分类号: G01C25/00 G01B21/02 G01B21/16

    CPC分类号: G01B11/25 G01B21/20

    摘要: A method for inspecting a feature of a part is provided. The method includes obtaining a profile corresponding to the feature using a sensor and projecting the profile onto a compensation plane normal to the feature for generating an updated profile. The method also includes using the updated profile for reducing a measurement error caused by an orientation of the sensor. An inspection system is also provided. The inspection system includes a sensor configured to capture a fringe image of a feature on a part. The inspection system further includes a processor configured to process the fringe image to obtain an initial profile of the feature and to project the initial profile onto a compensation plane normal to the feature.

    摘要翻译: 提供了一种用于检查零件特征的方法。 该方法包括使用传感器获得与特征对应的轮廓,并将轮廓投影到与该特征垂直的补偿平面上,以生成更新轮廓。 该方法还包括使用更新的轮廓来减少由传感器的取向引起的测量误差。 还提供检查系统。 检查系统包括被配置为捕获部件上的特征的条纹图像的传感器。 检查系统还包括处理器,其被配置为处理边缘图像以获得特征的初始轮廓并且将初始轮廓投影到垂直于特征的补偿平面上。

    Inspection system and method with multi-image phase shift analysis
    4.
    发明授权
    Inspection system and method with multi-image phase shift analysis 有权
    多图像相移分析检测系统及方法

    公开(公告)号:US08045181B2

    公开(公告)日:2011-10-25

    申请号:US12469893

    申请日:2009-05-21

    IPC分类号: G01B11/24

    摘要: An inspection system is provided. The inspection system comprises a light source, a grating, a phase shifting unit, an imager, and a processor. The light source is configured to generate light. The grating is in a path of the generated light and is configured to produce a grating image after the light passes through the grating. The phase shifting unit is configured to form and reflect a plurality of phase shifted patterns of the grating image onto an object surface to form a plurality of projected phase shifting patterns. The imager is configured to obtain image data of the projected phase shifted patterns. The processor is configured to reconstruct the object surface from the image data. An inspection method and a phase shifting projector are also presented.

    摘要翻译: 提供检查系统。 检查系统包括光源,光栅,相移单元,成像器和处理器。 光源被配置为产生光。 光栅处于所生成的光的路径中,并且被配置为在光通过光栅之后产生光栅图像。 相移单元被配置为将光栅图像的多个相移图案形成并反射到物体表面上以形成多个投影相移图案。 成像器被配置为获得投影的相移图案的图像数据。 处理器被配置为从图像数据重建物体表面。 还提出了检测方法和移相投影机。

    Inspection device and method thereof
    5.
    发明授权
    Inspection device and method thereof 有权
    检验装置及其方法

    公开(公告)号:US09188543B2

    公开(公告)日:2015-11-17

    申请号:US13448691

    申请日:2012-04-17

    摘要: An optical system configured to visually inspect a target having a variable position with respect to the optical system is provided. The optical system includes a polarizer configured to convert an incident light reflected or diffused from the target into linearly polarized light; a light modulating element configured to modulate a polarization state of the linearly polarized light in response to control signals; and a lens group comprising at least one birefringent element, the birefringent element configured to refract or reflect the modulated linearly polarized light with a first polarization state under a first refraction index to enable inspection of the target at a first object position, and the birefringent element further configured to refract or reflect the modulated linearly polarized light with a second polarization state under a second refraction index to enable inspection of the target at a second object position.

    摘要翻译: 提供一种被配置为目视检查相对于光学系统具有可变位置的目标的光学系统。 光学系统包括:偏振器,被配置为将从目标反射或扩散的入射光转换成线偏振光; 光调制元件,被配置为响应于控制信号调制所述线偏振光的偏振状态; 以及包括至少一个双折射元件的透镜组,所述双折射元件被配置为在第一折射率下折射或反射具有第一偏振态的调制线偏振光,以使得能够在第一物体位置检查所述目标,并且所述双折射元件 还被配置为在第二折射率下折射或反射具有第二偏振状态的经调制的线性偏振光,以使得能够在第二物体位置检查目标。

    INSPECTION DEVICE AND METHOD THEREOF
    6.
    发明申请
    INSPECTION DEVICE AND METHOD THEREOF 有权
    检查装置及其方法

    公开(公告)号:US20130271763A1

    公开(公告)日:2013-10-17

    申请号:US13448691

    申请日:2012-04-17

    IPC分类号: G01J4/00

    摘要: An optical system configured to visually inspect a target having a variable position with respect to the optical system is provided. The optical system includes a polarizer configured to convert an incident light reflected or diffused from the target into linearly polarized light; a light modulating element configured to modulate a polarization state of the linearly polarized light in response to control signals; and a lens group comprising at least one birefringent element, the birefringent element configured to refract or reflect the modulated linearly polarized light with a first polarization state under a first refraction index to enable inspection of the target at a first object position, and the birefringent element further configured to refract or reflect the modulated linearly polarized light with a second polarization state under a second refraction index to enable inspection of the target at a second object position.

    摘要翻译: 提供一种被配置为目视检查相对于光学系统具有可变位置的目标的光学系统。 光学系统包括:偏振器,被配置为将从目标反射或扩散的入射光转换成线偏振光; 光调制元件,被配置为响应于控制信号调制所述线偏振光的偏振状态; 以及包括至少一个双折射元件的透镜组,所述双折射元件被配置为在第一折射率下折射或反射具有第一偏振态的调制线偏振光,以使得能够在第一物体位置检查所述目标,并且所述双折射元件 还被配置为在第二折射率下折射或反射具有第二偏振状态的经调制的线性偏振光,以使得能够在第二物体位置检查目标。

    Apparatus and method for contactless high resolution handprint capture
    7.
    发明授权
    Apparatus and method for contactless high resolution handprint capture 有权
    用于非接触式高分辨率手印捕获的装置和方法

    公开(公告)号:US08971588B2

    公开(公告)日:2015-03-03

    申请号:US13075694

    申请日:2011-03-30

    IPC分类号: G06K9/00 G02B5/30

    摘要: A system and method for contactless handprint capture is disclosed that includes an image capture device to capture whole handprint images of a subject hand at each of a plurality of different focal distances, with the image capture device including an imaging camera and an electro-optics arrangement having a plurality of light modulating elements and polarization sensitive optical elements having differing optical path lengths based on polarization states. A control system is coupled to the image capture device to cause the device to capture the handprint images at each of the different focal distances, with each handprint image having a depth-of-focus that overlaps with a depth-of-focus of handprint images at adjacent focal distances such that redundant handprint image data is captured. The control system registers each handprint image with positional data and creates a composite handprint image from the handprint images captured at the different focal distances.

    摘要翻译: 公开了一种用于非接触式手印捕获的系统和方法,其包括:图像捕获装置,用于在多个不同焦距的每一个处拍摄主体手的整个手印图像,所述图像捕获装置包括成像相机和电光装置 具有多个光调制元件和基于极化状态具有不同光程长度的偏振敏感光学元件。 控制系统耦合到图像捕获设备,以使设备在每个不同焦距下捕获手印图像,每个手印图像具有与手印图像的焦点深度重叠的焦点深度 在相邻焦距处,使得捕获冗余的手印图像数据。 控制系统使用位置数据登记每个手印图像,并且从在不同焦距处捕获的手印图像创建复合手印图像。

    Imaging systems and associated methods thereof
    9.
    发明授权
    Imaging systems and associated methods thereof 失效
    成像系统及其相关方法

    公开(公告)号:US08508589B2

    公开(公告)日:2013-08-13

    申请号:US12871538

    申请日:2010-08-30

    IPC分类号: H04N7/18

    摘要: Imaging systems and methods for generating images of a sample wherein the system comprises an illumination source for illuminating the sample; an image viewing subsystem for capturing images from the sample; one or more liquid crystal panels and one or more birefringent elements, which are positioned between the sample and the image viewing subsystem, so that the images from the sample pass through the liquid crystal panels and the birefringent elements before reaching the image viewing subsystem; a device that changes one or more polarization states of the liquid crystal panels; and a controller that is configured to cause the device to change the polarization states of the liquid crystal panels.

    摘要翻译: 用于产生样品图像的成像系统和方法,其中所述系统包括用于照亮样品的照明源; 用于从样本捕获图像的图像查看子系统; 一个或多个液晶面板和一个或多个双折射元件,其位于样品和图像观看子系统之间,使得来自样品的图像在到达图像观看子系统之前通过液晶面板和双折射元件; 改变液晶面板的一个或多个极化状态的装置; 以及控制器,其被配置为使得所述装置改变所述液晶面板的偏振状态。