公开(公告)号：US08559255B2

公开(公告)日：2013-10-15

申请号：US13569442

申请日：2012-08-08

Applicant: Sung-Yong Chung ,  Zhizheng Liu ,  Yugi Mizuguchi ,  Xuguang Alan Wang ,  Yi He ,  Ming Kwan ,  Darlene Hamilton ,  Sung-Chul Lee ,  Guowei Wang ,  Nancy Leong

Inventor： Sung-Yong Chung ,  Zhizheng Liu ,  Yugi Mizuguchi ,  Xuguang Alan Wang ,  Yi He ,  Ming Kwan ,  Darlene Hamilton ,  Sung-Chul Lee ,  Guowei Wang ,  Nancy Leong

IPC: G11C7/00

CPC classification number: G11C16/3418 ,  G11C16/0416 ,  G11C16/24 ,  G11C16/3427

Abstract: A system and methodology that can minimize disturbance during an AC operation associated with a memory, such as, program, read and/or erase, is provided. The system pre-charges all or a desired subset of the bit lines in a memory array to a specified voltage, during an AC operation to facilitate reducing AC disturbances between neighboring cells. A pre-charge voltage can be applied to all bit lines in a block in the memory array, or to bit lines associated with a selected memory cell and neighbor memory cells adjacent to the selected memory cell in the block. The system ensures that source and drain voltage levels can be set to desired levels at the same or substantially the same time, while selecting a memory cell. This can facilitate minimizing AC disturbances in the selected memory cell during the AC operation.

Abstract translation: 提供了一种能够在与诸如程序，读取和/或擦除之类的存储器相关联的AC操作期间最小化干扰的系统和方法。 在AC操作期间，系统将存储器阵列中的所有或所需的位线子集预充电到指定的电压，以便于减少相邻单元之间的AC干扰。 可以将预充电电压施加到存储器阵列中的块中的所有位线，或者对与所选择的存储器单元相关联的位线以及与块中所选择的存储单元相邻的相邻存储单元。 该系统确保在选择存储器单元时，源极和漏极电压电平可以在相同或基本相同的时间被设置为期望的电平。 这可以有助于在AC操作期间最小化所选择的存储器单元中的AC干扰。

公开(公告)号：US07957204B1

公开(公告)日：2011-06-07

申请号：US11229667

申请日：2005-09-20

Applicant: Yonggang Wu ,  Guowei Wang ,  Nian Yang ,  Sachit Chandra ,  Aaron Lee

Inventor： Yonggang Wu ,  Guowei Wang ,  Nian Yang ,  Sachit Chandra ,  Aaron Lee

IPC: G11C7/12 ,  G11C8/08 ,  G11C8/12 ,  G11C16/12

CPC classification number: G11C16/12 ,  G11C5/145 ,  G11C8/08

Abstract: A non-volatile memory device includes an array of non-volatile memory cells. When programming the memory cells, a voltage supply source is used that includes multiple independent charge pumps. The independent charge pumps supply the programming voltage to different ones of bit lines in the array of memory cells. Using multiple charge pumps tends to reduce output voltage fluctuations and thereby reduce power loss.

Abstract translation: 非易失性存储器件包括非易失性存储器单元阵列。 当对存储器单元进行编程时，使用包括多个独立电荷泵的电压源。 独立电荷泵将编程电压提供给存储器单元阵列中的不同位线。 使用多个电荷泵倾向于降低输出电压波动，从而降低功率损耗。

公开(公告)号：US07453724B2

公开(公告)日：2008-11-18

申请号：US11931992

申请日：2007-10-31

Applicant: Aaron Lee ,  Hounien Chen ,  Sachit Chandra ,  Nancy Leong ,  Guowei Wang

Inventor： Aaron Lee ,  Hounien Chen ,  Sachit Chandra ,  Nancy Leong ,  Guowei Wang

IPC: G11C11/34 ,  G11C16/06

CPC classification number: G11C16/0475 ,  G11C16/3454 ,  G11C16/3459

Abstract: A method is provided for programming a nonvolatile memory device including an array of memory cells, where each memory cell including a substrate, a control gate, a charge storage element, a source region and a drain region. The method includes receiving a programming window that identifies a plurality of memory cells in the array. A first group of memory cells to be programmed is identified from the plurality of memory cells in the programming window. The first group of memory cells is programmed and a programming state of the first group of memory cells is verified.

Abstract translation: 提供了一种用于对包括存储器单元阵列的非易失性存储器件进行编程的方法，其中每个存储器单元包括衬底，控制栅极，电荷存储元件，源极区域和漏极区域。 该方法包括接收标识阵列中的多个存储单元的编程窗口。 在编程窗口中从多个存储器单元识别要编程的第一组存储器单元。 第一组存储器单元被编程，并且验证第一组存储器单元的编程状态。

公开(公告)号：US08462564B1

公开(公告)日：2013-06-11

申请号：US13090981

申请日：2011-04-20

Applicant: Yonggang Wu ,  Guowei Wang ,  Nian Yang ,  Sachit Chandra ,  Aaron Lee

Inventor： Yonggang Wu ,  Guowei Wang ,  Nian Yang ,  Sachit Chandra ,  Aaron Lee

IPC: G11C7/12 ,  G11C8/08 ,  G11C8/12 ,  G11C16/12

CPC classification number: G11C16/12 ,  G11C5/145 ,  G11C8/08

Abstract: A non-volatile memory device includes an array of non-volatile memory cells. When programming the memory cells, a voltage supply source is used that includes multiple independent charge pumps. The independent charge pumps supply the programming voltage to different ones of bit lines in the array of memory cells. Using multiple charge pumps tends to reduce output voltage fluctuations and thereby reduce power loss.

Abstract translation: 非易失性存储器件包括非易失性存储器单元阵列。 当对存储器单元进行编程时，使用包括多个独立电荷泵的电压源。 独立电荷泵将编程电压提供给存储器单元阵列中的不同位线。 使用多个电荷泵倾向于降低输出电压波动，从而降低功率损耗。

公开(公告)号：US08358543B1

公开(公告)日：2013-01-22

申请号：US11229529

申请日：2005-09-20

Applicant: Guowei Wang ,  Sachit Chandra ,  Nian Yang

Inventor： Guowei Wang ,  Sachit Chandra ,  Nian Yang

IPC: G11C16/00 ,  G11C16/04 ,  G11C16/06

CPC classification number: G11C16/0483 ,  G11C16/06 ,  G11C16/12

Abstract: Techniques for programming a non-volatile memory device, such as a Flash memory, include floating source lines of memory cells based on a data pattern that is being programmed to the memory device. The source lines to float are selected such that a distance between drain bit lines and source bit lines of different memory cells in a row is maximized. In this manner, leakage current between these drain bit lines and source bit lines can be decreased.

Abstract translation: 用于对诸如闪存之类的非易失性存储器件进行编程的技术包括基于正被编程到存储器件的数据模式的存储器单元的浮动源线。 选择浮置的源极线使得排列位线和行中的不同存储器单元的源位线之间的距离最大化。 以这种方式，可以减小这些漏极位线和源极线之间的漏电流。

公开(公告)号：US07986562B2

公开(公告)日：2011-07-26

申请号：US12650118

申请日：2009-12-30

Applicant: Sung-Yong Chung ,  Zhizheng Liu ,  Yugi Mizuguchi ,  Xuguang Alan Wang ,  Yi He ,  Ming Kwan ,  Darlene Hamilton ,  Sung-Chul Lee ,  Guowei Wang ,  Nancy Leong

Inventor： Sung-Yong Chung ,  Zhizheng Liu ,  Yugi Mizuguchi ,  Xuguang Alan Wang ,  Yi He ,  Ming Kwan ,  Darlene Hamilton ,  Sung-Chul Lee ,  Guowei Wang ,  Nancy Leong

IPC: G11C16/06

CPC classification number: G11C16/3418 ,  G11C16/0416 ,  G11C16/24 ,  G11C16/3427

Abstract: A system and methodology that can minimize disturbance during an AC operation associated with a memory, such as, program, read and/or erase, is provided. The system pre-charges all or a desired subset of the bit lines in a memory array to a specified voltage, during an AC operation to facilitate reducing AC disturbances between neighboring cells. A pre-charge voltage can be applied to all bit lines in a block in the memory array, or to bit lines associated with a selected memory cell and neighbor memory cells adjacent to the selected memory cell in the block. The system ensures that source and drain voltage levels can be set to desired levels at the same or substantially the same time, while selecting a memory cell. This can facilitate minimizing AC disturbances in the selected memory cell during the AC operation.

Abstract translation: 提供了一种能够在与诸如程序，读取和/或擦除之类的存储器相关联的AC操作期间最小化干扰的系统和方法。 在AC操作期间，系统将存储器阵列中的所有或所需的位线子集预充电到指定的电压，以便于减少相邻单元之间的AC干扰。 可以将预充电电压施加到存储器阵列中的块中的所有位线，或者对与所选择的存储器单元相关联的位线以及与块中所选择的存储单元相邻的相邻存储单元。 该系统确保在选择存储器单元时，源极和漏极电压电平可以在相同或基本相同的时间被设置为期望的电平。 这可以有助于在AC操作期间最小化所选择的存储器单元中的AC干扰。

公开(公告)号：US20090161462A1

公开(公告)日：2009-06-25

申请号：US11963508

申请日：2007-12-21

Applicant: Sung-Yong Chung ,  Zhizheng Liu ,  Yugi Mizuguchi ,  Xuguang Alan Wang ,  Yi He ,  Ming Kwan ,  Darlene Hamilton ,  Sung-Chul Lee ,  Guowei Wang ,  Nancy Leong

Inventor： Sung-Yong Chung ,  Zhizheng Liu ,  Yugi Mizuguchi ,  Xuguang Alan Wang ,  Yi He ,  Ming Kwan ,  Darlene Hamilton ,  Sung-Chul Lee ,  Guowei Wang ,  Nancy Leong

IPC: G11C7/02

CPC classification number: G11C16/3418 ,  G11C16/0416 ,  G11C16/24 ,  G11C16/3427

Abstract: A system and methodology that can minimize disturbance during an AC operation associated with a memory, such as, program, read and/or erase, is provided. The system pre-charges all or a desired subset of the bit lines in a memory array to a specified voltage, during an AC operation to facilitate reducing AC disturbances between neighboring cells. A pre-charge voltage can be applied to all bit lines in a block in the memory array, or to bit lines associated with a selected memory cell and neighbor memory cells adjacent to the selected memory cell in the block. The system ensures that source and drain voltage levels can be set to desired levels at the same or substantially the same time, while selecting a memory cell. This can facilitate minimizing AC disturbances in the selected memory cell during the AC operation.

Abstract translation: 提供了一种能够在与诸如程序，读取和/或擦除之类的存储器相关联的AC操作期间最小化干扰的系统和方法。 在AC操作期间，系统将存储器阵列中的所有或所需的位线子集预充电到指定的电压，以便于减少相邻单元之间的AC干扰。 可以将预充电电压施加到存储器阵列中的块中的所有位线，或者对与所选择的存储器单元相关联的位线以及与块中所选择的存储单元相邻的相邻存储单元。 该系统确保在选择存储器单元时，源极和漏极电压电平可以在相同或基本相同的时间被设置为期望的电平。 这可以有助于在AC操作期间最小化所选择的存储器单元中的AC干扰。

公开(公告)号：US6125055A

公开(公告)日：2000-09-26

申请号：US421105

申请日：1999-10-19

Applicant: Yasushi Kasa ,  Guowei Wang

Inventor： Yasushi Kasa ,  Guowei Wang

IPC: G11C8/12 ,  G11C15/04 ,  G11C16/22 ,  G11C16/04

CPC classification number: G11C8/12 ,  G11C15/046 ,  G11C16/22

Abstract: A simultaneous operation flash memory capable of write protecting predetermined sectors in the simultaneous operation flash memory. The preferred simultaneous operation flash memory includes a plurality of sectors divided into an upper bank and a sliding lower bank. Each bank is associated with a predetermined amount of sectors in the simultaneous operation flash memory. The simultaneous operation flash memory also includes at least one upper address decoder circuit that has a upper sector select line. During operation, each upper address decoder circuit generates a predetermined output signal on the upper sector select line when selected. In addition, the simultaneous operation flash memory includes at least one lower address decoder circuit including a lower address sector select line, wherein each upper address decoder circuit generates a predetermined output signal on the lower sector select line when selected during operation. Finally, at least one write protect CAM is electrically connected with a respective upper sector select line or a respective lower sector select line, wherein said write protect CAM generates a sector protect signal if the write protect CAM is selected by the respective upper sector select line or the respective lower sector select line.

Abstract translation: 一种同时操作的闪速存储器，其能够写入保护同时操作闪速存储器中的预定扇区。 优选的同时操作闪速存储器包括被划分为上部存储体和滑动式下部存储体的多个扇区。 每个存储体与同步操作闪速存储器中的预定量的扇区相关联。 同时运行的闪速存储器还包括具有上扇区选择线的至少一个高地址解码器电路。 在操作期间，每个高地址解码器电路在选择时在上扇区选择线上产生预定的输出信号。 此外，同时操作闪速存储器包括至少一个下位地址解码器电路，其包括较低地址扇区选择线，其中每个上位地址解码器电路在操作期间选择时在下扇区选择线上产生预定的输出信号。 最后，至少一个写保护CAM与相应的上扇区选择线或相应的下扇区选择线电连接，其中如果写保护CAM由相应的上扇区选择线选择，则所述写保护CAM产生扇区保护信号 或相应的下扇区选择线。

公开(公告)号：US20120294103A1

公开(公告)日：2012-11-22

申请号：US13569442

申请日：2012-08-08

Applicant: Sung-Yong Chung ,  Zhizheng Liu ,  Yugi Mizuguchi ,  Xuguang Alan Wang ,  Yi He ,  Ming Kwan ,  Darlene Hamilton ,  Sung-Chul Lee ,  Guowei Wang ,  Nancy Leong

Inventor： Sung-Yong Chung ,  Zhizheng Liu ,  Yugi Mizuguchi ,  Xuguang Alan Wang ,  Yi He ,  Ming Kwan ,  Darlene Hamilton ,  Sung-Chul Lee ,  Guowei Wang ,  Nancy Leong

IPC: G11C7/12

CPC classification number: G11C16/3418 ,  G11C16/0416 ,  G11C16/24 ,  G11C16/3427

Abstract: A system and methodology that can minimize disturbance during an AC operation associated with a memory, such as, program, read and/or erase, is provided. The system pre-charges all or a desired subset of the bit lines in a memory array to a specified voltage, during an AC operation to facilitate reducing AC disturbances between neighboring cells. A pre-charge voltage can be applied to all bit lines in a block in the memory array, or to bit lines associated with a selected memory cell and neighbor memory cells adjacent to the selected memory cell in the block. The system ensures that source and drain voltage levels can be set to desired levels at the same or substantially the same time, while selecting a memory cell. This can facilitate minimizing AC disturbances in the selected memory cell during the AC operation.

Abstract translation: 提供了一种能够在与诸如程序，读取和/或擦除之类的存储器相关联的AC操作期间最小化干扰的系统和方法。 在AC操作期间，系统将存储器阵列中的所有或所需的位线子集预充电到指定的电压，以便于减少相邻单元之间的AC干扰。 可以将预充电电压施加到存储器阵列中的块中的所有位线，或者对与所选择的存储器单元相关联的位线以及与块中所选择的存储单元相邻的相邻存储单元。 该系统确保在选择存储器单元时，源极和漏极电压电平可以在相同或基本相同的时间被设置为期望的电平。 这可以有助于在AC操作期间最小化所选择的存储器单元中的AC干扰。

公开(公告)号：US07679967B2

公开(公告)日：2010-03-16

申请号：US11963508

申请日：2007-12-21

Applicant: Sung-Yong Chung ,  Zhizheng Liu ,  Yugi Mizuguchi ,  Xuguang Alan Wang ,  Yi He ,  Ming Kwan ,  Darlene Hamilton ,  Sung-Chul Lee ,  Guowei Wang ,  Nancy Leong

Inventor： Sung-Yong Chung ,  Zhizheng Liu ,  Yugi Mizuguchi ,  Xuguang Alan Wang ,  Yi He ,  Ming Kwan ,  Darlene Hamilton ,  Sung-Chul Lee ,  Guowei Wang ,  Nancy Leong

IPC: G11C16/06

CPC classification number: G11C16/3418 ,  G11C16/0416 ,  G11C16/24 ,  G11C16/3427

Abstract: A system and methodology that can minimize disturbance during an AC operation associated with a memory, such as, program, read and/or erase, is provided. The system pre-charges all or a desired subset of the bit lines in a memory array to a specified voltage, during an AC operation to facilitate reducing AC disturbances between neighboring cells. A pre-charge voltage can be applied to all bit lines in a block in the memory array, or to bit lines associated with a selected memory cell and neighbor memory cells adjacent to the selected memory cell in the block. The system ensures that source and drain voltage levels can be set to desired levels at the same or substantially the same time, while selecting a memory cell. This can facilitate minimizing AC disturbances in the selected memory cell during the AC operation.

Abstract translation: 提供了一种能够在与诸如程序，读取和/或擦除之类的存储器相关联的AC操作期间最小化干扰的系统和方法。 在AC操作期间，系统将存储器阵列中的所有或所需的位线子集预充电到指定的电压，以便于减少相邻单元之间的AC干扰。 可以将预充电电压施加到存储器阵列中的块中的所有位线，或者对与所选择的存储器单元相关联的位线以及与块中所选择的存储单元相邻的相邻存储单元。 该系统确保在选择存储器单元时，源极和漏极电压电平可以在相同或基本相同的时间被设置为期望的电平。 这可以有助于在AC操作期间最小化所选择的存储器单元中的AC干扰。