ION DETECTOR AND MASS SPECTROMETER

    公开(公告)号:US20250006480A1

    公开(公告)日:2025-01-02

    申请号:US18751600

    申请日:2024-06-24

    Abstract: An ion detector includes a conversion dynode having a conversion region, an electron multiplier including a first-stage dynode, a box electrode including a first opening through which the ions traveling to the conversion region pass and a second opening through which the electrons traveling to the first-stage dynode pass, a conductive shielding portion disposed in the first opening and including a gap through which the ions traveling to the conversion region pass, and a potential application unit which applies a first potential to the conversion dynode, applies a second potential to the first-stage dynode, applies a third potential to the box electrode, and applies a fourth potential to the shielding portion. The first potential and the third potential have polarities opposite to a polarity of the ions, the second potential is higher than the first potential, and the third potential and the fourth potential are substantially the same potential.

    ION DETECTOR AND ANALYZER
    3.
    发明申请

    公开(公告)号:US20240404814A1

    公开(公告)日:2024-12-05

    申请号:US18645668

    申请日:2024-04-25

    Abstract: An ion detector includes a conversion dynode including a conversion region where electrons are emitted by incident ions, an electron multiplier including an electron incident surface on which the electrons are incident, and an aperture electrode including an aperture through which the electrons traveling from the conversion region to the electron incident surface pass. The conversion region is a region protruding toward a space where the electrons are emitted.

    ION DETECTOR AND MASS SPECTROMETER

    公开(公告)号:US20210343517A1

    公开(公告)日:2021-11-04

    申请号:US17241224

    申请日:2021-04-27

    Abstract: An ion detector includes a first dynode, a second dynode, a scintillator, a conductive layer, and a photomultiplier tube. The first dynode is configured to emit a charged particle in response to the incidence of the ion. The second dynode is configured to be given a negative potential and emit a secondary electron in response to incidence of the charged particle from the first dynode. The scintillator includes an electron incident surface arranged to receive the secondary electron from the second dynode, and is configured to convert the secondary electron into light. The conductive layer is disposed on the electron incident surface. The photomultiplier tube is configured to detect the light from the scintillator.

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