INTERNAL STRUCTURE DETECTION SYSTEM
    2.
    发明申请

    公开(公告)号:US20200278463A1

    公开(公告)日:2020-09-03

    申请号:US16646197

    申请日:2017-10-25

    Applicant: HITACHI, LTD.

    Abstract: An internal structure detection system includes: two kinds of sensors with different operating principles for receiving reflected waves of vibration applied to an inspection target in an investigation area; and a processing apparatus that detects an internal structure of the inspection target by using the sensor data received by the two kinds of sensors. The two kinds of sensors are deployed in the investigation area with different densities, in a distributed manner.

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