ADDITIVE MANUFACTURING CONDITION SEARCH DEVICE AND ADDITIVE MANUFACTURING CONDITION SEARCH METHOD

    公开(公告)号:US20250050586A1

    公开(公告)日:2025-02-13

    申请号:US18724042

    申请日:2022-11-09

    Applicant: HITACHI, LTD.

    Abstract: An additive manufacturing condition search device includes a defect database that accumulates a material, shape information, an additive manufacturing condition, monitoring information during modeling, and defect information in association with each other, a first machine learning unit that outputs an additive manufacturing condition corresponding to material information and device information, and outputs a new additive manufacturing condition from a combination of a plurality of the additive manufacturing conditions and the defect information, a specification unit that causes an additive manufacturing apparatus to perform modeling by the additive manufacturing condition, acquires the monitoring information during modeling, and acquires the shape information and the defect information by inspection of a modeled object, a second machine learning unit in which a model trained by using the defect database as train data estimates defect information of the modeled object from the monitoring information and stores the defect information in the defect database, and a determination unit that determines whether or not the defect information of the modeled object has achieved an evaluation target value.

Patent Agency Ranking