Electron Microscope
    2.
    发明申请
    Electron Microscope 有权
    电子显微镜

    公开(公告)号:US20160225581A1

    公开(公告)日:2016-08-04

    申请号:US15022436

    申请日:2014-10-31

    Abstract: To improve the workability of the task of adjusting the position of a limit field diaphragm. An electron microscope provided with an image-capturing means for capturing an image of an observation visual field prior to insertion of a limit field diaphragm as a map image, a recording means for recording the map image, an extraction means for capturing an image of the observation visual field after insertion of the limit field diaphragm and extracting the outline of the diaphragm, a drawing means for drawing the outline on the map image, and a display means for displaying the image drawn by the drawing means.

    Abstract translation: 提高调节极限场隔膜位置任务的可操作性。 一种具有图像捕获装置的电子显微镜,其用于在作为地图图像的极限场光阑插入之前捕获观察视野的图像,用于记录地图图像的记录装置,用于拍摄图像的图像的提取装置 插入极限视场光阑并提取光阑的轮廓之后的观察视野,用于在地图图像上绘制轮廓的绘图装置,以及显示由绘图装置绘制的图像的显示装置。

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