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公开(公告)号:US20130099396A1
公开(公告)日:2013-04-25
申请号:US13707941
申请日:2012-12-07
申请人: Henkel Corporation
发明人: Jeffrey Gasa , Dung Nghi Phan , Jeffrey Leon , Sharad Hajela , Shengqian Kong
CPC分类号: C08L63/00 , C08G77/28 , C08L83/08 , H01L21/56 , H01L21/6836 , H01L23/293 , H01L23/296 , H01L24/27 , H01L24/29 , H01L24/83 , H01L25/50 , H01L2224/274 , H01L2224/27436 , H01L2224/29 , H01L2224/29101 , H01L2224/2919 , H01L2224/2929 , H01L2224/29324 , H01L2224/29339 , H01L2224/29344 , H01L2224/29347 , H01L2224/29355 , H01L2224/29364 , H01L2224/29369 , H01L2224/2937 , H01L2224/29386 , H01L2224/29388 , H01L2224/29393 , H01L2224/83191 , H01L2224/83855 , H01L2224/83856 , H01L2924/00013 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/0102 , H01L2924/01029 , H01L2924/01033 , H01L2924/0104 , H01L2924/01046 , H01L2924/01047 , H01L2924/01056 , H01L2924/01057 , H01L2924/01061 , H01L2924/01074 , H01L2924/01077 , H01L2924/01078 , H01L2924/01079 , H01L2924/014 , H01L2924/0665 , H01L2924/0635 , H01L2924/00 , H01L2924/00014 , H01L2924/05432 , H01L2924/05442 , H01L2924/04642 , H01L2924/0503 , H01L2224/29099 , H01L2224/29199 , H01L2224/29299
摘要: A process for coating a semiconductor wafer with a coating composition comprises curing the coating with a pulsed UV light, thereby preventing delamination during reflow operations. In a particular embodiment, the coating composition comprises both epoxy and acrylate resins. The epoxy resin can be cured thermally; the acrylate resin is cured by UV irradiation.
摘要翻译: 用涂料组合物涂覆半导体晶片的方法包括用脉冲UV光固化涂层,从而防止回流操作期间的分层。 在一个具体实施方案中,涂料组合物包含环氧树脂和丙烯酸酯树脂。 环氧树脂可以热固化; 丙烯酸酯树脂通过UV照射固化。
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公开(公告)号:US08791033B2
公开(公告)日:2014-07-29
申请号:US13707941
申请日:2012-12-07
申请人: Henkel Corporation
发明人: Jeffrey Gasa , Dung Nghi Phan , Jeffrey Leon , Sharad Hajela , Shengqian Kong
IPC分类号: H01L21/56
CPC分类号: C08L63/00 , C08G77/28 , C08L83/08 , H01L21/56 , H01L21/6836 , H01L23/293 , H01L23/296 , H01L24/27 , H01L24/29 , H01L24/83 , H01L25/50 , H01L2224/274 , H01L2224/27436 , H01L2224/29 , H01L2224/29101 , H01L2224/2919 , H01L2224/2929 , H01L2224/29324 , H01L2224/29339 , H01L2224/29344 , H01L2224/29347 , H01L2224/29355 , H01L2224/29364 , H01L2224/29369 , H01L2224/2937 , H01L2224/29386 , H01L2224/29388 , H01L2224/29393 , H01L2224/83191 , H01L2224/83855 , H01L2224/83856 , H01L2924/00013 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/0102 , H01L2924/01029 , H01L2924/01033 , H01L2924/0104 , H01L2924/01046 , H01L2924/01047 , H01L2924/01056 , H01L2924/01057 , H01L2924/01061 , H01L2924/01074 , H01L2924/01077 , H01L2924/01078 , H01L2924/01079 , H01L2924/014 , H01L2924/0665 , H01L2924/0635 , H01L2924/00 , H01L2924/00014 , H01L2924/05432 , H01L2924/05442 , H01L2924/04642 , H01L2924/0503 , H01L2224/29099 , H01L2224/29199 , H01L2224/29299
摘要: A process for coating a semiconductor wafer with a coating composition comprises curing the coating with a pulsed UV light, thereby preventing delamination during reflow operations. In a particular embodiment, the coating composition comprises both epoxy and acrylate resins. The epoxy resin can be cured thermally; the acrylate resin is cured by UV irradiation.
摘要翻译: 用涂料组合物涂覆半导体晶片的方法包括用脉冲UV光固化涂层,从而防止回流操作期间的分层。 在一个具体实施方案中,涂料组合物包含环氧树脂和丙烯酸酯树脂。 环氧树脂可以热固化; 丙烯酸酯树脂通过UV照射固化。
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3.WAFER BACKSIDE COATING CONTAINING REACTIVE SULFUR COMPOUND 审中-公开
标题翻译: 包含反应性硫化物的WAFER BACKSIDE COATING公开(公告)号:US20130101856A1
公开(公告)日:2013-04-25
申请号:US13707803
申请日:2012-12-07
申请人: Henkel Corporation
发明人: Sharad Hajela , Shengqian Kong , Jeffrey Gasa , Jeffrey Leon , Dung Nghi Phan
IPC分类号: C09D163/04
CPC分类号: C09D163/04 , C08G77/28 , C08L33/08 , C08L63/00 , C08L83/04 , C09J133/062 , C09J163/00 , Y10T428/31511
摘要: A wafer backside coating compositions comprises an epoxy, a resin with ethylenic unsaturation, and a reactive sulfur compound and is effective to reduce delamination during reflow operations.
摘要翻译: 晶片背面涂料组合物包含环氧树脂,具有烯属不饱和键的树脂和反应性硫化合物,并且有效地减少回流操作期间的分层。
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