Growth of Nitride Semiconductor Crystals
    1.
    发明申请
    Growth of Nitride Semiconductor Crystals 失效
    氮化物半导体晶体的生长

    公开(公告)号:US20070256626A1

    公开(公告)日:2007-11-08

    申请号:US11659339

    申请日:2005-08-31

    摘要: A process for growing a crystal of a nitride semiconductor in which after the step of mounting a substrate (12) in a reaction tube (11), the step of feeding a first material gas containing a Group 3 element onto the substrate in the reaction tube and the step of feeding a second material gas containing elemental nitrogen onto the substrate in the reaction tube are carried out alternately to deposit a nitride semiconductor crystal directly on the substrate. The number of moles of the elemental nitrogen contained in the second material gas has a ratio of 200 or more to the number of moles of the Group 3 element in the first material gas.

    摘要翻译: 一种用于生长氮化物半导体的晶体的方法,其中在将反应管(11)中安装基板(12)的步骤之后,将包含第3族元素的第一原料气体进料到反应管中的基板上 并且在反应管中将含有元素氮的第二原料气体进料到基板上的步骤交替地进行,以将氮化物半导体晶体直接沉积在基板上。 第二原料气体中所含的元素氮的摩尔数与第一原料气体中的第三族元素的摩尔数相比为200以上。

    Growth of nitride semiconductor crystals
    2.
    发明授权
    Growth of nitride semiconductor crystals 失效
    氮化物半导体晶体的生长

    公开(公告)号:US08529697B2

    公开(公告)日:2013-09-10

    申请号:US11659339

    申请日:2005-08-31

    IPC分类号: C30B25/00

    摘要: A process for growing a crystal of a nitride semiconductor in which after the step of mounting a substrate (12) in a reaction tube (11), the step of feeding a first material gas containing a Group 3 element onto the substrate in the reaction tube and the step of feeding a second material gas containing elemental nitrogen onto the substrate in the reaction tube are carried out alternately to deposit a nitride semiconductor crystal directly on the substrate. The number of moles of the elemental nitrogen contained in the second material gas has a ratio of 200 or more to the number of moles of the Group 3 element in the first material gas.

    摘要翻译: 一种用于生长氮化物半导体的晶体的方法,其中在将反应管(11)中安装基板(12)的步骤之后,将包含第3族元素的第一原料气体进料到反应管中的基板上 并且在反应管中将含有元素氮的第二原料气体进料到基板上的步骤交替地进行,以将氮化物半导体晶体直接沉积在基板上。 第二原料气体中所含的元素氮的摩尔数与第一原料气体中的第三族元素的摩尔数相比为200以上。