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1.发明授权公开(公告)号：US06445071B1
公开(公告)日：2002-09-03
申请号：US09488781
申请日：2000-01-21
IPC分类号： H01L2348
CPC分类号： H01L23/5222 , H01L23/5226 , H01L23/5329 , H01L23/53295 , H01L2924/0002 , H01L2924/00
摘要： A semiconductor device, having a multi-layer interconnection structure, is provided which comprises a semiconductor substrate and a plurality of interlayer insulating films formed on the semiconductor substrate. A plurality of conductive leads are formed in the interlayer insulating films. In one of the interlayer insulting films having conductive lead or leads, at least one conductive plug is formed vertically to connect the conductive leads in different interlayer insulating films. Further, adjacent conductive leads may be formed in an adjacent interlayer insulating films are connected together to form a unified conductive lead.
摘要翻译： 提供具有多层互连结构的半导体器件，其包括形成在半导体衬底上的半导体衬底和多个层间绝缘膜。 在层间绝缘膜中形成多个导电引线。 在具有导电引线或引线的层间绝缘膜之一中，垂直形成至少一个导电插塞，以在不同的层间绝缘膜中连接导电引线。 此外，相邻的导电引线可以形成在相邻的层间绝缘膜中连接在一起以形成统一的导电引线。
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公开(公告)号：US06731140B2
公开(公告)日：2004-05-04
申请号：US10421991
申请日：2003-04-22
IPC分类号： H03K1700
CPC分类号： H03K5/151 , H03K3/037 , H03K5/1252
摘要： A complement reset multiplexer latch is provided. The complement reset multiplexer latch selectively regenerates a first or a second data input signal on an output node. To react to rising edges of the first or the second data signal, the complement reset multiplexer latch includes a first and a second rising edge pulse reset control. To react to falling edges of the first or the second data signal, the complement reset multiplexer latch includes a first and a second falling edge pulse reset control. The complement reset multiplexer latch also selectively holds the output node at a stored value responsive to a clock signal. A multiplexer is used to select from the first or the second data input the value that is stored.
摘要翻译： 提供补码复位多路复用器锁存器。 补码复位多路复用器锁存器选择性地重新生成输出节点上的第一或第二数据输入信号。 为了对第一或第二数据信号的上升沿作出反应，补码复位多路复用器锁存器包括第一和第二上升沿脉冲复位控制。 为了对第一或第二数据信号的下降沿作出反应，补码复位多路复用器锁存器包括第一和第二下降沿脉冲复位控制。 补码复位多路复用器锁存器还选择性地将输出节点保持在响应于时钟信号的存储值。 多路复用器用于从第一或第二数据输入中选择存储的值。
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公开(公告)号：US07535790B2
公开(公告)日：2009-05-19
申请号：US11806453
申请日：2007-05-31
申请人： Akihiko Harada
发明人： Akihiko Harada
IPC分类号： G11C8/00
CPC分类号： G06F1/04 , G06F1/3203 , G06F1/3237 , G06F1/3287 , G11C7/22 , G11C7/222 , H03K19/0016 , Y02D10/128 , Y02D10/171 , Y02D50/20
摘要： The present invention provides a semiconductor device having a plurality of functional blocks and a select signal generation circuit for supplying a select signal to a functional block to be operated out of the plurality of blocks. A clock generation unit in the function clock, to which the select signal and a system clock are supplied, generates a control clock based on the system clock when the select signal is being supplied, and stops generation of the control clock when the select signal is not being supplied. When the select signal is not received, a dynamic circuit provided inside the functional block does not operate since the control clock is not supplied. When the select signal is received, the control clock is supplied and the dynamic circuit repeats precharge and discharge for each clock cycle, and performs operation to execute a predetermined function, and consumes power.
摘要翻译： 本发明提供一种具有多个功能块的半导体器件和用于向多个块中要被操作的功能块提供选择信号的选择信号生成电路。 在提供选择信号和系统时钟的功能时钟中的时钟产生单元在选择信号被提供时基于系统时钟产生控制时钟，并且当选择信号为 不提供 当未接收到选择信号时，由于不提供控制时钟，所以在功能块内设置的动态电路不工作。 当接收到选择信号时，提供控制时钟，并且动态电路在每个时钟周期重复预充电和放电，并执行执行预定功能的操作并消耗电力。
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公开(公告)号：US6040627A
公开(公告)日：2000-03-21
申请号：US59702
申请日：1998-04-14
IPC分类号： H01L21/302 , H01L21/3065 , H01L21/3205 , H01L21/3213 , H01L21/768 , H01L23/52 , H01L23/522 , H01L23/532 , H01L23/48 , H01L29/40
CPC分类号： H01L23/53223 , H01L21/76838 , H01L23/5226 , H01L2924/0002
摘要： A semiconductor device is formed with interconnections having reduced electric resistance. The semiconductor device comprises an upper wiring formed on an insulating film with a barrier metal therebetween, a conductive plug formed in a plugging space of the insulating film and electrically connected to the upper wiring at an opening of the plugging space, and a sidewall formed on a side surface of the upper wiring, the bottom of the sidewall covering the opening of the plugging space not covered by the upper wiring.
摘要翻译： 形成具有降低的电阻的互连的半导体器件。 所述半导体器件包括在绝缘膜上形成的阻挡金属的上部布线，形成在所述绝缘膜的封堵空间中并在所述封闭空间的开口处电连接到所述上部布线的导电塞，以及形成在 上部布线的侧表面，侧壁的底部覆盖未被上部布线覆盖的封闭空间的开口。
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5.发明申请POWER SOURCE NOISE MEASURING DEVICE, INTEGRATED CIRCUIT, AND SEMICONDUCTOR DEVIDE 失效电源噪声测量器件，集成电路和半导体器件公开(公告)号：US20080106324A1
公开(公告)日：2008-05-08
申请号：US11737215
申请日：2007-04-19
CPC分类号： G01R31/31709 , G01R31/31708 , G01R31/31721
摘要： To accurately measure power source noise generated inside an integrated circuit, the power source noise measuring device comprises: a mutual inductor pair placed inside an integrated circuit, the mutual inductor pair including (i) a first inductor connected to between power source voltages of the integrated circuit and (ii) a second inductor arranged opposite the first inductor, the both ends of which second inductor are connected to external output terminals; and a power source noise measuring unit which measures power source noise of the integrated circuit on the basis of a voltage waveform output from the second inductor of said mutual inductor pair via the external output terminals.
摘要翻译： 为了精确地测量在集成电路内产生的电源噪声，电源噪声测量装置包括：放置在集成电路内的互感器对，所述互感器对包括（i）第一电感器，其连接到所述集成电路的电源电压之间 电路和（ii）与第一电感器相对布置的第二电感器，其第二电感器的两端连接到外部输出端子; 以及电源噪声测量单元，其基于经由所述外部输出端子从所述互感器对的第二电感器输出的电压波形来测量所述集成电路的电源噪声。
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6.发明授权Four-state switched decoupling capacitor system for active power stabilizer 有权用于有功功率稳定器的四态开关去耦电容器系统公开(公告)号：US06744242B1
公开(公告)日：2004-06-01
申请号：US10342592
申请日：2003-01-14
IPC分类号： G05F144
CPC分类号： G05F1/56
摘要： In a packaged integrated circuit, the package inductance limits the rate at which off-chip current may be varied in response to a change in on-chip current demand of the integrated circuit. The present invention provides an on-chip voltage regulator circuit for regulating multi-cycle voltage fluctuations of an integrated circuit associated with changes in current demand of the integrated circuit. The voltage regulator sources current to prevent an undervoltage conditions and sinks current to prevent an overvoltage condition.
摘要翻译： 在封装的集成电路中，封装电感限制了片外电流可以响应于集成电路的片上电流需求的变化而变化的速率。 本发明提供一种用于调节与集成电路的电流需求变化相关联的集成电路的多周期电压波动的片上稳压器电路。 电压调节器通过电流来防止欠压状况，并吸收电流以防止过压状态。
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7.发明授权Technique for measuring power source noise generated inside integrated circuit 有权用于测量集成电路内部产生的电源噪声的技术公开(公告)号：US07948228B2
公开(公告)日：2011-05-24
申请号：US12614641
申请日：2009-11-09
CPC分类号： G01R31/31709 , G01R31/31708 , G01R31/31721
摘要： To accurately measure power source noise generated inside an integrated circuit, the power source noise measuring device comprises: a mutual inductor pair placed inside an integrated circuit, the mutual inductor pair including (i) a first inductor connected to between power source voltages of the integrated circuit and (ii) a second inductor arranged opposite the first inductor, the both ends of which second inductor are connected to external output terminals; and a power source noise measuring unit which measures power source noise of the integrated circuit on the basis of a voltage waveform output from the second inductor of said mutual inductor pair via the external output terminals.
摘要翻译： 为了精确地测量在集成电路内产生的电源噪声，电源噪声测量装置包括：放置在集成电路内的互感器对，所述互感器对包括（i）第一电感器，其连接到所述集成电路的电源电压之间 电路和（ii）与第一电感器相对布置的第二电感器，其第二电感器的两端连接到外部输出端子; 以及电源噪声测量单元，其基于经由所述外部输出端子从所述互感器对的第二电感器输出的电压波形来测量所述集成电路的电源噪声。
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8.发明授权Power source noise measuring device, integrated circuit, and semiconductor device 失效电源噪声测量装置，集成电路和半导体装置公开(公告)号：US07635986B2
公开(公告)日：2009-12-22
申请号：US11737215
申请日：2007-04-19
CPC分类号： G01R31/31709 , G01R31/31708 , G01R31/31721
摘要： To accurately measure power source noise generated inside an integrated circuit, the power source noise measuring device comprises: a mutual inductor pair placed inside an integrated circuit, the mutual inductor pair including (i) a first inductor connected to between power source voltages of the integrated circuit and (ii) a second inductor arranged opposite the first inductor, the both ends of which second inductor are connected to external output terminals; and a power source noise measuring unit which measures power source noise of the integrated circuit on the basis of a voltage waveform output from the second inductor of said mutual inductor pair via the external output terminals.
摘要翻译： 为了精确地测量在集成电路内产生的电源噪声，电源噪声测量装置包括：放置在集成电路内的互感器对，所述互感器对包括（i）第一电感器，其连接到所述集成电路的电源电压之间 电路和（ii）与第一电感器相对布置的第二电感器，其第二电感器的两端连接到外部输出端子; 以及电源噪声测量单元，其基于经由所述外部输出端子从所述互感器对的第二电感器输出的电压波形来测量所述集成电路的电源噪声。
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公开(公告)号：US20070242556A1
公开(公告)日：2007-10-18
申请号：US11806453
申请日：2007-05-31
申请人： Akihiko Harada
发明人： Akihiko Harada
IPC分类号： G11C8/00
CPC分类号： G06F1/04 , G06F1/3203 , G06F1/3237 , G06F1/3287 , G11C7/22 , G11C7/222 , H03K19/0016 , Y02D10/128 , Y02D10/171 , Y02D50/20
摘要： The present invention provides a semiconductor device having a plurality of functional blocks and a select signal generation circuit for supplying a select signal to a functional block to be operated out of the plurality of blocks. A clock generation unit in the function clock, to which the select signal and a system clock are supplied, generates a control clock based on the system clock when the select signal is being supplied, and stops generation of the control clock when the select signal is not being supplied. When the select signal is not received, a dynamic circuit provided inside the functional block does not operate since the control clock is not supplied. When the select signal is received, the control clock is supplied and the dynamic circuit repeats precharge and discharge for each clock cycle, and performs operation to execute a predetermined function, and consumes power.
摘要翻译： 本发明提供一种具有多个功能块的半导体器件和用于向多个块中要被操作的功能块提供选择信号的选择信号生成电路。 在提供选择信号和系统时钟的功能时钟中的时钟产生单元在选择信号被提供时基于系统时钟产生控制时钟，并且当选择信号为 不提供 当未接收到选择信号时，由于不提供控制时钟，所以在功能块内设置的动态电路不工作。 当接收到选择信号时，提供控制时钟，并且动态电路在每个时钟周期重复预充电和放电，并执行执行预定功能的操作并消耗电力。
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10.发明申请POWER SOURCE NOISE MEASURING DEVICE, INTEGRATED CIRCUIT, AND SEMICONDUCTOR DEVICE 有权电源噪声测量装置，集成电路和半导体器件公开(公告)号：US20100052726A1
公开(公告)日：2010-03-04
申请号：US12614641
申请日：2009-11-09
IPC分类号： G01R31/26
CPC分类号： G01R31/31709 , G01R31/31708 , G01R31/31721
摘要： To accurately measure power source noise generated inside an integrated circuit, the power source noise measuring device comprises: a mutual inductor pair placed inside an integrated circuit, the mutual inductor pair including (i) a first inductor connected to between power source voltages of the integrated circuit and (ii) a second inductor arranged opposite the first inductor, the both ends of which second inductor are connected to external output terminals; and a power source noise measuring unit which measures power source noise of the integrated circuit on the basis of a voltage waveform output from the second inductor of said mutual inductor pair via the external output terminals.
摘要翻译： 为了精确地测量在集成电路内产生的电源噪声，电源噪声测量装置包括：放置在集成电路内的互感器对，所述互感器对包括（i）第一电感器，其连接到所述集成电路的电源电压之间 电路和（ii）与第一电感器相对布置的第二电感器，其第二电感器的两端连接到外部输出端子; 以及电源噪声测量单元，其基于经由所述外部输出端子从所述互感器对的第二电感器输出的电压波形来测量所述集成电路的电源噪声。
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