Vehicle door handle and vehicle door handle manufacturing method
    1.
    发明申请
    Vehicle door handle and vehicle door handle manufacturing method 有权
    车门把手和车门把手的制造方法

    公开(公告)号:US20070138812A1

    公开(公告)日:2007-06-21

    申请号:US11483153

    申请日:2006-07-10

    IPC分类号: E05B3/00

    摘要: A vehicle door handle includes a handle main body arranged at a predetermined position of an exterior of a vehicle door, and operated when the door is opened or closed; and a base member for attaching the handle main body to the vehicle door, wherein the handle main body is lever-shaped, and is supported by the base member to be rotatable in a predetermined range, the handle main body having one of both ends serving as a spindle and the other end serving as a free end, a hook protruding toward the base member in a longitudinal direction of the handle main body is formed on the free end of the handle main body, and a stopper abutting on the base member and restricting a rotation range of the handle main body is formed on a tip end of the hook, thereby setting an operated position and a non-operated position of the handle main body, and guide walls adjacent to both side surfaces of the stopper, respectively, at the non-operated position of the handle main body, are formed on the base member.

    摘要翻译: 车门把手包括布置在车门外部的预定位置处的手柄主体,并且当门打开或关闭时操作; 以及用于将手柄主体附接到车门的基座构件,其中手柄主体是杠杆形的,并且由基座构件支撑以能够在预定范围内旋转,手柄主体具有两端之一 作为主轴,另一端作为自由端,在把手主体的自由端上形成有沿着把手主体的长度方向向基部构件突出的钩,和抵靠在基座构件上的止动件 限制手柄主体的旋转范围形成在钩的尖端上,从而分别设置手柄主体的操作位置和非操作位置以及与止动件的两个侧表面相邻的导向壁, 在手柄主体的非操作位置处形成在基部构件上。

    Vehicle door handle and vehicle door handle manufacturing method
    2.
    发明授权
    Vehicle door handle and vehicle door handle manufacturing method 有权
    车门把手和车门把手的制造方法

    公开(公告)号:US07556296B2

    公开(公告)日:2009-07-07

    申请号:US11483153

    申请日:2006-07-10

    IPC分类号: E05C3/00 E05B1/00

    摘要: A vehicle door handle includes a handle main body and a base member for attaching the handle main body to the vehicle door. The handle main body is lever-shaped, and is supported by the base member to be rotatable in a predetermined range, the handle main body having one of both ends serving as a spindle and the other end serving as a free end, a hook protruding toward the base member in a longitudinal direction of the handle main body formed on the free end of the handle main body. A stopper abutting on the base member formed on a tip end of the hook, and guide walls adjacent to both side surfaces of the stopper, are formed on the base member.

    摘要翻译: 车门把手包括手柄主体和用于将手柄主体附接到车门的基座构件。 手柄主体是杠杆形的,并且由基座部件支撑以能够在预定范围内旋转,手柄主体的两端中的一端用作主轴,另一端用作自由端,钩突出 在手柄主体的自由端上形成在手柄主体的长度方向上的基座部件。 在基座部件上形成有抵接在形成于钩的前端的基部构件上的止动件和与止动件的两个侧面相邻的导向壁。

    Toner cartridge comprising a magnet assembly
    3.
    发明授权
    Toner cartridge comprising a magnet assembly 有权
    墨粉盒包括磁体组件

    公开(公告)号:US06343883B1

    公开(公告)日:2002-02-05

    申请号:US09492159

    申请日:2000-01-27

    IPC分类号: B41J3200

    摘要: A cartridge is attached to a printer that performs a printing operation only when the cartridge is a predetermined kind of the cartridge. The cartridge includes a first predetermined number of magnet holders provided on the cartridge and a second predetermined number of magnets each of which is received in a corresponding one of the magnet holders. A maximum value of the second predetermined number is equal to the first predetermined number. A combination of the magnet holders having the magnets therein indicates the kind of the cartridge. The image forming apparatus comprises a detector section and an identifying section. The detector has magnetic sensor elements each of which detects a magnetic flux of a corresponding one of the magnets. The identifying section compares reference data with a combination of outputs of the magnetic sensor elements so as to identify the kind of the cartridge.

    摘要翻译: 只有当墨盒是预定类型的墨盒时,墨盒连接到执行打印操作的打印机。 盒包括设置在盒上的第一预定数量的磁体保持器和第二预定数量的磁体,每个磁体容纳在相应的一个磁体保持器中。 第二预定数量的最大值等于第一预定数量。 其中具有磁体的磁体保持器的组合表示盒的种类。 图像形成装置包括检测器部分和识别部分。 检测器具有各自的磁性传感器元件,其检测相应的一个磁体的磁通量。 识别部分将参考数据与磁性传感器元件的输出的组合进行比较,以便识别盒的种类。

    Method for inspection, proces for making analytic piece, method for analysis, analyzer, process for producing soi wafer, and soi wafer
    4.
    发明申请
    Method for inspection, proces for making analytic piece, method for analysis, analyzer, process for producing soi wafer, and soi wafer 有权
    检验方法,分析方法,分析方法,分析仪,生产硅晶片的工艺以及硅片等

    公开(公告)号:US20060249479A1

    公开(公告)日:2006-11-09

    申请号:US10544178

    申请日:2003-10-16

    IPC分类号: G01L21/30

    CPC分类号: G01N23/225

    摘要: An inspection method is provided for accurate measurement of conductive materials as defects within a silicon oxide film base material embedded in a SOI wafer sample. In the method, the internal state of a sample 2 is inspected by measuring an conductive material within an insulating base material 11 formed upon the sample 2. Ions or electrons are irradiated upon the surface of the inspection region of the base material 11. A surface image is imaged with secondary electrons emitted from the surface 11a and the vicinity of the surface. The inspection region is etched and a surface image is imaged successively with secondary electrons emitted from a surface 11b and from its vicinity, renewed successively at the etched depth. The conductive material within the base material 11 is measured based upon the accumulated surface images.

    摘要翻译: 提供了一种检测方法,用于精确测量导电材料,作为嵌入在SOI晶片样品中的氧化硅膜基材中的缺陷。 在该方法中,通过测量在样品2上形成的绝缘基材11内的导电材料来检查样品2的内部状态。 离子或电子照射在基材11的检查区域的表面上。 利用从表面11a和表面附近发射的二次电子对表面图像进行成像。 蚀刻检查区域,并且从表面11b及其附近发射的二次电子连续成像表面图像,在蚀刻深度处连续更新。 基于积累的表面图像测量基材11内的导电材料。

    Inspection method, manufacturing method of piece for analysis, analysis method, analyzer, manufacturing method of SOI wafer, and SOI wafer
    5.
    发明授权
    Inspection method, manufacturing method of piece for analysis, analysis method, analyzer, manufacturing method of SOI wafer, and SOI wafer 有权
    分析方法,分析方法,分析仪,SOI晶片的制造方法,SOI晶片的检查方法,制造方法

    公开(公告)号:US07670857B2

    公开(公告)日:2010-03-02

    申请号:US10544178

    申请日:2003-10-16

    IPC分类号: H01J37/28 G01L21/30

    CPC分类号: G01N23/225

    摘要: An inspection method is provided for accurate measurement of conductive materials as defects within a silicon oxide film base material embedded in a SOI wafer sample. In the method, the internal state of a sample 2 is inspected by measuring an conductive material within an insulating base material 11 formed upon the sample 2. Ions or electrons are irradiated upon the surface of the inspection region of the base material 11. A surface image is imaged with secondary electrons emitted from the surface 11a and the vicinity of the surface. The inspection region is etched and a surface image is imaged successively with secondary electrons emitted from a surface 11b and from its vicinity, renewed successively at the etched depth. The conductive material within the base material 11 is measured based upon the accumulated surface images.

    摘要翻译: 提供了一种检测方法,用于精确测量导电材料,作为嵌入在SOI晶片样品中的氧化硅膜基材中的缺陷。 在该方法中,通过测量在样品2上形成的绝缘基材11内的导电材料来检查样品2的内部状态。离子或电子照射在基材11的检查区域的表面上。表面 从表面11a和表面附近发射的二次电子对图像进行成像。 蚀刻检查区域,并且从表面11b发射的二次电子和从其附近发射的二次电子依次成像,并以蚀刻深度连续更新。 基于积累的表面图像测量基材11内的导电材料。

    Production process for halogenated aromatic methylamine
    6.
    发明授权
    Production process for halogenated aromatic methylamine 失效
    卤代芳香胺的生产工艺

    公开(公告)号:US06960691B2

    公开(公告)日:2005-11-01

    申请号:US10344263

    申请日:2002-06-17

    摘要: The invention intends to provide means for producing halogenated aromatic methylamine useful as an intermediate in the production of agrochemical or medical preparations, by an industrially advantageous method.The process according to the present invention for producing halogenated aromatic methylamine is characterized by comprising hydrogen-reducing a halogenated aromatic nitrile represented by formula (1): (wherein X represents a chlorine atom or a fluorine atom, m represents an integer of 1 to 5, n represents an integer of 1 to 5, m+n≦6, and when n is 2 or more, each X may be the same or different) using a hydrogenating catalyst in the presence of an organic acid in a solvent to produce a halogenated aromatic methylamine represented by formula (2): (wherein X, m and n have the same meanings as defined above, and a represents an integer of 1 to m).

    摘要翻译: 本发明旨在通过工业上有利的方法提供生产用作生产农药或医药制剂中的中间体的卤代芳族甲胺的方法。 根据本发明的用于制备卤代芳族甲胺的方法的特征在于包含氢还原由式(1)表示的卤代芳族腈:其中X表示氯原子或氟原子,m表示1〜5的整数 ,n表示1〜5的整数,m + n <= 6,n为2以上时,各X可以相同或不同),使用氢化催化剂,在有机酸的存在下,在溶剂中反应生成 由式(2)表示的卤代芳族甲胺:(其中X,m和n具有与上述相同的含义,a表示1至m的整数)。

    Automatic focussing apparatus
    8.
    发明授权
    Automatic focussing apparatus 失效
    自动聚焦装置

    公开(公告)号:US4171885A

    公开(公告)日:1979-10-23

    申请号:US886354

    申请日:1978-03-14

    申请人: Hideyuki Kondo

    发明人: Hideyuki Kondo

    CPC分类号: G01C3/10 G02B7/305

    摘要: An automatic focussing apparatus is provided with a contrast sensor which senses the contrast of reflective light from an object being photographed and produces a signal indicative of the incapability of a focussing operation whenever the sensed result represents a low contrast.

    摘要翻译: 自动聚焦装置设置有对比度传感器,其感测来自被拍摄物体的反射光的对比度,并且每当感测到的结果表示低对比度时,产生指示聚焦操作的不适用的信号。

    METHOD FOR ANALYZING LOW MOLECULAR WEIGHT COMPOUND IN SAMPLE CONTAINING WATER-SOLUBLE POLYMER AND LOW MOLECULAR WEIGHT COMPOUND
    9.
    发明申请
    METHOD FOR ANALYZING LOW MOLECULAR WEIGHT COMPOUND IN SAMPLE CONTAINING WATER-SOLUBLE POLYMER AND LOW MOLECULAR WEIGHT COMPOUND 审中-公开
    用于分析含有水溶性聚合物和低分子量化合物的样品中低分子量重量化合物的方法

    公开(公告)号:US20090258428A1

    公开(公告)日:2009-10-15

    申请号:US11996524

    申请日:2006-07-25

    摘要: The invention relates to an analysis method which can conduct analysis on low molecular weight compound in a sample containing water-soluble polymer and low molecular weight compound under isocratic conditions without being affected by proteins or the like and in which water-soluble polymer and low molecular weight compound can be separated efficiently and to a column for such an analysis by high performance liquid chromatography, packed with a packing material comprising a crosslinked organic polymer compound obtained by polymerizing glycerin dimethacrylate at 90 mass % or more as starting material, having the exclusion limit molecular weight measured with pullulan of 30000 or less but 3000 or more and having a mass average particle diameter of 0.1 to 100 μm.

    摘要翻译: 本发明涉及一种分析方法,其可以在不受蛋白质等影响的情况下,在等度条件下对包含水溶性聚合物和低分子量化合物的样品中的低分子量化合物进行分析,并且其中水溶性聚合物和低分子量 可以通过高效液相色谱法分离高分子化合物,并用填充有包含以90质量%以上的甘油二甲基丙烯酸酯作为起始原料聚合得到的交联有机高分子化合物的填充材料进行分析,具有排除极限 用支链淀粉测定的分子量为30000以下,但为3000以上,质量平均粒径为0.1〜100μm。

    Semiconductor integrated circuit device provided with a capacitor
element having an oxidation-resist film as a dielectric and process for
manufacturing the same
    10.
    发明授权
    Semiconductor integrated circuit device provided with a capacitor element having an oxidation-resist film as a dielectric and process for manufacturing the same 失效
    设置有具有作为电介质的抗氧化膜的电容器元件的半导体集成电路器件及其制造方法

    公开(公告)号:US4914497A

    公开(公告)日:1990-04-03

    申请号:US287653

    申请日:1988-12-21

    申请人: Hideyuki Kondo

    发明人: Hideyuki Kondo

    CPC分类号: H01L29/94 H01L29/66181

    摘要: The semiconductor device provided with a MIS capacitor in which an oxidation-resist film to be used for forming a field oxide film partly buried in a semiconductor by means of the selective oxidation technique is employed as a dielectric. A peripheral edge portion of the oxidation-resist film is turned up at a bird's-beak-shaped edge portion of the field oxide film, so that a gap space is produced between the peripheral edge portion of the oxidation-resist film and the bird's-beak-shaped edge portion of the field oxide film. An insulator layer is formed at the peripheral edge portion of the oxidation-resist film. An upper conductor layer of the MIS capacitor provided on the oxidation-resist film is elongated on this insulator layer.

    摘要翻译: 设置有用于通过选择性氧化技术部分地埋入半导体中的用于形成场氧化膜的抗氧化膜的MIS电容器的半导体器件被用作电介质。 氧化抗蚀剂膜的外围边缘部分在场氧化膜的鸟嘴状边缘部分被翻转,使得在氧化抗蚀剂膜的周缘部分和鸟瞰形状物之间产生间隙, 尖状的氧化膜的边缘部分。 在氧化抗蚀剂膜的周缘部形成有绝缘体层。 设置在抗氧化膜上的MIS电容器的上导体层在该绝缘体层上是细长的。