Regulator Circuit and RFID Tag Including the Same
    4.
    发明申请
    Regulator Circuit and RFID Tag Including the Same 有权
    调节器电路和包括它的RFID标签

    公开(公告)号:US20100181985A1

    公开(公告)日:2010-07-22

    申请号:US12686579

    申请日:2010-01-13

    IPC分类号: G05F3/16

    CPC分类号: G05F3/16 G05F1/56 G05F3/242

    摘要: One object of the present invention is to provide a regulator circuit with an improved noise margin. In a regulator circuit including a bias circuit generating a reference voltage on the basis of the potential difference between a first power supply terminal and a second power supply terminal, and a voltage regulator outputting a potential to an output terminal on the basis of a reference potential input from the bias circuit, a bypass capacitor is provided between a power supply terminal and a node to which a gate of a transistor included in the bias circuit is connected.

    摘要翻译: 本发明的一个目的是提供一种具有改善的噪声容限的调节器电路。 在包括基于第一电源端子和第二电源端子之间的电位差产生参考电压的偏置电路的调节器电路中,以及基于参考电位向输出端子输出电位的电压调节器 在偏置电路的输入端,在电源端子与偏置电路中包含的晶体管的栅极连接的节点之间设置有旁路电容器。

    Semiconductor device
    5.
    发明授权
    Semiconductor device 有权
    半导体器件

    公开(公告)号:US08368209B2

    公开(公告)日:2013-02-05

    申请号:US12883378

    申请日:2010-09-16

    IPC分类号: H01L23/34

    CPC分类号: G06K19/07749 G06K19/07735

    摘要: The problem of damage on an antenna or a circuit (electrostatic breakdown) due to discharge of electric charge accumulated in an insulator is solved; and the problem of NAKANUKE failure is solved. A pair of conductive layers, a pair of insulators provided between the pair of conductive layers, and a chip which is provided between the pair of insulators and includes an antenna, an analog circuit, and a digital circuit are provided, in which an opening is provided for at least one of the pair of conductive layers, and the opening is provided at a position which overlaps at least the analog circuit.

    摘要翻译: 解决了由于绝缘体中累积的电荷的放电导致的天线或电路损坏(静电击穿)的问题; 并解决了NAKANUKE故障的问题。 一对导电层,一对导电层之间设置的绝缘体,以及设置在该对绝缘体之间的芯片,包括天线,模拟电路和数字电路,其中开口为 设置在所述一对导电层中的至少一个上,并且所述开口设置在至少与所述模拟电路重叠的位置。

    Element substrate, inspecting method, and manufacturing method of semiconductor device
    6.
    发明授权
    Element substrate, inspecting method, and manufacturing method of semiconductor device 有权
    元件基板,检查方法和半导体器件的制造方法

    公开(公告)号:US07821279B2

    公开(公告)日:2010-10-26

    申请号:US11817435

    申请日:2006-03-02

    IPC分类号: G01R31/26

    摘要: A substrate including a semiconductor layer, where characteristics of an element can be evaluated with high reliability, and an evaluating method thereof are provided. A substrate including a semiconductor layer of the invention has a closed-loop circuit in which an antenna coil and a semiconductor element are connected in series, and a surface of an area over which the circuit is formed is covered with an insulating film. By using such a circuit, a contactless inspection can be carried out. Further, a ring oscillator can be substituted for the closed-loop circuit.

    摘要翻译: 提供了包括可以以高可靠性评估元件的特性的半导体层的基板及其评价方法。 包括本发明的半导体层的衬底具有一个闭环电路,其中天线线圈和半导体元件串联连接,并且形成有电路的区域的表面被绝缘膜覆盖。 通过使用这样的电路,可以进行非接触检查。 此外,环形振荡器可以代替闭环电路。

    Element Substrate, Inspecting Method, and Manufacturing Method of Semiconductor Device
    7.
    发明申请
    Element Substrate, Inspecting Method, and Manufacturing Method of Semiconductor Device 审中-公开
    元件基板,检测方法和半导体器件的制造方法

    公开(公告)号:US20120200312A1

    公开(公告)日:2012-08-09

    申请号:US13446614

    申请日:2012-04-13

    IPC分类号: G01R31/26

    摘要: A substrate including a semiconductor layer, where characteristics of an element can be evaluated with high reliability, and an evaluating method thereof are provided. A substrate including a semiconductor layer of the invention has a closed-loop circuit in which an antenna coil and a semiconductor element are connected in series, and a surface of an area over which the circuit is formed is covered with an insulating film. By using such a circuit, a contactless inspection can be carried out. Further, a ring oscillator can be substituted for the closed-loop circuit.

    摘要翻译: 提供了包括可以以高可靠性评估元件的特性的半导体层的基板及其评价方法。 包括本发明的半导体层的衬底具有一个闭环电路,其中天线线圈和半导体元件串联连接,并且形成有电路的区域的表面被绝缘膜覆盖。 通过使用这样的电路,可以进行非接触检查。 此外,环形振荡器可以代替闭环电路。

    Element substrate, inspecting method, and manufacturing method of semiconductor device
    8.
    发明授权
    Element substrate, inspecting method, and manufacturing method of semiconductor device 有权
    元件基板,检查方法和半导体器件的制造方法

    公开(公告)号:US09188631B2

    公开(公告)日:2015-11-17

    申请号:US13446614

    申请日:2012-04-13

    摘要: A substrate including a semiconductor layer, where characteristics of an element can be evaluated with high reliability, and an evaluating method thereof are provided. A substrate including a semiconductor layer of the invention has a closed-loop circuit in which an antenna coil and a semiconductor element are connected in series, and a surface of an area over which the circuit is formed is covered with an insulating film. By using such a circuit, a contactless inspection can be carried out. Further, a ring oscillator can be substituted for the closed-loop circuit.

    摘要翻译: 提供了包括可以以高可靠性评估元件的特性的半导体层的基板及其评价方法。 包括本发明的半导体层的衬底具有一个闭环电路,其中天线线圈和半导体元件串联连接,并且形成有电路的区域的表面被绝缘膜覆盖。 通过使用这样的电路,可以进行非接触检查。 此外,环形振荡器可以代替闭环电路。

    Element Substrate, Inspecting Method, and Manufacturing Method of Semiconductor Device
    9.
    发明申请
    Element Substrate, Inspecting Method, and Manufacturing Method of Semiconductor Device 有权
    元件基板,检测方法和半导体器件的制造方法

    公开(公告)号:US20110089955A1

    公开(公告)日:2011-04-21

    申请号:US12910426

    申请日:2010-10-22

    IPC分类号: G01R27/04

    摘要: A substrate including a semiconductor layer, where characteristics of an element can be evaluated with high reliability, and an evaluating method thereof are provided. A substrate including a semiconductor layer of the invention has a closed-loop circuit in which an antenna coil and a semiconductor element are connected in series, and a surface of an area over which the circuit is formed is covered with an insulating film. By using such a circuit, a contactless inspection can be carried out. Further, a ring oscillator can be substituted for the closed-loop circuit.

    摘要翻译: 提供了包括可以以高可靠性评估元件的特性的半导体层的基板及其评价方法。 包括本发明的半导体层的衬底具有一个闭环电路,其中天线线圈和半导体元件串联连接,并且形成有电路的区域的表面被绝缘膜覆盖。 通过使用这样的电路,可以进行非接触检查。 此外,环形振荡器可以代替闭环电路。

    Element substrate, inspecting method, and manufacturing method of semiconductor device
    10.
    发明授权
    Element substrate, inspecting method, and manufacturing method of semiconductor device 有权
    元件基板,检查方法和半导体器件的制造方法

    公开(公告)号:US08159257B2

    公开(公告)日:2012-04-17

    申请号:US12910426

    申请日:2010-10-22

    IPC分类号: G01R31/26

    摘要: A substrate including a semiconductor layer, where characteristics of an element can be evaluated with high reliability, and an evaluating method thereof are provided. A substrate including a semiconductor layer of the invention has a closed-loop circuit in which an antenna coil and a semiconductor element are connected in series, and a surface of an area over which the circuit is formed is covered with an insulating film. By using such a circuit, a contactless inspection can be carried out. Further, a ring oscillator can be substituted for the closed-loop circuit.

    摘要翻译: 提供了包括可以以高可靠性评估元件的特性的半导体层的基板及其评价方法。 包括本发明的半导体层的衬底具有一个闭环电路,其中天线线圈和半导体元件串联连接,并且形成有电路的区域的表面被绝缘膜覆盖。 通过使用这样的电路,可以进行非接触检查。 此外,环形振荡器可以代替闭环电路。