AUTOMATIC ANALYZER
    1.
    发明公开
    AUTOMATIC ANALYZER 审中-公开

    公开(公告)号:US20240361346A1

    公开(公告)日:2024-10-31

    申请号:US18556160

    申请日:2022-02-02

    摘要: An automatic analyzer is provided that is capable of quickly responding when an abnormal process occurs, accurately grasping an abnormal state, and reducing frequencies of early abnormality diagnosis and component adjustment or replacement of the automatic analyzer. The automatic analyzer compares data output information with reference data output information, applies a data alarm to an item of the data output information determined to be in an abnormal state, compares system output information with reference system output information, applies a data alarm to an item of a data output information determined to be in an abnormal state, and executes a predictive diagnosis of a failure state of the automatic analyzer based on a temporal change of the data output information obtained by the analyzer using an internal standard substance as a sample and a temporal change of the system output information.

    Mass Spectrometer
    2.
    发明申请

    公开(公告)号:US20230136178A1

    公开(公告)日:2023-05-04

    申请号:US17908147

    申请日:2021-02-10

    IPC分类号: H01J49/06

    摘要: To provide a mass spectrometer for higher ion permeation efficiency. In a mass spectrometer to transfer ions generated in an ion source 101 to a detector 106 through a vacuum chamber equipped with electrodes, the vacuum chamber includes a first vacuum chamber 107 and a second vacuum chamber 108 communicated by a pore 104 and an air flow containing ions introduced from the ion source 101 into the first vacuum chamber 107 is separated to an air flow 704 and an ion flow 703 by an ion guide 103 in the first vacuum chamber 107. The first vacuum chamber 107 has a current plate 113 to reduce mixing of the separated air flow 704 and ion flow 703.

    MASS SPECTROMETRY DEVICE AND METHOD FOR CONTROLLING SAME

    公开(公告)号:US20240063010A1

    公开(公告)日:2024-02-22

    申请号:US18270878

    申请日:2022-01-17

    IPC分类号: H01J49/02 H01J49/42

    CPC分类号: H01J49/022 H01J49/4215

    摘要: A mass spectrometry device can reduce a deviation in a mass axis due to the generation of heat from an AC voltage control circuit; and a method for controlling the mass spectrometry device. The mass spectrometry device has a quadrupole electrode, to which a controlled AC voltage is applied, and uses the quadrupole electrode as a mass filter. Before measurement, the mass spectrometry device applies an AC voltage of a prescribed amplitude V1 to the multipole electrode for a prescribed time T1, and a heating value J1 that is generated when the AC voltage of the prescribed amplitude V1 is applied to the multipole electrode for the prescribed time T1 is equivalent to a heating value that is generated when the AC voltage of the amplitude that is applied during the measurement is applied until a thermally steady state is reached (see FIG. 3A).

    Method for Controlling Mass Spectrometer
    5.
    发明公开

    公开(公告)号:US20240006174A1

    公开(公告)日:2024-01-04

    申请号:US18037292

    申请日:2021-12-17

    IPC分类号: H01J49/42

    CPC分类号: H01J49/4215

    摘要: A method for controlling a mass spectrometer capable of identifying an abnormal location in a device is provided. A method for controlling a mass spectrometer including an ion source that ionizes a compound in a sample, a mass spectrometry unit that separates ions based on a mass-to-charge ratio, and a plurality of electrodes that form an electric field that transports ions generated by the ion source to the mass spectrometry unit includes ionizing the sample by the ion source, detecting, based on a change in ion permeability over time, ions accumulated in the electrodes and quadrupole mass filters forming the mass spectrometry unit, and detecting a change in ionization efficiency of the ion source based on a change in an amount of ions with respect to a gas flow rate for the ion source or a voltage of the ion source.