公开(公告)号：US07064647B2

公开(公告)日：2006-06-20

申请号：US10873698

申请日：2004-06-22

申请人： Howard Ross Edmunds ,  Brian Matthew Alken ,  Andrew Phillip ,  Christopher McMenamin ,  Christopher T. Moore ,  John Earl Bittner ,  Stephen Daniel Nash ,  Michael L. Miller

发明人： Howard Ross Edmunds ,  Brian Matthew Alken ,  Andrew Phillip ,  Christopher McMenamin ,  Christopher T. Moore ,  John Earl Bittner ,  Stephen Daniel Nash ,  Michael L. Miller

IPC分类号： H01F27/28

CPC分类号： H01F37/005 ,  H01F17/02 ,  H01F27/2847

摘要： A method and apparatus for an air core reactor including a plurality of straight members and a plurality of offset members, the plurality of straight and offset members are interconnected to form an orthogonal spiral having an air core therethrough.

摘要翻译： 一种用于空心反应堆的方法和装置，包括多个直的构件和多个偏移构件，所述多个直的和偏移构件相互连接以形成具有穿过其中的空心的正交螺旋。

公开(公告)号：US20140272764A1

公开(公告)日：2014-09-18

申请号：US13830360

申请日：2013-03-14

申请人： Michael L. Miller ,  Walt Froloff

发明人： Michael L. Miller ,  Walt Froloff

IPC分类号： A61B1/06 ,  A61B5/00 ,  A61B1/00 ,  A61B19/00 ,  A61B1/24 ,  A61B1/05

CPC分类号： A61B1/0684 ,  A61B1/00009 ,  A61B1/00016 ,  A61B1/0002 ,  A61B1/00193 ,  A61B1/051 ,  A61B1/0638 ,  A61B1/24 ,  A61B5/0035 ,  A61B5/0066 ,  A61B5/0088 ,  A61B6/14 ,  A61B6/5247 ,  A61B2576/00

摘要： Spatial 3D stereoscopic video is generated with a dual camera subassembly in a hand held device. The 3D Left-Right Multiplexed Spatial Stereoscopic video stream is wirelessly coupled to a processing system for simultaneous visualization comparison with intraoral cavity digital dental impression 3D CAD formatted files, Cone Beam Panoramic Computed Tomography images, Optical Coherence Tomography planar images and Panoramic X-ray image digital files for Stereoscopic visualization on stereoscopic displays and occluding viewing glasses.

摘要翻译： 利用手持设备中的双相机子组件生成空间3D立体视频。 3D左右复用空间立体视频流无线耦合到处理系统，用于与口腔内数字牙科印象3D CAD格式文件，锥形全景计算机断层摄影图像，光学相干断层扫描平面图像和全景X射线图像的同时可视化比较 用于立体显示和闭塞观看眼镜的立体可视化的数字文件。

公开(公告)号：US08539660B2

公开(公告)日：2013-09-24

申请号：US13034897

申请日：2011-02-25

申请人： Wayne D. Melvin ,  Michael L. Miller ,  Jamshid Rejai ,  Van T. Pham ,  Joseph S. Konrad ,  Wojtek S. Drewnowski

发明人： Wayne D. Melvin ,  Michael L. Miller ,  Jamshid Rejai ,  Van T. Pham ,  Joseph S. Konrad ,  Wojtek S. Drewnowski

IPC分类号： B23P17/00

CPC分类号： A61F13/266 ,  A61F13/2082 ,  B31F1/10 ,  Y10T29/49801 ,  Y10T29/49826 ,  Y10T29/49883 ,  Y10T29/49888

摘要： A tampon applicator barrel including a cardboard tube having a first end and a second end and at least one gripping structure defined from the cardboard tube proximate the second end is provided. The cardboard tube has a wall thickness of between about 0.015 and about 0.020 inches, while the gripping structure has a height of up to about 0.035 inches.

摘要翻译： 提供了一种棉条施用器筒，其包括具有第一端和第二端的纸板管和至少一个从靠近第二端的纸板管限定的夹持结构。 纸板管具有约0.015至约0.020英寸的壁厚，而夹持结构具有高达约0.035英寸的高度。

公开(公告)号：US07798986B2

公开(公告)日：2010-09-21

申请号：US10870276

申请日：2004-06-17

申请人： Wayne D. Melvin ,  Michael L. Miller ,  Jamshid Rejai ,  Van T. Pham ,  Joseph S. Konrad ,  Wojrek S. Drewnowski

发明人： Wayne D. Melvin ,  Michael L. Miller ,  Jamshid Rejai ,  Van T. Pham ,  Joseph S. Konrad ,  Wojrek S. Drewnowski

IPC分类号： A61F13/28 ,  A61F13/26 ,  A61F13/20

CPC分类号： A61F13/266 ,  A61F13/2082 ,  B31F1/10 ,  Y10T29/49801 ,  Y10T29/49826 ,  Y10T29/49883 ,  Y10T29/49888

摘要： A tampon applicator barrel including a cardboard tube having a first end and a second end and at least one gripping structure defined from the cardboard tube proximate the second end is provided. The cardboard tube has a wall thickness of between about 0.015 and about 0.020 inches, while the gripping structure has a height of up to about 0.035 inches.

摘要翻译： 提供了一种棉条施用器筒，其包括具有第一端和第二端的纸板管和至少一个从靠近第二端的纸板管限定的夹持结构。 纸板管具有约0.015至约0.020英寸的壁厚，而夹持结构具有高达约0.035英寸的高度。

公开(公告)号：US07242858B1

公开(公告)日：2007-07-10

申请号：US11374620

申请日：2006-03-13

申请人： Richard E. Welch ,  Michael L. Miller

发明人： Richard E. Welch ,  Michael L. Miller

IPC分类号： F24H1/20

CPC分类号： F24H9/2021

摘要： An external reset device that is operable in combination with an electric water heater is disclosed. The external reset device is attached to an element cover that is mounted to the water heater and conceals the water heater's control device, such as a manual reset thermostat. The external reset device comprises a bushing member and a key member attached to the element cover. The bushing member is aligned with a reset button on the control device. The key member is adapted for insertion into the bushing member to depress the reset button and close a switch, enabling the heating elements of the electric water heater to power ON and heat the water within the electric water heater.

摘要翻译： 公开了一种与电热水器组合可操作的外部复位装置。 外部复位装置安装在安装在热水器上的元件盖上，并隐藏热水器的控制装置，例如手动复位恒温器。 外部复位装置包括衬套构件和附接到元件盖的键构件。 衬套构件与控制装置上的复位按钮对准。 键构件适于插入衬套构件中以按压复位按钮并闭合开关，使得电热水器的加热元件能够接通并加热电热水器内的水。

公开(公告)号：US07103439B1

公开(公告)日：2006-09-05

申请号：US09824301

申请日：2001-04-02

申请人： Christopher A. Bode ,  Alexander J. Pasadyn ,  Anthony J. Toprac ,  Joyce S. Oey Hewett ,  Anastasia Oshelski Peterson ,  Thomas J. Sonderman ,  Michael L. Miller

发明人： Christopher A. Bode ,  Alexander J. Pasadyn ,  Anthony J. Toprac ,  Joyce S. Oey Hewett ,  Anastasia Oshelski Peterson ,  Thomas J. Sonderman ,  Michael L. Miller

IPC分类号： G06F19/00

CPC分类号： G05B19/41865 ,  Y02P90/20 ,  Y02P90/86

摘要： A method for initializing process controllers based on tool event data includes providing a tool having a process controller adapted to employ a control model to control an operating recipe of the tool; receiving a tool event notification; and initializing the control model in response to receiving the tool event notification. A manufacturing system includes a tool and a process controller. The tool is adapted to process wafers in accordance with an operating recipe. The process controller is adapted to employ a control model to control the operating recipe in accordance with a control algorithm. The process controller is further adapted to receive a tool event notification and initialize the control model in response to receiving the tool event notification.

摘要翻译： 用于基于工具事件数据初始化过程控制器的方法包括提供具有适于使用控制模型来控制工具的操作配方的过程控制器的工具; 接收工具事件通知; 并且响应于接收到工具事件通知来初始化控制模型。 制造系统包括工具和过程控制器。 该工具适于根据操作配方处理晶片。 过程控制器适于采用控制模型来根据控制算法来控制操作配方。 过程控制器还适于接收工具事件通知并响应于接收到工具事件通知而初始化控制模型。

公开(公告)号：US06925347B1

公开(公告)日：2005-08-02

申请号：US10223174

申请日：2002-08-19

申请人： Michael L. Miller ,  Thomas J. Sonderman ,  Alexander J. Pasadyn ,  Richard J. Markle ,  Brian K. Cusson ,  Patrick M. Cowan ,  Timothy L. Jackson ,  Naomi M. Jenkins

发明人： Michael L. Miller ,  Thomas J. Sonderman ,  Alexander J. Pasadyn ,  Richard J. Markle ,  Brian K. Cusson ,  Patrick M. Cowan ,  Timothy L. Jackson ,  Naomi M. Jenkins

IPC分类号： G05B19/418 ,  G06F19/00

CPC分类号： G05B19/41875 ,  G05B2219/45031 ,  Y02P90/22

摘要： A method and apparatus is provided for a process control based on an estimated process result. The method comprises processing a workpiece using a processing tool, receiving trace data associated with the processing of the workpiece from the processing tool and estimating at least one process result of the workpiece based on at least a portion of the received trace data. The method further comprises adjusting processing of a next workpiece based on the estimated at least one process result.

摘要翻译： 基于估计的处理结果提供了用于过程控制的方法和装置。 该方法包括使用处理工具处理工件，从处理工具接收与工件的处理相关联的跟踪数据，并基于所接收的跟踪数据的至少一部分估计工件的至少一个处理结果。 该方法还包括基于估计的至少一个处理结果来调整下一个工件的处理。

公开(公告)号：US06901340B1

公开(公告)日：2005-05-31

申请号：US09824348

申请日：2001-04-02

申请人： Alexander J. Pasadyn ,  Joyce S. Oey Hewett ,  Christopher A. Bode ,  Anthony J. Toprac ,  Anastasia Oshelski Peterson ,  Thomas J. Sonderman ,  Michael L. Miller

发明人： Alexander J. Pasadyn ,  Joyce S. Oey Hewett ,  Christopher A. Bode ,  Anthony J. Toprac ,  Anastasia Oshelski Peterson ,  Thomas J. Sonderman ,  Michael L. Miller

IPC分类号： G05B23/02 ,  H01L21/00 ,  G01N37/00 ,  G06F19/00

CPC分类号： G05B23/0275 ,  G05B2219/1112 ,  G05B2219/34477 ,  G05B2223/02 ,  H01L21/67276 ,  Y02P90/86

摘要： A method for distinguishing between sources of process variation includes processing a plurality of manufactured items in a process flow; storing a set of production environment data associated with each of the manufactured items; identifying manufactured items associated with a process drift; generating a plurality of characteristic threads based on the production environment data; comparing the characteristic threads for at least those manufactured items associated with the process drift; and determining at least one potential cause for the process drift based on the comparison of the characteristic threads. A manufacturing system for distinguishing between sources of process variation is also provided. The manufacturing system includes a plurality of tools for processing manufactured items in a process flow, a database server, and a drift monitor.

摘要翻译： 用于区分过程变化源的方法包括在处理流程中处理多个制造项目; 存储与每个所制造的项目相关联的一组生产环境数据; 识别与过程漂移相关联的制品; 基于生产环境数据生成多个特征线程; 比较至少那些与过程漂移有关的制造物品的特征线; 以及基于所述特征线程的比较来确定所述过程漂移的至少一个潜在原因。 还提供了用于区分过程变化源的制造系统。 制造系统包括用于处理流程中的制造物品的多个工具，数据库服务器和漂移监视器。

公开(公告)号：US06643557B1

公开(公告)日：2003-11-04

申请号：US09591038

申请日：2000-06-09

申请人： Michael L. Miller ,  Anthony J. Toprac

发明人： Michael L. Miller ,  Anthony J. Toprac

IPC分类号： G06F1900

CPC分类号： H01L22/26

摘要： The present invention provides for a method and an apparatus for using scatterometry to perform feedback and feed-forward control. A processing run of semiconductor devices is performed. Metrology data from the processed semiconductor devices is acquired. Error data is acquired by analyzing the acquired metrology data. A determination is made whether the error data merits modification to the processing of semiconductor devices. A feedback modification of the processing of semiconductor devices is performed in response to the determination that the error data merits modification to the processing of semiconductor devices. A feed-forward modification of the processing of the semiconductor devices is performed in response to the determination that the error data merits modification to the processing of semiconductor devices.

摘要翻译： 本发明提供了一种使用散射测量来执行反馈和前馈控制的方法和装置。 执行半导体器件的处理运行。 获取来自处理的半导体器件的计量数据。 通过分析获取的测量数据获取误差数据。 确定误差数据是否优于对半导体器件的处理的修改。 响应于确定误差数据优于对半导体器件的处理的修改，执行半导体器件的处理的反馈修改。 响应于确定误差数据优于对半导体器件的处理的修改，执行半导体器件的处理的前馈修改。

公开(公告)号：US06449524B1

公开(公告)日：2002-09-10

申请号：US09477465

申请日：2000-01-04

申请人： Michael L. Miller ,  Thomas J. Sonderman

发明人： Michael L. Miller ,  Thomas J. Sonderman

IPC分类号： G06F1900

CPC分类号： H01L22/20

摘要： The present invention provides for a method and an apparatus for using equipment state data for controlling a manufacturing process. Initial equipment state data is acquired. At least one semiconductor device is processed using the initial equipment state data is performed. Equipment and wafer state data processing is performed using data from the processing of the semiconductor device and the initial equipment state data. A determination is made whether at least one control input parameter used for processing of the semiconductor device is to be modified in response to performing the equipment and wafer state data processing. The control input parameter is modified in response to determining that at least one the control input parameter is to be modified.

摘要翻译： 本发明提供一种使用设备状态数据来控制制造过程的方法和装置。 初始设备状态数据被获取。 使用初始设备处理至少一个半导体器件状态数据。 使用来自半导体器件的处理和初始设备状态数据的数据进行设备和晶片状态数据处理。 确定是否要响应于执行设备和晶片状态数据处理来修改用于半导体器件的处理的至少一个控制输入参数。 响应于确定至少一个控制输入参数被修改而修改控制输入参数。