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14 条记录 (耗时 0.015 秒)

    Metal sampling method and system for non-hydrolyzable gases
    1.
    发明授权
    Metal sampling method and system for non-hydrolyzable gases 失效
    非水解气体的金属取样方法和系统

    公开(公告)号：US5618996A

    公开(公告)日：1997-04-08

    申请号：US609836

    申请日：1996-03-01

    申请人： Hwa-Chi Wang ,  Richard J. Udischas

    发明人： Hwa-Chi Wang ,  Richard J. Udischas

    IPC分类号： G01N1/22

    CPC分类号： G01N1/2205 ,  G01N2001/2223 ,  G01N2001/2282

    摘要： Provided is a portable system useful for sampling both particulate and vapor phase metallic impurities from gases that cannot by hydrolyzed. The system comprises valves for introducing and controlling the exhaust of the gas to be sampled from the system. The metallic impurities are entrapped on filters, with one filter being operated at ambient temperature to remove particulate metallic impurities, and with another filter being operated at a temperature below ambient in order to remove vapor phase metallic impurities. In operating the system, the system is first back-filled to create a pressure equilibrium across the valve which introduces the gas to the first filter means. The flow of gas through the entire sampling system is controlled by means of a critical orifice located between the filters and the valve for controlling exhaust of the gas from the system. The entire system is portable and allows for transport of the system with its filters to a laboratory in order to permit the most sophisticated and effective analysis of the metallic impurities in the filters under controlled laboratory conditions.

    摘要翻译： 提供了一种便携式系统，其用于从不能水解的气体中采集颗粒和气相金属杂质。 该系统包括用于引入和控制从系统取样的气体的排气的阀。 金属杂质被截留在过滤器上，一个过滤器在环境温度下操作以除去颗粒状金属杂质，另一个过滤器在低于环境温度下操作，以除去气相金属杂质。 在操作系统时，系统首先被填充以在阀门上产生压力平衡，该压力平衡将气体引入到第一过滤器装置。 通过整个采样系统的气体流通过位于过滤器和阀之间的临界孔来控制，用于控制来自系统的气体的排气。 整个系统是便携式的，并允许将其过滤器的系统运输到实验室，以便在受控实验室条件下允许对过滤器中的金属杂质进行最复杂和有效的分析。

    Metal sampling method and system for non-hydrolyzable gases
    5.
    发明授权
    Metal sampling method and system for non-hydrolyzable gases 失效
    非水解气体的金属取样方法和系统

    公开(公告)号：US5814741A

    公开(公告)日：1998-09-29

    申请号：US709875

    申请日：1996-09-09

    申请人： Hwa-Chi Wang ,  Richard J. Udischas

    发明人： Hwa-Chi Wang ,  Richard J. Udischas

    IPC分类号： G01N1/00 ,  G01N1/02 ,  G01N1/22 ,  G01N21/31

    CPC分类号： G01N1/2205 ,  G01N2001/2223 ,  G01N2001/2282

    摘要： Provided is a portable system useful for sampling both particulate and vapor phase metallic impurities from gases that cannot by hydrolyzed. The system comprises a valve for introducing and controlling the exhaust of the gas to be sampled from the system. The metallic impurities are entrapped on a filter, with one filter being operated at ambient temperature to remove particulate metallic impurities, and with another filter being operated at a temperature below ambient in order to remove vapor phase metallic impurities. In operating the system, the system is first back-filled to create a pressure equilibrium across the valve which introduces the gas to the first filter. The flow of gas through the entire sampling system is controlled by means of a critical orifice located between the filter and the valve for controlling exhaust of the gas from the system. The entire system is portable and allows for transport of the system with its filters to a laboratory in order to permit the most sophisticated and effective analysis of the metallic impurities in the filters under controlled laboratory conditions.

    摘要翻译： 提供了一种便携式系统，其用于从不能水解的气体中采集颗粒和气相金属杂质。 该系统包括用于引入和控制从系统取样的气体的排气的阀。 金属杂质被夹带在过滤器上，一个过滤器在环境温度下操作以除去颗粒状金属杂质，另一个过滤器在低于环境温度下操作，以除去气相金属杂质。 在操作系统时，系统首先被填充以在阀上产生压力平衡，该压力平衡将气体引入第一过滤器。 通过整个采样系统的气体流动通过位于过滤器和阀之间的临界孔来控制，用于控制来自系统的气体的排出。 整个系统是便携式的，并允许将其过滤器的系统运输到实验室，以便在受控实验室条件下允许对过滤器中的金属杂质进行最复杂和有效的分析。

    Method to analyze particle contaminants in compressed gases
    8.
    发明授权
    Method to analyze particle contaminants in compressed gases 失效
    分析压缩气体中颗粒污染物的方法

    公开(公告)号：US5665902A

    公开(公告)日：1997-09-09

    申请号：US240485

    申请日：1994-05-10

    申请人： Hwa-chi Wang ,  Richard J. Udischas

    发明人： Hwa-chi Wang ,  Richard J. Udischas

    IPC分类号： G01N1/22 ,  G01N7/00 ,  G01N15/06 ,  G01N1/00

    CPC分类号： G01N15/06 ,  G01N1/2226 ,  G01N2001/2238

    摘要： A system and a method for analyzing impurities in compressed gas, a method for controlling the particle growth in the monitored gas and a method for determining the optimum monitoring temperature for an individual gas are disclosed. The system includes a source of compressed gas, a sensor for measuring particle impurity within the gas, a temperature controller for controlling the temperature of the gas prior to said gas entering the sensor, with the temperature being controlled to eliminate particle formation from molecular clustering and condensation, and a pressure balancer.

    摘要翻译： 公开了一种用于分析压缩气体中的杂质的系统和方法，用于控制监测气体中的颗粒生长的方法和用于确定单独气体的最佳监测温度的方法。 该系统包括压缩气体源，用于测量气体中的颗粒杂质的传感器，用于在所述气体进入传感器之前控制气体的温度的温度控制器，其中控制温度以消除分子聚集的颗粒形成， 冷凝和压力平衡器。