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    Novel red fluorescent powder
    1.
    发明申请
    Novel red fluorescent powder 审中-公开
    新型红色荧光粉

    公开(公告)号：US20070090327A1

    公开(公告)日：2007-04-26

    申请号：US11453041

    申请日：2006-06-15

    申请人： I-Min Chan ,  Sheng-Bang Huang ,  Chuang-Bang Chiu ,  Teng-Ming Chen ,  Yuan-Cheng Chin

    发明人： I-Min Chan ,  Sheng-Bang Huang ,  Chuang-Bang Chiu ,  Teng-Ming Chen ,  Yuan-Cheng Chin

    IPC分类号： C09K11/68 ,  H01J1/62

    CPC分类号： C09K11/7736 ,  H01J1/63 ,  Y02B20/181

    摘要： A novel red fluorescent powder of the following formula (I): AB(MO4)2  (I) wherein A is independently Li+, Na+, K+, Rb+, Cs+, or Ag+; B is Europium of trivalent rare-earth ion (Eu3+); and M is molybdenum (Mo) or tungsten(W). The red fluorescent powder prepared by a solid-state method is used in light emitted diodes (LED), particular in white light LEDs. It has strong absorption in the near-UV wavelength of 360 nm to 420 nm, improved luminescence intensity than commercially available, high color purity, luminescent efficiency, and excellent chemical stability.

    摘要翻译： 一种新型的下式（I）的红色荧光粉：<？in-line-formula description =“In-line Formulas”end =“lead”？> AB（MO （I）<？in-line-formula description =“In-line Formulas”end =“tail”？>其中A独立地为Li +，Na + / SUP>，K + +，/ - ， - - - - - - - B是三价稀土离子（Eu 3+ +）的铕。 M是钼（Mo）或钨（W）。 通过固态方法制备的红色荧光粉末用于光发射二极管（LED），特别是在白光LED中。 它在360nm至420nm的近紫外波长下具有强吸收，改善的发光强度比市售，高色纯度，发光效率和优异的化学稳定性。

    Method and apparatus for fabricating a crystal fiber by utilizing at least two external electric fields
    2.
    发明申请
    Method and apparatus for fabricating a crystal fiber by utilizing at least two external electric fields 失效
    利用至少两个外部电场来制造晶体光纤的方法和装置

    公开(公告)号：US20060110126A1

    公开(公告)日：2006-05-25

    申请号：US11106029

    申请日：2005-04-14

    申请人： Sheng-Lung Huang ,  Hsiao-Wen Lee ,  Chia-Chang Kuo ,  Sheng-Bang Huang ,  Tsai-Shuan Chou ,  Li-Min Lee

    发明人： Sheng-Lung Huang ,  Hsiao-Wen Lee ,  Chia-Chang Kuo ,  Sheng-Bang Huang ,  Tsai-Shuan Chou ,  Li-Min Lee

    IPC分类号： G02B6/00

    CPC分类号： C30B13/00 ,  C30B29/30 ,  C30B29/32

    摘要： The present invention relates to an apparatus for making a source material into a crystal fiber having different regions of polarization inversion. The apparatus of the present invention is similar to a laser-heated pedestal growth (LHPG) apparatus, characterized in that a first electric field generating device and a second electric field generating device are included. The first electric field generating device is used for providing a first external electric field which is used for poling the crystal fiber and inducing micro-swing of the crystal fiber. The second electric field generating device is disposed on a predetermined position above the first electric field generating device for providing a second external electric field to control and maintain the amplitude of the micro-swing. Whereby, the growth condition of the crystal fiber can be controlled precisely, and a uniformly and regularly periodic polarization inversion structure is fabricated.

    摘要翻译： 本发明涉及一种用于将源材料制成具有不同极化反转区域的晶体光纤的装置。 本发明的装置类似于激光加热基座生长装置（LHPG），其特征在于包括第一电场产生装置和第二电场产生装置。 第一电场产生装置用于提供用于极化晶体光纤并引起晶体光纤的微摆动的第一外部电场。 第二电场产生装置设置在第一电场产生装置上方的预定位置处，用于提供第二外部电场以控制和保持微摆幅的幅度。 由此，可以精确地控制晶体光纤的生长条件，并且制造均匀且规则的周期性极化反转结构。

    Inspection method
    3.
    发明授权
    Inspection method 有权
    检验方法

    公开(公告)号：US08773158B2

    公开(公告)日：2014-07-08

    申请号：US13114039

    申请日：2011-05-23

    申请人： Chien-Ping Wang ,  Shih-Chun Yang ,  Tzung-Te Chen ,  An-Tse Lee ,  Sheng-Bang Huang

    发明人： Chien-Ping Wang ,  Shih-Chun Yang ,  Tzung-Te Chen ,  An-Tse Lee ,  Sheng-Bang Huang

    IPC分类号： G01R31/26

    CPC分类号： G01R31/2635 ,  G01R31/2642

    摘要： An inspection system is provided, which applies a forward or reverse voltage on a light-emitting device and measures a current thereof respectively before and after temperature rise, and determines whether the device fails according to the fact whether a current difference before and after the temperature rise is larger than a failure current determination value. Alternatively, the inspection system adopts a current applying device to apply a forward and reverse current on a light-emitting device and measures a voltage difference thereof respectively before and after temperature rise, and determines whether the device fails according to the fact whether a difference of the voltage differences before and after the temperature rise is larger than a failure voltage determination value. Alternatively, the inspection system adopts a predetermined inspecting step and a rapid inspecting step respectively to determine whether a light-emitting device fails. An inspection method for the inspection system is also provided.

    摘要翻译： 提供一种检查系统，其在发光装置上施加正向或反向电压并分别在升温之前和之后测量其电流，并且根据事件之前和之后的电流差异来确定装置是否失效 上升大于故障电流确定值。 或者，检查系统采用电流施加装置，在发光装置上施加正向和反向电流，并且分别在温升之前和之后测量其电压差，并根据事实是否根据 温升前后的电压差大于故障电压判定值。 或者，检查系统分别采用预定的检查步骤和快速检查步骤来确定发光装置是否发生故障。 还提供了检查系统的检查方法。

    INSPECTION METHOD
    4.
    发明申请
    INSPECTION METHOD 有权
    检查方法

    公开(公告)号：US20120169345A1

    公开(公告)日：2012-07-05

    申请号：US13114039

    申请日：2011-05-23

    申请人： Chien-Ping Wang ,  Shih-Chun Yang ,  Tzung-Te Chen ,  An-Tse Lee ,  Sheng-Bang Huang

    发明人： Chien-Ping Wang ,  Shih-Chun Yang ,  Tzung-Te Chen ,  An-Tse Lee ,  Sheng-Bang Huang

    IPC分类号： G01R31/44

    CPC分类号： G01R31/2635 ,  G01R31/2642

    摘要： An inspection system is provided, which applies a forward or reverse voltage on a light-emitting device and measures a current thereof respectively before and after temperature rise, and determines whether the device fails according to the fact whether a current difference before and after the temperature rise is larger than a failure current determination value. Alternatively, the inspection system adopts a current applying device to apply a forward and reverse current on a light-emitting device and measures a voltage difference thereof respectively before and after temperature rise, and determines whether the device fails according to the fact whether a difference of the voltage differences before and after the temperature rise is larger than a failure voltage determination value. Alternatively, the inspection system adopts a predetermined inspecting step and a rapid inspecting step respectively to determine whether a light-emitting device fails. An inspection method for the inspection system is also provided.

    摘要翻译： 提供一种检查系统，其在发光装置上施加正向或反向电压并分别在升温之前和之后测量其电流，并且根据事件之前和之后的电流差异来确定装置是否失效 上升大于故障电流确定值。 或者，检查系统采用电流施加装置，在发光装置上施加正向和反向电流，并且分别在温升之前和之后测量其电压差，并根据事实是否根据 温升前后的电压差大于故障电压判定值。 或者，检查系统分别采用预定的检查步骤和快速检查步骤来确定发光装置是否发生故障。 还提供了检查系统的检查方法。