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公开(公告)号：US12204086B2
公开(公告)日：2025-01-21
申请号：US18236088
申请日：2023-08-21
Applicant: ILLUMINA, INC.
Inventor： Robert Langlois , Bo Lu , Hongji Ren , Joseph Pinto , Simon Prince , Austin Corbett
Abstract: A method is used to generate a distortion model for a structured illumination microscopy (SIM) optical system. A sliding window is moved in relation to a plurality of images to define a plurality of sub-tiles. Each sub-tile represents a portion of the corresponding image. Parameters are estimated for each sub-tiles. The parameters include two or more parameters selected from the group consisting of modulation, angle, spacing, phase offset, and phase deviation. A full width at half maximum (FWHM) value associated with each sub-tile is estimated. A distortion model is estimated, based at least in part on a combination of the estimated parameters and FWHM values stored in the predetermined format and an estimated center window parameter. A two-dimensional image may be generated, based at least in part on the estimated distortion model. The two-dimensional image may include representations indicating where distortions occur in the optical system.
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公开(公告)号：US20230393379A1
公开(公告)日：2023-12-07
申请号：US18236088
申请日：2023-08-21
Applicant: ILLUMINA, INC.
Inventor： Robert Langlois , Bo Lu , Hongji Ren , Joseph Pinto , Simon Prince , Austin Corbett
CPC classification number: G02B21/367 , G02B21/14 , G06T7/0012 , G06T2207/10056 , G06T2207/30024
Abstract: A method is used to generate a distortion model for a structured illumination microscopy (SIM) optical system. A sliding window is moved in relation to a plurality of images to define a plurality of sub-tiles. Each sub-tile represents a portion of the corresponding image. Parameters are estimated for each sub-tiles. The parameters include two or more parameters selected from the group consisting of modulation, angle, spacing, phase offset, and phase deviation. A full width at half maximum (FWHM) value associated with each sub-tile is estimated. A distortion model is estimated, based at least in part on a combination of the estimated parameters and FWHM values stored in the predetermined format and an estimated center window parameter. A two-dimensional image may be generated, based at least in part on the estimated distortion model. The two-dimensional image may include representations indicating where distortions occur in the optical system.
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公开(公告)号：US11243390B2
公开(公告)日：2022-02-08
申请号：US17110406
申请日：2020-12-03
Applicant: ILLUMINA, INC.
Inventor： Austin Corbett , Bo Lu , Robert Langlois , Joseph Pinto , Yu Chen , Peter Newman , Hongji Ren
Abstract: A method is used to generate a report presenting parameter values corresponding to a structured illumination microscopy (SIM) optical system. The parameter values are based at least in part on the performed modulation calculation corresponding to an image set captured with the SIM optical system. A minimum FWHM slice is identified, based at least in part on an average FWHM value across the images in the first image set. Parameter estimation is performed on the identified minimum FWHM slice. Best in-focus parameters are identified based at least in part on the performed estimation. A phase estimate is performed for each image in the set. A modulation calculation is performed based at least in part on the identified best in-focus parameters. The report is based at least in part on the performed modulation calculation.
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Patent Agency Ranking
公开(公告)号：US11768364B2
公开(公告)日：2023-09-26
申请号：US17110409
申请日：2020-12-03
Applicant: ILLUMINA, INC.
Inventor： Robert Langlois , Bo Lu , Hongji Ren , Joseph Pinto , Simon Prince , Austin Corbett
CPC classification number: G02B21/367 , G02B21/14 , G06T7/0012 , G06T2207/10056 , G06T2207/30024
Abstract: A method is used to generate a distortion model for a structured illumination microscopy (SIM) optical system. A sliding window is moved in relation to a plurality of images to define a plurality of sub-tiles. Each sub-tile represents a portion of the corresponding image. Parameters are estimated for each sub-tiles. The parameters include two or more parameters selected from the group consisting of modulation, angle, spacing, phase offset, and phase deviation. A full width at half maximum (FWHM) value associated with each sub-tile is estimated. A distortion model is estimated, based at least in part on a combination of the estimated parameters and FWHM values stored in the predetermined format and an estimated center window parameter. A two-dimensional image may be generated, based at least in part on the estimated distortion model. The two-dimensional image may include representations indicating where distortions occur in the optical system.
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公开(公告)号：US20220113532A1
公开(公告)日：2022-04-14
申请号：US17558829
申请日：2021-12-22
Applicant: ILLUMINA, INC.
Inventor： Austin Corbett , Bo Lu , Robert Langlois , Joseph Pinto , Yu Chen , Peter Newman , Hongji Ren
Abstract: A method is used to generate a report presenting parameter values corresponding to a structured illumination microscopy (SIM) optical system. The parameter values are based at least in part on the performed modulation calculation corresponding to an image set captured with the SIM optical system. A minimum FWHM slice is identified, based at least in part on an average FWHM value across the images in the first image set. Parameter estimation is performed on the identified minimum FWHM slice. Best in-focus parameters are identified based at least in part on the performed estimation. A phase estimate is performed for each image in the set. A modulation calculation is performed based at least in part on the identified best in-focus parameters. The report is based at least in part on the performed modulation calculation.
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公开(公告)号：US11885953B2
公开(公告)日：2024-01-30
申请号：US17558829
申请日：2021-12-22
Applicant: ILLUMINA, INC.
Inventor： Austin Corbett , Bo Lu , Robert Langlois , Joseph Pinto , Yu Chen , Peter Newman , Hongji Ren
CPC classification number: G02B21/365 , G02B26/06 , G06T7/0014 , G06T7/80 , H04N23/56 , G02B21/082 , G06T2207/10056 , G06T2207/30168
Abstract: A method is used to generate a report presenting parameter values corresponding to a structured illumination microscopy (SIM) optical system. The parameter values are based at least in part on the performed modulation calculation corresponding to an image set captured with the SIM optical system. A minimum FWHM slice is identified, based at least in part on an average FWHM value across the images in the first image set. Parameter estimation is performed on the identified minimum FWHM slice. Best in-focus parameters are identified based at least in part on the performed estimation. A phase estimate is performed for each image in the set. A modulation calculation is performed based at least in part on the identified best in-focus parameters. The report is based at least in part on the performed modulation calculation.
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公开(公告)号：US20210173196A1
公开(公告)日：2021-06-10
申请号：US17110409
申请日：2020-12-03
Applicant: ILLUMINA, INC.
Inventor： Robert Langlois , Bo Lu , Hongji Ren , Joseph Pinto , Simon Prince , Austin Corbett
Abstract: A method is used to generate a distortion model for a structured illumination microscopy (SIM) optical system. A sliding window is moved in relation to a plurality of images to define a plurality of sub-tiles. Each sub-tile represents a portion of the corresponding image. Parameters are estimated for each sub-tiles. The parameters include two or more parameters selected from the group consisting of modulation, angle, spacing, phase offset, and phase deviation. A full width at half maximum (FWHM) value associated with each sub-tile is estimated. A distortion model is estimated, based at least in part on a combination of the estimated parameters and FWHM values stored in the predetermined format and an estimated center window parameter. A two-dimensional image may be generated, based at least in part on the estimated distortion model. The two-dimensional image may include representations indicating where distortions occur in the optical system.
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公开(公告)号：US20210173194A1
公开(公告)日：2021-06-10
申请号：US17110406
申请日：2020-12-03
Applicant: ILLUMINA, INC.
Inventor： Austin Corbett , Bo Lu , Robert Langlois , Joseph Pinto , Yu Chen , Peter Newman , Hongji Ren
Abstract: A method is used to generate a report presenting parameter values corresponding to a structured illumination microscopy (SIM) optical system. The parameter values are based at least in part on the performed modulation calculation corresponding to an image set captured with the SIM optical system. A minimum FWHM slice is identified, based at least in part on an average FWHM value across the images in the first image set. Parameter estimation is performed on the identified minimum FWHM slice. Best in-focus parameters are identified based at least in part on the performed estimation. A phase estimate is performed for each image in the set. A modulation calculation is performed based at least in part on the identified best in-focus parameters. The report is based at least in part on the performed modulation calculation.
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