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公开(公告)号：US20200259988A1
公开(公告)日：2020-08-13
申请号：US16859948
申请日：2020-04-27
Applicant: Illumina, Inc.
Inventor： Danilo Condello , Simon Prince , David Hargis , Jeffrey Bendick , Christophe Sigel
Abstract: Systems and methods disclosed herein include an imaging system that may include a laser diode source; an objective lens positioned to direct a focus tracking beam from the light source onto a location in a sample container and to receive the focus tracking beam reflected from the sample; and an image sensor that may include a plurality of pixel locations to receive focus tracking beam that is reflected off of the location in the sample container, where the reflected focus tracking beam may create a spot on the image sensor. Some examples may further include a laser diode light source that may be operated at a power level that is above a power level for operation at an Amplified Spontaneous Emission (“ASE”) mode, but below a power level for single mode operation.
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公开(公告)号：US10666872B2
公开(公告)日：2020-05-26
申请号：US15913878
申请日：2018-03-06
Applicant: ILLUMINA, INC.
Inventor： Danilo Condello , Simon Prince , David Hargis , Jeffrey Bendick , Christophe Sigel
Abstract: Systems and methods disclosed herein include an imaging system that may include a laser diode source; an objective lens positioned to direct a focus tracking beam from the light source onto a location in a sample container and to receive the focus tracking beam reflected from the sample; and an image sensor that may include a plurality of pixel locations to receive focus tracking beam that is reflected off of the location in the sample container, where the reflected focus tracking beam may create a spot on the image sensor. Some examples may further include a laser diode light source that may be operated at a power level that is above a power level for operation at an Amplified Spontaneous Emission (“ASE”) mode, but below a power level for single mode operation.
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Patent Agency Ranking
公开(公告)号：US20180262670A1
公开(公告)日：2018-09-13
申请号：US15913878
申请日：2018-03-06
Applicant: ILLUMINA, INC.
Inventor： Danilo Condello , Simon Prince , David Hargis , Jeffrey Bendick , Christophe Sigel
Abstract: Systems and methods disclosed herein include an imaging system that may include a laser diode source; an objective lens positioned to direct a focus tracking beam from the light source onto a location in a sample container and to receive the focus tracking beam reflected from the sample; and an image sensor that may include a plurality of pixel locations to receive focus tracking beam that is reflected off of the location in the sample container, where the reflected focus tracking beam may create a spot on the image sensor. Some examples may further include a laser diode light source that may be operated at a power level that is above a power level for operation at an Amplified Spontaneous Emission (“ASE”) mode, but below a power level for single mode operation.
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公开(公告)号：US11143856B2
公开(公告)日：2021-10-12
申请号：US16542640
申请日：2019-08-16
Applicant: ILLUMINA, INC.
Inventor： Danilo Condello , Simon Prince , John O'Shaughnessy , Christophe Sigel , Ashkan Arianpour
Abstract: An imaging system including a light source; a first focusing lens positioned to focus a beam from the light source to a beam waist at a predetermined location along an optical path of the beam in the imaging system; a beam splitter positioned relative to the first focusing lens to receive the beam from the first focusing lens and to create first and second beams; a second focusing lens positioned to receive the first and second beams output by the beam splitter, to focus the received first and second beams to a spot sized dimensioned to fall within a sample to be image, and further positioned to receive first and second beams reflected from the sample; an image sensor positioned to receive the light beams reflected from the sample; and a roof prism positioned in the optical path between the second focusing lens and the image sensor.
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公开(公告)号：US10416428B2
公开(公告)日：2019-09-17
申请号：US15913903
申请日：2018-03-06
Applicant: ILLUMINA, INC.
Inventor： Danilo Condello , Simon Prince , John O'Shaughnessy , Christophe Sigel , Ashkan Arianpour
Abstract: An imaging system including a light source; a first focusing lens positioned to focus a beam from the light source to a beam waist at a predetermined location along an optical path of the beam in the imaging system; a beam splitter positioned relative to the first focusing lens to receive the beam from the first focusing lens and to create first and second beams; a second focusing lens positioned to receive the first and second beams output by the beam splitter, to focus the received first and second beams to a spot sized dimensioned to fall within a sample to be image, and further positioned to receive first and second beams reflected from the sample; an image sensor positioned to receive the light beams reflected from the sample; and a roof prism positioned in the optical path between the second focusing lens and the image sensor.
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公开(公告)号：US11190706B2
公开(公告)日：2021-11-30
申请号：US16859948
申请日：2020-04-27
Applicant: Illumina, Inc.
Inventor： Danilo Condello , Simon Prince , David Hargis , Jeffrey Bendick , Christophe Sigel
Abstract: Systems and methods disclosed herein include an imaging system that may include a laser diode source; an objective lens positioned to direct a focus tracking beam from the light source onto a location in a sample container and to receive the focus tracking beam reflected from the sample; and an image sensor that may include a plurality of pixel locations to receive focus tracking beam that is reflected off of the location in the sample container, where the reflected focus tracking beam may create a spot on the image sensor. Some examples may further include a laser diode light source that may be operated at a power level that is above a power level for operation at an Amplified Spontaneous Emission (“ASE”) mode, but below a power level for single mode operation.
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公开(公告)号：US20180259760A1
公开(公告)日：2018-09-13
申请号：US15913903
申请日：2018-03-06
Applicant: ILLUMINA, INC.
Inventor： Danilo Condello , Simon Prince , John O'Shaughnessy , Christophe Sigel , Ashkan Arianpour
Abstract: Provided herein is an imaging system including a light source; a first focusing lens positioned to focus a beam from the light source to a beam waist at a predetermined location along an optical path of the beam in the imaging system; a beam splitter positioned relative to the first focusing lens to receive the beam from the first focusing lens and to create first and second beams; a second focusing lens positioned to receive the first and second beams output by the beam splitter, to focus the received first and second beams to a spot sized dimensioned to fall within a sample to be image, and further positioned to receive first and second beams reflected from the sample; an image sensor positioned to receive the light beams reflected from the sample; and a roof prism positioned in the optical path between the second focusing lens and the image sensor.
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