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公开(公告)号：US20240369468A1
公开(公告)日：2024-11-07
申请号：US18572189
申请日：2022-12-27
Applicant: ILLUMINA, INC.
Inventor： Steven Boege , Danilo Condello , Simon Prince , Jason Bryant , Merek Siu
IPC: G01N15/1434 , G01N15/10 , G01N15/14
Abstract: Imaging systems and related methods are disclosed. In accordance with an implementation, a system includes a flow cell receptacle to receive a flow cell that receives a sample and an imaging system having a light source assembly, and an imaging device. The light source assembly to form a substantially collimated beam. The optical assembly including an asymmetric beam expander group that includes one or more asymmetric elements or anamorphic elements disposed along an optical axis. The optical assembly to receive the substantially collimated beam from the light source assembly, and transform the substantially collimated beam into a shaped sampling beam having an elongated cross section in a far field at or near a focal plane of the optical assembly to optically probe the sample. The imaging device to obtain image data associated with the sample in response to the optical probing of the sample with the sampling beam.
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公开(公告)号：US11360027B2
公开(公告)日：2022-06-14
申请号：US16351193
申请日：2019-03-12
Applicant: Illumina, Inc.
Inventor： Yinghua Sun , Stanley S. Hong , Frederick Erie , Alex Nemiroski , M. Shane Bowen , Danilo Condello , Dietrich Dehlinger , Marco A. Krumbuegel , Anthony Lam , Aaron Liu , Bojan Obradovic , Mark Pratt
IPC: G01N21/64
Abstract: A system includes: an objective lens; a first light source to feed first illuminating light through the objective lens and into a flowcell (e.g., with a relatively thin film waveguide) to be installed in the system, the first illuminating light to be fed using a first grating on the flowcell; and a first image sensor to capture imaging light using the objective lens, wherein the first grating is positioned outside a field of view of the first image sensor. Dual-surface imaging can be performed. Flowcells with multiple swaths bounded by gratings can be used. An auto-alignment process can be performed.
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公开(公告)号：US11125988B2
公开(公告)日：2021-09-21
申请号：US15913892
申请日：2018-03-06
Applicant: ILLUMINA, INC.
Inventor： Danilo Condello , Simon Prince , David Hargis , John O'Shaughnessy , William Butterfield , Jeffrey Bendick , Peter Clarke Newman
Abstract: Systems and methods disclosed herein include an optical blocking structure that may include a frame defining an aperture, first and second elongate structural members each comprising first and second ends such that the first and second elongate structural members may be connected at their first ends to opposite sides of the aperture, and further such that the first and second elongate structural members may extend from the frame parallel to and in the same direction as one another; and an optically opaque blocking member positioned to extend between the respective second ends of the first and second blocking members.
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公开(公告)号：US20250123208A1
公开(公告)日：2025-04-17
申请号：US18939115
申请日：2024-11-06
Applicant: Illumina, Inc.
Inventor： Simon Prince , Danilo Condello , Vincent Hsieh , Krysada Phounsiri , John O’Shaughnessy
Abstract: A method comprises: directing, using an objective and a first reflective surface, first autofocus light toward a sensor, the first autofocus light reflected from a first surface of a substrate; preventing second autofocus light from reaching the sensor, the second autofocus light reflected from a second surface of the substrate; and directing, using the objective and a second reflective surface, emission light toward the sensor, the emission light originating from a sample at the substrate.
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公开(公告)号：US20240027349A1
公开(公告)日：2024-01-25
申请号：US18480803
申请日：2023-10-04
Applicant: Illumina, Inc.
Inventor： Simon Prince , Danilo Condello , Vincent Hsieh , Krysada Phounsiri , John O’Shaughnessy
IPC: G01N21/64
CPC classification number: G01N21/6458 , G01N2021/6463 , G01N2021/058
Abstract: A method comprises: directing, using an objective and a first reflective surface, first autofocus light toward a sensor, the first autofocus light reflected from a first surface of a substrate; preventing second autofocus light from reaching the sensor, the second autofocus light reflected from a second surface of the substrate; and directing, using the objective and a second reflective surface, emission light toward the sensor, the emission light originating from a sample at the substrate.
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Patent Agency Ranking
公开(公告)号：US11054624B2
公开(公告)日：2021-07-06
申请号：US15852699
申请日：2017-12-22
Applicant: Illumina, Inc.
Inventor： Ashkan Arianpour , John Bailey , Dustin Blair , Xiangling (Steve) Chen , Stanley S. Hong , Simon Prince , Merek C. Siu , Chunhong (Allen) Zhou , Danilo Condello
Abstract: An imaging system may include a sample stage comprising a surface to support a sample container, the sample container having a plurality of sample locations; an optical stage having an objective lens, the optical stage being positionable relative to the sample stage to image samples at the sample locations; an actuator physically coupled to at least one of the sample stage and the optical stage to move the sample stage relative to the optical stage to focus the optical stage onto a current sample location; and a drive circuit to determine a focus setting for a next sample location and to provide a drive signal to the actuator before the optical stage is positioned to image a sample at the next sample location, wherein at least one parameter of the drive signal is determined using a difference between a focus setting for the current sample location and the determined focus setting for the next sample location.
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公开(公告)号：US10666872B2
公开(公告)日：2020-05-26
申请号：US15913878
申请日：2018-03-06
Applicant: ILLUMINA, INC.
Inventor： Danilo Condello , Simon Prince , David Hargis , Jeffrey Bendick , Christophe Sigel
Abstract: Systems and methods disclosed herein include an imaging system that may include a laser diode source; an objective lens positioned to direct a focus tracking beam from the light source onto a location in a sample container and to receive the focus tracking beam reflected from the sample; and an image sensor that may include a plurality of pixel locations to receive focus tracking beam that is reflected off of the location in the sample container, where the reflected focus tracking beam may create a spot on the image sensor. Some examples may further include a laser diode light source that may be operated at a power level that is above a power level for operation at an Amplified Spontaneous Emission (“ASE”) mode, but below a power level for single mode operation.
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公开(公告)号：US20190302024A1
公开(公告)日：2019-10-03
申请号：US16351193
申请日：2019-03-12
Applicant: Illumina, Inc.
Inventor： Yinghua Sun , Stanley S. Hong , Frederick Erie , Alex Nemiroski , M. Shane Bowen , Danilo Condello , Dietrich Dehlinger , Marco A. Krumbuegel , Anthony Lam , Aaron Liu , Bojan Obradovic , Mark Pratt
IPC: G01N21/64
Abstract: A system includes: an objective lens; a first light source to feed first illuminating light through the objective lens and into a flowcell (e.g., with a relatively thin film waveguide) to be installed in the system, the first illuminating light to be fed using a first grating on the flowcell; and a first image sensor to capture imaging light using the objective lens, wherein the first grating is positioned outside a field of view of the first image sensor. Dual-surface imaging can be performed. Flowcells with multiple swaths bounded by gratings can be used. An auto-alignment process can be performed.
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公开(公告)号：US20180262670A1
公开(公告)日：2018-09-13
申请号：US15913878
申请日：2018-03-06
Applicant: ILLUMINA, INC.
Inventor： Danilo Condello , Simon Prince , David Hargis , Jeffrey Bendick , Christophe Sigel
Abstract: Systems and methods disclosed herein include an imaging system that may include a laser diode source; an objective lens positioned to direct a focus tracking beam from the light source onto a location in a sample container and to receive the focus tracking beam reflected from the sample; and an image sensor that may include a plurality of pixel locations to receive focus tracking beam that is reflected off of the location in the sample container, where the reflected focus tracking beam may create a spot on the image sensor. Some examples may further include a laser diode light source that may be operated at a power level that is above a power level for operation at an Amplified Spontaneous Emission (“ASE”) mode, but below a power level for single mode operation.
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公开(公告)号：US12044624B2
公开(公告)日：2024-07-23
申请号：US17663476
申请日：2022-05-16
Applicant: Illumina, Inc.
Inventor： Yinghua Sun , Stanley S. Hong , Frederick Erie , Alex Nemiroski , M. Shane Bowen , Danilo Condello , Dietrich Dehlinger , Marco A. Krumbuegel , Anthony Lam , Aaron Liu , Bojan Obradovic , Mark Pratt
IPC: G01N21/64
CPC classification number: G01N21/6456 , G01N21/6428 , G01N2021/6439 , G01N2021/6463 , G01N2021/6482
Abstract: A system includes: an objective lens; a first light source to feed first illuminating light through the objective lens and into a flowcell (e.g., with a relatively thin film waveguide) to be installed in the system, the first illuminating light to be fed using a first grating on the flowcell; and a first image sensor to capture imaging light using the objective lens, wherein the first grating is positioned outside a field of view of the first image sensor. Dual-surface imaging can be performed. Flowcells with multiple swaths bounded by gratings can be used. An auto-alignment process can be performed.
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