公开(公告)号：US12264361B2

公开(公告)日：2025-04-01

申请号：US17643454

申请日：2021-12-09

Applicant: Illumina, Inc. ,  Illumina Cambridge Limited

Inventor： Lewis Kraft ,  Craig Lee Hetherington ,  Craig M. Ciesla ,  Michael Burek ,  Jeffrey Fisher ,  Jason Betley

IPC: C12Q1/6869 ,  H01L27/146

Abstract: An image sensor structure includes an image layer having an array of light detectors disposed therein. A device stack is disposed over the image layer. An array of light guides is disposed in the device stack. Each light guide is associated with a light detector. An array of nanowells is disposed over the device stack. Each nanowell is associated with a first light guide of the array of light guides. A first primer set is disposed throughout a first well region of each nanowell. A second primer set is disposed throughout a second well region of each nanowell. The second well region is adjacent the first well region. The first and second primer sets are operable to attach a forward strand cluster of forward polynucleotide strands in the first well region and a reverse strand cluster of reverse polynucleotide strands in the second well region.

公开(公告)号：US20240033738A1

公开(公告)日：2024-02-01

申请号：US18357006

申请日：2023-07-21

Applicant: ILLUMINA, INC.

Inventor： Michael Burek ,  Gregory Holst ,  Danilo Condello ,  Dustin Blair

IPC: B01L3/00

CPC classification number: B01L3/502761 ,  B01L2200/0652 ,  B01L2300/0654 ,  B01L2200/16 ,  B01L2200/12 ,  B01L2300/0893

Abstract: The presently described techniques relate generally to providing motion feedback (e.g., motion system calibration and/or sample alignment) in the context of an imaging system (such as a time delay and integration (TDI) based imaging system). The architecture and techniques discussed may achieve nanoscale control and calibration of a movement feedback system without a high-resolution encoder subsystem or, in the alternative embodiments, with a lower resolution (and correspondingly less expensive) encoder subsystem than might otherwise be employed. By way of example, certain embodiments described herein relate to ascertaining or calibrating linear motion of a sample holder surface using nanoscale features (e.g., sample sites or nanowells or lithographically patterned features) provided on a surface of the sample holder.