Abstract:
The present invention is directed integrated circuits and methods thereof. More specifically, an embodiment of the present invention provides a comparator calibration loop where a digital integrator stores a running sum based on the output of a comparator. A DAC converts the running sum and generates an offset calibration voltage, which is filtered by a low-pass filter module, and the filtered offset calibration voltage is used to cancel out the intrinsic offset voltage and low frequency noise of the comparator. There are other embodiments as well.
Abstract:
The present invention is directed to signal processing systems and methods thereof. In various embodiments, the present invention provides an analog-to-digital conversion (ADC) system that includes a flash ADC portion and a time-interleaved parallel SAR portion. For an n-bit ADC process, the flash ADC portion converts k MSBs of the n bits during a single cycle, and the SAR portion converts n−k LSBs in m number of cycles. The SAR portion includes a number of SAR channels that perform A/D conversion in parallel, and the k MSB from the course flash converter is verified for errors by the SAR portion and allows a net saving of the power consumption by reducing the number of fine resolution SARs. There are other embodiments as well.
Abstract:
The present invention is directed integrated circuits and methods thereof. More specifically, an embodiment of the present invention provides a comparator calibration loop where a digital integrator stores a running sum based on the output of a comparator. A DAC converts the running sum and generates an offset calibration voltage, which is filtered by a low-pass filter module, and the filtered offset calibration voltage is used to cancel out the intrinsic offset voltage and low frequency noise of the comparator. There are other embodiments as well.
Abstract:
The present invention is directed integrated circuits and methods thereof. More specifically, an embodiment of the present invention provides a comparator calibration loop where a digital integrator stores a running sum based on the output of a comparator. A DAC converts the running sum and generates an offset calibration voltage, which is filtered by a low-pass filter module, and the filtered offset calibration voltage is used to cancel out the intrinsic offset voltage and low frequency noise of the comparator. There are other embodiments as well.
Abstract:
The present invention is directed to signal processing systems and methods thereof. In various embodiments, the present invention provides an analog-to-digital conversion (ADC) system that includes a flash ADC portion and a time-interleaved parallel SAR portion. For an n-bit ADC process, the flash ADC portion converts k MSBs of the n bits during a single cycle, and the SAR portion converts n−k LSBs in m number of cycles. The SAR portion includes a number of SAR channels that perform A/D conversion in parallel, and the k MSB from the course flash converter is verified for errors by the SAR portion and allows a net saving of the power consumption by reducing the number of fine resolution SARs. There are other embodiments as well.