公开(公告)号：US20200088791A1

公开(公告)日：2020-03-19

申请号：US16686699

申请日：2019-11-18

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： FRANCO STELLARI ,  PEILIN SONG

IPC: G01R31/317

Abstract: A method for automated scan chain diagnostics includes comparing actual emission signatures for individual design elements to expected emission signatures, the individual design elements having pixels allocated thereto associated with an image of a device registered to a design layout, and determining whether the actual emission signatures differ from the expected emission signatures by more than a threshold amount to determine if a defect is present.

公开(公告)号：US20170131350A1

公开(公告)日：2017-05-11

申请号：US15412517

申请日：2017-01-23

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： PEILIN SONG ,  FRANCO STELLARI

IPC: G01R31/311 ,  G06T7/00 ,  G06T7/11 ,  G01R31/28

CPC classification number: G01R31/311 ,  G01R31/2853 ,  G06T7/001 ,  G06T7/11 ,  G06T2207/10056 ,  G06T2207/30148

Abstract: Methods and systems for localizing and resolving an integrated circuit include selecting one or more electrical stimuli to be applied to a device under test such that the electrical stimuli provide a baseline image and a distinguishing image effect when applied to the device under test. The one or more electrical stimuli are applied to the device under test. Emissions from the device under test are measured to provide a measurement data set and to collect the baseline image and the distinguishing image effect. The measurement includes dividing a field of view in a photon emission image into regions of interest. The measurement data set is analyzed to localize and evaluate circuit structures by comparing the baseline image and the distinguishing image effect. The analysis includes calculating a figure of merit for each region of interest that represents a degree of switching activity in the respective region of interest.

公开(公告)号：US20150236693A1

公开(公告)日：2015-08-20

申请号：US14699920

申请日：2015-04-29

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： DIRK PFEIFFER ,  JEAN-OLIVIER PLOUCHART ,  PEILIN SONG

IPC: H03K19/003

CPC classification number: H03K19/003

Abstract: Methods, systems and devices related to authentication of chips using physical unclonable functions (PUFs) are disclosed. In preferred systems, differentials of PUFs are employed to minimize sensitivity to temperature variations as well as other factors that affect the reliability of PUF states. In particular, a PUF system can include PUF elements arranged in series and in parallel with respect to each other to facilitate the measurement of the differentials and generation of a resulting bit sequence for purposes of authenticating the chip. Other embodiments are directed to determining and filtering reliable and unreliable states that can be employed to authenticate a chip.

Abstract translation: 公开了使用物理不可克隆功能（PUF）的芯片认证相关的方法，系统和设备。 在优选的系统中，使用PUF的差异来最小化对温度变化的敏感性以及影响PUF状态的可靠性的其它因素。 特别地，PUF系统可以包括相对于彼此串联并联布置的PUF元件，以促进对差分的测量并产生所得到的位序列以便认证芯片。 其他实施例涉及确定和过滤可用于认证芯片的可靠和不可靠的状态。

公开(公告)号：US20190212388A1

公开(公告)日：2019-07-11

申请号：US16297011

申请日：2019-03-08

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： FRANCO STELLARI ,  PEILIN SONG

IPC: G01R31/317

Abstract: A method for automated scan chain diagnostics includes segmenting an image of a device associated with a design layout to allocate pixels to individual design elements, comparing actual emission signatures for the individual design elements to expected emission signatures, and determining whether the actual emission signatures differ from the expected emission signatures by more than a threshold amount to determine if a defect is present.

公开(公告)号：US20170147736A1

公开(公告)日：2017-05-25

申请号：US14945892

申请日：2015-11-19

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： FRANCO STELLARI ,  PEILIN SONG

IPC: G06F17/50

CPC classification number: G01R31/31728 ,  G01R31/311

Abstract: Methods and systems for automated diagnostics include registering an image of a device under test (DUT) to a corresponding design layout. The image is segmented based on the registration to allocate pixels to individual design elements. Emission signatures for the individual design elements are compared to expected signatures. If the emissions differ from the expected signatures more than a threshold amount to determine if a defect is present.

公开(公告)号：US20150219718A1

公开(公告)日：2015-08-06

申请号：US14687561

申请日：2015-04-15

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： FRANCO MOTIKA ,  DIRK PFEIFFER ,  PEILIN SONG

IPC: G01R31/3177

CPC classification number: G01R31/3177 ,  G01R31/318328 ,  G01R31/318541 ,  G01R31/318547 ,  G06F7/588 ,  G06F21/73

Abstract: Methods and systems for generating a circuit identification number include determining a propagation time delay across a scan chain of known length; comparing the propagation time delay to a threshold associated with the scan chain length; storing an identifier bit based on the result of the comparison; repeating the steps of determining, comparing, and storing until a number of stored identifier bits reaches a threshold number; and outputting the stored identifier bits.

Abstract translation: 用于产生电路识别号码的方法和系统包括确定跨越已知长度的扫描链的传播时间延迟; 将传播时间延迟与扫描链长度相关联的阈值进行比较; 基于比较结果存储标识符位; 重复确定，比较和存储的步骤，直到多个存储的标识符比特达到阈值数; 并输出所存储的标识符位。