TECHNIQUES FOR REDUCED NOISE CAPACITANCE-TO-VOLTAGE CONVERTER

    公开(公告)号:US20240171188A1

    公开(公告)日:2024-05-23

    申请号:US18500886

    申请日:2023-11-02

    申请人: INVENSENSE, INC.

    摘要: A continuous time single drive capacitance-to-voltage (C2V) converter can be employed for single sensor, balanced single sensor, or differential sensor. First sensor and/or second sensor can be employed to sense a condition. A capacitive bridge can comprise a first capacitive digital-to-analog-converter (DAC) and second capacitive DAC as a differential node. First capacitive DAC can be associated with first sensor, and second capacitive DAC can be associated with a third capacitive DAC, in series with first sensor, if single sensor is implemented or the second sensor if balanced single sensor or differential sensor is implemented. Capacitive bridge can be connected to differential input of a capacitive feedback amplifier that can be a continuous time amplifier with no signal sampling and no noise folding. Capacitive feedback amplifier can comprise capacitively coupled input common mode feedback, which can remove noise from a sensor drive, and output common mode feedback.

    SENSOR DRIVER PROVIDING HIGH POWER SUPPLY REJECTION RATIO

    公开(公告)号:US20240171133A1

    公开(公告)日:2024-05-23

    申请号:US18461050

    申请日:2023-09-05

    申请人: INVENSENSE, INC.

    IPC分类号: H03F3/00 H03F1/30 H03F3/45

    摘要: A sensor driver providing high power supply rejection ratio is provided herein. A circuit can include a charge pump that comprises an input terminal and an output terminal, wherein the input terminal is operatively connected to a voltage supply. The charge pump further comprises circuitry that decouples an input voltage from the voltage supply from an output voltage of the charge pump and mixes defined frequency disturbances back to baseband. The circuit also includes an error amplifier configured to provide high power supply rejection ratio at baseband, wherein the output terminal of the charge pump is operatively connected to an input node of the error amplifier. Further, the circuit includes a capacitive micro-electromechanical system sensor operatively connected to an output node of the error amplifier.

    BACKPOWER-SAFE TEST SWITCH
    3.
    发明公开

    公开(公告)号:US20240171174A1

    公开(公告)日:2024-05-23

    申请号:US18511786

    申请日:2023-11-16

    申请人: INVENSENSE, INC.

    IPC分类号: H03K17/687 G01R31/28

    CPC分类号: H03K17/6871 G01R31/2884

    摘要: Disclosed embodiments provide backpower-safe test switches, devices, systems, and methods. By maintaining high impedance on an existing communications bus integrated circuit pin, disclosed embodiments prevent backpower of integrated circuits even when the integrated circuits are powered off. In a non-limiting aspect, disclosed embodiments facilitate increased final ASIC test coverage by facilitating multiplexing analog test bus on an existing ASIC pin.