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公开(公告)号：US11243244B2
公开(公告)日：2022-02-08
申请号：US16598532
申请日：2019-10-10
Applicant: Infineon Technologies AG
Inventor： Stefano di Martino , Philipp Franz Freidl , Daniel Knauder
Abstract: A method of testing a semiconductor device having a DC line configured to carry either a DC signal or a DC voltage and a circuit electrically connected to the DC line includes: during a first part of a test sequence, enabling a switch device so as to electrically connect a capacitor to the DC line via the switch device and applying a test signal to the circuit while the capacitor is electrically connected to the DC line; and during a second part of the test sequence, disabling the switch device so as to electrically disconnect the capacitor from the DC line via the switch device, injecting an AC signal onto the DC line after the capacitor is electrically disconnected from the DC line, and measuring a response of the circuit to the AC signal.
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公开(公告)号：US11133810B2
公开(公告)日：2021-09-28
申请号：US16885862
申请日：2020-05-28
Applicant: Infineon Technologies AG
Inventor： Martin Dechant , Philipp Franz Freidl
Abstract: An apparatus for determining whether an output signal from an injection locked oscillator is synchronized with an injection signal coming from an input oscillator has a distorter and a level detector. The distorter uses the output signal from the injection locked oscillator to generate a distorter output signal which has a difference tone in a predetermined frequency band if the output signal from the injection locked oscillator is not synchronized with the injection signal. The level detector is designed to detect a level of the difference tone. The apparatus determines, on the basis of the level of the difference tone, whether the output signal from the injection locked oscillator is synchronized with the injection signal.
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公开(公告)号：US10673442B2
公开(公告)日：2020-06-02
申请号：US16203857
申请日：2018-11-29
Applicant: Infineon Technologies AG
Inventor： Philipp Franz Freidl , Fabio Padovan , Mattias Welponer
Abstract: An integrated circuit is described herein. In accordance with one embodiment, the circuit includes a voltage controlled oscillator (VCO) that is configured to receive a tuning voltage at a tuning input and to provide an RF oscillator signal at an oscillator output. The circuit further includes a first and a second switchable resistor network. The first switchable resistor network includes at least a first resistor and at least a first switch and is connected between the tuning input of the VCO and a first node, which operably provides a first voltage. The second switchable resistor network includes at least a second resistor and at least a second switch and is connected between the tuning input of the VCO and a second node, which operably provides a second voltage. Furthermore, the circuit includes a control circuit that is configured to activate, dependent on a control signal, either the first switchable resistor network, the second switchable resistor network or both, the first and the second resistor networks.
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公开(公告)号：US20210109148A1
公开(公告)日：2021-04-15
申请号：US16598532
申请日：2019-10-10
Applicant: Infineon Technologies AG
Inventor： Stefano di Martino , Philipp Franz Freidl , Daniel Knauder
Abstract: A method of testing a semiconductor device having a DC line configured to carry either a DC signal or a DC voltage and a circuit electrically connected to the DC line includes: during a first part of a test sequence, enabling a switch device so as to electrically connect a capacitor to the DC line via the switch device and applying a test signal to the circuit while the capacitor is electrically connected to the DC line; and during a second part of the test sequence, disabling the switch device so as to electrically disconnect the capacitor from the DC line via the switch device, injecting an AC signal onto the DC line after the capacitor is electrically disconnected from the DC line, and measuring a response of the circuit to the AC signal.
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