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公开(公告)号：US11668763B2
公开(公告)日：2023-06-06
申请号：US17739347
申请日：2022-05-09
Applicant: Infineon Technologies AG
Inventor： Ketan Dewan , Rocco Calabro , Juergen Schaefer
Abstract: An analog fault detection circuit is disclosed. The analog fault detection circuit comprises an input terminal, an input circuit path coupled to the input terminal at a first end and a first sampling switch coupled to the second end of the input circuit path. The first sampling switch is configured to sample an input path voltage at the second end of the input circuit path to provide a first analog to digital converter (ADC) input voltage. The analog fault detection circuit further comprises a first ADC conversion circuit configured to convert the first ADC input voltage to a first digital ADC output; and a first broken wire detection circuit coupled between the first sampling switch and the first ADC conversion circuit, and configured to adaptively pulldown or pullup the first ADC input voltage, in order to detect a fault associated with a first analog circuit path.
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公开(公告)号：US20240380409A1
公开(公告)日：2024-11-14
申请号：US18659418
申请日：2024-05-09
Applicant: Infineon Technologies AG
Inventor： Wei Wang , Thiyagu Loganathan , Henning Behrmann , Jörg Schreiner , Jens Rosenbusch , Rocco Calabro
IPC: H03M1/12
Abstract: According to various embodiments, an electronic device is described, comprising a device input for connecting an analog signal source, an analog-to-digital converter having an analog-to-digital converter input connected to the device input, an alternating current source configured to supply an alternating current to the analog-to-digital-converter input and a detection circuit configured to store a reference for an amplitude of a voltage signal at the analog-to-digital-converter input caused by the alternating current, receive an output of the analog-to-digital converter, determine the amplitude of the voltage signal at the analog-to-digital-converter input caused by the alternating current by filtering the output of the analog-to-digital converter and output an error signal if the reference for the amplitude differs from the determined amplitude by more than a predetermined threshold.
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公开(公告)号：US20220276323A1
公开(公告)日：2022-09-01
申请号：US17739347
申请日：2022-05-09
Applicant: Infineon Technologies AG
Inventor： Ketan Dewan , Rocco Calabro , Juergen Schaefer
Abstract: An analog fault detection circuit is disclosed. The analog fault detection circuit comprises an input terminal, an input circuit path coupled to the input terminal at a first end and a first sampling switch coupled to the second end of the input circuit path. The first sampling switch is configured to sample an input path voltage at the second end of the input circuit path to provide a first analog to digital converter (ADC) input voltage. The analog fault detection circuit further comprises a first ADC conversion circuit configured to convert the first ADC input voltage to a first digital ADC output; and a first broken wire detection circuit coupled between the first sampling switch and the first ADC conversion circuit, and configured to adaptively pulldown or pullup the first ADC input voltage, in order to detect a fault associated with a first analog circuit path.
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Patent Agency Ranking
公开(公告)号：US11353517B1
公开(公告)日：2022-06-07
申请号：US17114915
申请日：2020-12-08
Applicant: Infineon Technologies AG
Inventor： Ketan Dewan , Rocco Calabro , Juergen Schaefer
Abstract: An analog fault detection circuit is disclosed. The analog fault detection circuit comprises an input terminal, an input circuit path coupled to the input terminal at a first end and a first sampling switch coupled to the second end of the input circuit path. The first sampling switch is configured to sample an input path voltage at the second end of the input circuit path to provide a first analog to digital converter (ADC) input voltage. The analog fault detection circuit further comprises a first ADC conversion circuit configured to convert the first ADC input voltage to a first digital ADC output; and a first broken wire detection circuit coupled between the first sampling switch and the first ADC conversion circuit, and configured to adaptively pulldown or pullup the first ADC input voltage, in order to detect a fault associated with a first analog circuit path.
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公开(公告)号：US20190326900A1
公开(公告)日：2019-10-24
申请号：US15960807
申请日：2018-04-24
Applicant: Infineon Technologies AG
Inventor： Rocco Calabro , Oleg Vitrenko
Abstract: A driver circuit for driving a device circuit, including: a diode-connected transistor having a bulk input coupled to a driver supply voltage, coupled between the driver supply voltage and a positive control node, wherein the driver supply voltage is less than a threshold voltage of the device circuit; a capacitor coupled between the positive control node and a signal input, wherein when an input signal received at the signal input is high, a positive control voltage at the positive control node configured to control an input transistor of the device circuit is higher than the threshold voltage of the device circuit.
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公开(公告)号：US11784657B2
公开(公告)日：2023-10-10
申请号：US17533382
申请日：2021-11-23
Applicant: Infineon Technologies AG
Inventor： Ketan Dewan , Rocco Calabro , Juergen Schaefer , David Schaffenrath
CPC classification number: H03M1/38
Abstract: An analog-to-digital device includes a sampling circuit for sampling an input signal. The sampling circuit stops sampling in response to obtaining a trigger signal. The analog-to-digital device includes an analog-to-digital converter circuit which includes an analog to digital converter (ADC) for converting a sampled input provided from the sampling circuit to digital output.
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公开(公告)号：US20220179012A1
公开(公告)日：2022-06-09
申请号：US17114915
申请日：2020-12-08
Applicant: Infineon Technologies AG
Inventor： Ketan Dewan , Rocco Calabro , Juergen Schaefer
Abstract: An analog fault detection circuit is disclosed. The analog fault detection circuit comprises an input terminal, an input circuit path coupled to the input terminal at a first end and a first sampling switch coupled to the second end of the input circuit path. The first sampling switch is configured to sample an input path voltage at the second end of the input circuit path to provide a first analog to digital converter (ADC) input voltage. The analog fault detection circuit further comprises a first ADC conversion circuit configured to convert the first ADC input voltage to a first digital ADC output; and a first broken wire detection circuit coupled between the first sampling switch and the first ADC conversion circuit, and configured to adaptively pulldown or pullup the first ADC input voltage, in order to detect a fault associated with a first analog circuit path.
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公开(公告)号：US20220166442A1
公开(公告)日：2022-05-26
申请号：US17533382
申请日：2021-11-23
Applicant: Infineon Technologies AG
Inventor： Ketan Dewan , Rocco Calabro , Juergen Schaefer , David Schaffenrath
IPC: H03M1/38
Abstract: An analog-to-digital device includes a sampling circuit for sampling an input signal. The sampling circuit stops sampling in response to obtaining a trigger signal. The analog-to-digital device includes an analog-to-digital converter circuit which includes an analog to digital converter (ADC) for converting a sampled input provided from the sampling circuit to digital output.
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