Abstract:
The disclosure relates to an electronic memory system, and more specifically, to a system for storing data in an adjustably partitionable memory array, and a method to store data in an adjustably partitionable memory array. According to an embodiment of the disclosure, a system to store data in an adjustably partitionable memory array is provided, the system including a plurality of memory cells arranged in an array of rows and columns, a plurality of bit lines, and a plurality of switches, wherein each bit line is electrically coupled to a column of memory cells and each bit line comprises a switch configured to allow the respective bit line to be partitioned by opening of the switch.
Abstract:
The disclosure relates to an electronic memory system, and more specifically, to a system for storing data in an adjustably partitionable memory array, and a method to store data in an adjustably partitionable memory array. According to an embodiment of the disclosure, a system to store data in an adjustably partitionable memory array is provided, the system including a plurality of memory cells arranged in an array of rows and columns, a plurality of bit lines, and a plurality of switches, wherein each bit line is electrically coupled to a column of memory cells and each bit line comprises a switch configured to allow the respective bit line to be partitioned by opening of the switch.
Abstract:
A system and method for performing three scans for testing an address decoder and word line drive circuits is disclosed. The first scan determines whether only one word line is selected. The second scan determines whether the word line rise time to a target voltage level is within a specified time. Finally, the third scan determines whether the correct word line was selected.
Abstract:
The disclosure relates to systems and methods for performing a word line address scan in a semiconductor memory. More specifically, the disclosure provides a system and method for performing three scans for testing address decoder and word line drive circuits. The first scan determines whether only one word line is selected. The second scan determines whether the word line rise time to a target voltage level is within a specified time. Finally, the third scan determines whether the correct word line was selected. The present disclosure may realize all three scans or a combination of the three scans.