Method for manufacturing electronic device
    1.
    发明申请

    公开(公告)号:US20190027458A1

    公开(公告)日:2019-01-24

    申请号:US16142151

    申请日:2018-09-26

    Abstract: A method for manufacturing an electronic device is disclosed, which includes the following steps: providing a first substrate and modifying a surface of the first substrate to obtain a modified surface; applying silane or derivatives thereof on the modified surface to form an adhesion precursor layer; heat-treating the adhesion precursor layer to form an adhesion layer; forming an inorganic layer on the adhesion layer; and forming an active unit on the inorganic layer, wherein the inorganic layer is disposed between the adhesion layer and the active unit.

    HIGH-FREQUENCY ELECTRONIC DEVICE AND MANUFACTURING METHOD THEREOF

    公开(公告)号:US20200281068A1

    公开(公告)日:2020-09-03

    申请号:US16878675

    申请日:2020-05-20

    Abstract: A high-frequency electronic device including a dielectric substrate, a first patterned metal layer and a second patterned metal layer is provided. The dielectric substrate has a first region and a second region. The first patterned metal layer is disposed on a first side of the dielectric substrate and corresponds to the first region, wherein the first region and the second region have different etching rates with respect to an etching solution. The second patterned metal layer is disposed on the first side or a second side opposite to the first side of the dielectric substrate.

    HIGH-FREQUENCY ELECTRONIC DEVICE AND MANUFACTURING METHOD THEREOF

    公开(公告)号:US20180206329A1

    公开(公告)日:2018-07-19

    申请号:US15858004

    申请日:2017-12-29

    Abstract: A high-frequency electronic device including a dielectric substrate, a first patterned metal layer and a second patterned metal layer is provided. The dielectric substrate has a first region and a second region. The first patterned metal layer is disposed on a first side of the dielectric substrate and corresponds to the first region, wherein the first region and the second region have different etching rates with respect to an etching solution. The second patterned metal layer is disposed on the first side or a second side opposite to the first side of the dielectric substrate.

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