FULL DUPLEX DRAM FOR TIGHTLY COUPLED COMPUTE DIE AND MEMORY DIE

    公开(公告)号:US20220392519A1

    公开(公告)日:2022-12-08

    申请号:US17892000

    申请日:2022-08-19

    Abstract: Methods and apparatus for opportunistic full duplex DRAM for tightly coupled compute die and memory die. A memory controller includes one or more memory channel input-output (IO) interfaces having sets of read data (RdDQ) lines and write data (WrDQ) lines, and includes logic to implement concurrent read and write operations utilizing the RdDQ lines and WrDQ lines. A memory channel IO interface may be coupled to one or more memory devices such as DRAM DIMMs or DRAM/SDRAM dies having a mating IO interface, such as using through-silicon vias (TSVs) and die-to-die interconnects. Circuitry in a memory device or die includes a macro block of IO drivers coupled to the memory channel IO circuitry via a macro interface supporting full duplex operations. IO drivers in a macro block may be connected to memory banks using half-duplex bi-direction links to different banks or full duplex links to the same bank.

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