摘要:
By deciding a draw wiring route from a part to eliminate an intersection of wire connections generated by the part direction and the terminal arrangement order, it is possible to reduce the wiring layer used and increase the mounting density. Draw wiring processing from terminals of parts is performed prior to the entire wiring processing. In order to optimally perform the draw wiring processing, the parts connected to an object to be wired are moved onto a virtual wiring board and wiring processing is performed there. When moving a part from the real wiring board, an area around the part is cut out from the real wiring board and moved onto the virtual wiring board. On the virtual wiring board, the part direction is rotated and parallel-displaced to arrange it in the optimal state for the wiring to decide the draw wiring direction and perform wiring between the respective terminals.
摘要:
A wiring route deciding system, for a wiring board containing a multi-pin part, includes an input unit for receiving wiring board and wire connection information, wiring constraint information and wiring setting information, for example. The system further contains a draw wiring processing unit which decides a wiring route of a draw wiring from a part pin to a part periphery boundary based on wiring information inputted by the input unit, an inter-draw wire wiring processing unit which decides the wiring route taken between end points of the draw wiring decided by the draw wiring processing unit, and an output unit which outputs a wiring route information based on that decided by both the draw wiring processing unit and the inter-draw wire wiring processing unit. There is also provided a method counterpart for a wire routing scheme for a wiring board containing a multi-pin part.
摘要:
An electron beam-writing apparatus comprising a first beam-shaping aperture means and a second beam-shaping aperture means, wherein the first and/or second beam-shaping aperture means has an aperture(s) of a shape(s) corresponding to the desired patterns to be written on a semiconductor substrate; and an electron beam-writing method of improved throughput using the apparatus.
摘要:
With a conventional method for designing cell layout, it is necessary to give relative positional information in advance to all cells to be arranged. Furthermore, the method is troublesome because it is necessary to correct relative positional information of cells after confirming a result of temporary layout. Therefore, it takes time to obtain a layout result.The present invention extracts cells of a specific type specified from outside or cells satisfying specific conditions, arranges these specific cells first or limits a layout position by specifying a layout position, then arranges the remaining cells using a general layout algorithm.
摘要:
In an electron beam direct writing system having an aperture member, an evaluation aperture is provided for the aperture member for mapping evaluation patterns in a drawn pattern on a semiconductor substrate. Short lines having a predetermined width are arranged at first pitches in horizontal and vertical directions in peripheral portions of a first shot pattern to form a first line/interval pattern. Similarly, short lines are arranged at second pitches slightly different from the first pitches in the horizontal and vertical directions in peripheral portions of second and third shot patterns to form second line/interval patterns. Quantities of rotation and gain of a shot are determined from matching positions between evaluation patterns of the shot patterns. It is permitted in a short period of time to adjust the exposure dose, correct positional errors such as a stitching error, align component members and achieve an evaluation on reproductivity.
摘要:
A developing apparatus for electrophotography is disclosed which comprises a toner hopper as a vessel of a magnetic developer, the toner hopper having an opening formed between one side plate of the toner hopper and a developing sleeve to effect delivery and recovery of the magnetic developer, the developing sleeve being rotated from a developing zone for developing a latent image on a latent image-bearing member with the magnetic developer toward the opening and the plate of said toner hopper other than the opening being in abutting contact with the surface of the developing sleeve, a magnet roll comprising a plurality of magnets, which is rotated in the same direction as the rotation direction of the developing sleeve on the inner side of the developing sleeve, and a stopper for regulating the zone of delivery of a layer of the magnetic developer on the surface of the developing sleeve by causing the top end of the stopper to abut on or come close to the surface of the developing sleeve along the direction of the rotation axis of the developing sleeve, wherein the rotational speed of the developing sleeve and the number of rotations of the magnet roll are set so that the thickness of the layer of the magnetic developer is adjusted to a desired value.
摘要:
A reticle includes a first substrate including a first light-permeable substrate, and a first pattern formed on the first light-permeable substrate and having a first light transmittance, and a second substrate including a second light-permeable substrate, and a second pattern formed on the second light-permeable substrate and having a second light transmittance. The first and second substrates are coupled to each other such that the first and second patterns face each other. A part of the first and second patterns at which the first and second patterns overlap each other defines a light-impermeable pattern.
摘要:
An aperture plate for a charged beam drawing machine includes a body substrate having such a construction that opposite sides of a center plane in a thickness direction have the same structure. With this arrangement, it is possible to minimize a warp occurring in the course of forming the aperture plate, and therefore, the forming yield can be elevated.
摘要:
An electron-beam cell projection lithography apparatus includes an electron-beam source, a first aperture through which an electron-beam transmitted from the electron-beam source passes is shaped, and a second aperture formed with an aperture in a desired transfer pattern. The electron beam passes through the second aperture and irradiates an object. The second aperture is placed on a stage, which is movable in X and Y axes directions. A registration mark is placed or positioned on at least one of the second aperture and the stage. The apparatus also includes a device such as a microscope, a charge coupled device (CCD) for observing the registration mark to position the second aperture. The observing device has variable magnifications. The second aperture can be positioned by observing the registration mark with the observing device having variable magnifications. Thus, the second aperture is first roughly positioned by virtue of the registration mark by observing the second aperture and a wide area of the stage with the observing device adjusted to have low magnifications, and then accurately positioned with the observing device adjusted to have high magnifications. Thus, it is possible to align the registration mark with a reference point in a short period of time, thereby accomplishing rapid positional adjustment of the stage on which the second aperture is placed. In addition, since the second aperture can be wholly observed, it is possible to find defects and damages of a transfer pattern.
摘要:
Window-like openings are cut through an aperture with cell projecting blocks using an electron beam system with pattern writing capability, and isolated patterns are supported by microbridges in respective openings. Widths of the microbridges are less than the resolution limitation of the electron beam, and thereby isolated patterns, such as frame-shaped shading patterns, can be written of a resist film, and the through-put of the lithography process can be increased. The aperture with cell projecting blocks can be formed so as to utilize both positive and negative resist film masks.