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公开(公告)号：US11658000B2
公开(公告)日：2023-05-23
申请号：US16916720
申请日：2020-06-30
Applicant: JEOL Ltd.
Inventor： Yuji Konyuba , Tomohiro Haruta , Yuta Ikeda , Tomohisa Fukuda
CPC classification number: H01J37/20 , H01J37/26 , H01J2237/2002 , H01J2237/2007
Abstract: There is provided a sample support capable of easily placing a sample into position. The sample support is used such that a sample floating on the surface of water is scooped and held. The sample support has: a first region on which the sample is to be placed; and a second region of higher wettability than the first region.
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公开(公告)号：US10950412B2
公开(公告)日：2021-03-16
申请号：US16788752
申请日：2020-02-12
Applicant: JEOL Ltd.
Inventor： Tomohiro Haruta , Yuta Ikeda
IPC: H01J37/22 , G02B21/10 , G02B21/36 , H01J37/244 , H01J37/26
Abstract: An observation method includes: preparing a specimen including, as a mark a plurality of metal particles in which localized surface plasmon resonance is excited by irradiation with light; acquiring an optical microscope image by photographing the specimen with an optical microscope; acquiring an electron microscope image by photographing the specimen with an electron microscope; acquiring information of the positions and the colors of the plurality of metal particles in the optical microscope image; acquiring information of the positions and the particle diameters of the plurality of metal particles in the electron microscope image; and determining information for associating the optical microscope image and the electron microscope image based on the information of the positions and the colors of the plurality of metal particles acquired from the optical microscope image, and the information of the positions and the particle diameters of the plurality of metal particles acquired from the electron microscope image.
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公开(公告)号：US20200371331A1
公开(公告)日：2020-11-26
申请号：US16879904
申请日：2020-05-21
Applicant: JEOL Ltd.
Inventor： Yuta Ikeda , Tomohiro Haruta , Katsunori Ichikawa , Tomohisa Fukuda , Yuji Konyuba
Abstract: An image processing method includes: acquiring an optical microscope image of a specimen; acquiring a transmission electron microscope image of the specimen having been thinned; and superimposing the optical microscope image on the transmission electron microscope image and causing a display section to display the superimposed images, and in superimposing the optical microscope image on the transmission electron microscope image and causing the display section to display the superimposed images, the optical microscope image is distorted to match a field of view of the optical microscope image with a field of view of the transmission electron microscope image.
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公开(公告)号：US11953410B2
公开(公告)日：2024-04-09
申请号：US17378914
申请日：2021-07-19
Applicant: JEOL Ltd.
Inventor： Yuji Konyuba , Tomohiro Haruta , Tomohisa Fukuda , Yuta Ikeda , Yusuke Toriumi
CPC classification number: G01N1/2813 , G01N1/06
Abstract: A specimen support tool for supporting a slice prepared by using a microtome includes a specimen support member on which a groove for guiding the slice is formed.
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公开(公告)号：US20210156457A1
公开(公告)日：2021-05-27
申请号：US17101110
申请日：2020-11-23
Applicant: JEOL Ltd.
Inventor： Shuichi Yuasa , Masaaki Kobayashi , Yuta Ikeda
Abstract: An actuator has: a motor section; a ball spline having a finite stroke and equipped with a shaft capable of moving along its axis; an external screw thread formed on the shaft; a nut section having an internal screw thread engaging the external screw thread and operating to transmit the rotary force of the motor section to the shaft; and a case housing the motor section and the ball spline. The shaft has a contact section at its front end, the contact section being designed to make contact with the driven object. The contact section is lower than the shaft in thermal conductivity. Due to heat generated by the motor section, the shaft elongates along the axis of the shaft in a first direction, and the case elongates along the axis of the shaft in a second direction opposite to the first direction.
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Patent Agency Ranking
公开(公告)号：US20210005418A1
公开(公告)日：2021-01-07
申请号：US16916720
申请日：2020-06-30
Applicant: JEOL Ltd.
Inventor： Yuji Konyuba , Tomohiro Haruta , Yuta Ikeda , Tomohisa Fukuda
Abstract: There is provided a sample support capable of easily placing a sample into position. The sample support is used such that a sample floating on the surface of water is scooped and held. The sample support has: a first region on which the sample is to be placed; and a second region of higher wettability than the first region.
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公开(公告)号：US20220214250A1
公开(公告)日：2022-07-07
申请号：US17550002
申请日：2021-12-14
Applicant: JEOL Ltd.
Inventor： Yuji Konyuba , Tomohiro Haruta , Yuta Ikeda , Tomohisa Fukuda
IPC: G01N1/28
Abstract: A specimen pretreatment method for transferring a specimen supported by a first specimen supporting tool to a second specimen supporting tool, the specimen pretreatment method including: transferring a specimen supported by the first specimen supporting tool to a film; immersing the film and the specimen on the film in a liquid to dissolve the film; and recovering the specimen from the liquid and supporting the specimen with the second specimen supporting tool.
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公开(公告)号：US20220018742A1
公开(公告)日：2022-01-20
申请号：US17378914
申请日：2021-07-19
Applicant: JEOL Ltd.
Inventor： Yuji Konyuba , Tomohiro Haruta , Tomohisa Fukuda , Yuta Ikeda , Yusuke Toriumi
Abstract: A specimen support tool for supporting a slice prepared by using a microtome includes a specimen support member on which a groove for guiding the slice is formed.
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公开(公告)号：US11037755B2
公开(公告)日：2021-06-15
申请号：US16410243
申请日：2019-05-13
Applicant: JEOL Ltd.
Inventor： Yuji Konyuba , Yuta Ikeda , Tomohiro Haruta , Tomohisa Fukuda
IPC: H01J37/20 , H01J37/28 , H01J37/244
Abstract: An observation method includes placing a specimen on a specimen supporting film of a specimen support, attaching the specimen support to a retainer, attaching the retainer to an optical microscope retainer holding base, attaching the optical microscope retainer holding base to a specimen stage of an optical microscope and observing the specimen under the optical microscope, attaching the retainer to a transmission electron microscope retainer holding base, and loading the transmission electron microscope retainer holding base into a transmission electron microscope and observing the specimen under the transmission electron microscope.
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公开(公告)号：US20200266026A1
公开(公告)日：2020-08-20
申请号：US16788752
申请日：2020-02-12
Applicant: JEOL Ltd.
Inventor： Tomohiro Haruta , Yuta Ikeda
IPC: H01J37/22 , G02B21/36 , H01J37/244 , G02B21/10 , H01J37/26
Abstract: An observation method includes: preparing a specimen including, as a mark a plurality of metal particles in which localized surface plasmon resonance is excited by irradiation with light; acquiring an optical microscope image by photographing the specimen with an optical microscope; acquiring an electron microscope image by photographing the specimen with an electron microscope; acquiring information of the positions and the colors of the plurality of metal particles in the optical microscope image; acquiring information of the positions and the particle diameters of the plurality of metal particles in the electron microscope image; and determining information for associating the optical microscope image and the electron microscope image based on the information of the positions and the colors of the plurality of metal particles acquired from the optical microscope image, and the information of the positions and the particle diameters of the plurality of metal particles acquired from the electron microscope image.
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