Image sensor cells
    1.
    发明授权
    Image sensor cells 有权
    图像传感器单元

    公开(公告)号:US07205627B2

    公开(公告)日:2007-04-17

    申请号:US10906510

    申请日:2005-02-23

    IPC分类号: H01L31/06

    摘要: A structure (and method for forming the same) for an image sensor cell. The structure includes (a) a semiconductor substrate; (b) a charge collection well on the substrate, the charge collection well comprising a semiconductor material doped with a first doping polarity; (c) a surface pinning layer on and in direct physical contact with the charge collection well, the surface pinning layer comprising a semiconductor material doped with a second doping polarity opposite to the first doping polarity; and (d) an electrically conducting push electrode being in direct physical contact with the surface pinning layer but not being in direct physical contact with the charge collection well.

    摘要翻译: 用于图像传感器单元的结构(及其形成方法)。 该结构包括(a)半导体衬底; (b)在所述衬底上的电荷收集阱,所述电荷收集阱包括掺杂有第一掺杂极性的半导体材料; (c)与电荷收集阱直接物理接触的表面钉扎层,所述表面钉扎层包括掺杂有与第一掺杂极性相反的第二掺杂极性的半导体材料; 和(d)与表面钉扎层直接物理接触但不与电荷收集阱直接物理接触的导电推动电极。

    Image sensor cells
    2.
    发明授权
    Image sensor cells 失效
    图像传感器单元

    公开(公告)号:US07491992B2

    公开(公告)日:2009-02-17

    申请号:US11619024

    申请日:2007-01-02

    IPC分类号: H01L31/62 H01L31/113

    摘要: A structure (and method for forming the same) for an image sensor cell. The method includes providing a semiconductor substrate. Then, a charge collection well is formed in the semiconductor substrate, the charge collection well comprising dopants of a first doping polarity. Next, a surface pinning layer is formed in the charge collection well, the surface pinning layer comprising dopants of a second doping polarity opposite to the first doping polarity. Then, an electrically conductive push electrode is formed in direct physical contact with the surface pinning layer but not in direct physical contact with the charge collection well. Then, a transfer transistor is formed on the semiconductor substrate. The transfer transistor includes first and second source/drain regions and a channel region. The first and second source/drain regions comprise dopants of the first doping polarity. The first source/drain region is in direct physical contact with the charge collection well.

    摘要翻译: 用于图像传感器单元的结构(及其形成方法)。 该方法包括提供半导体衬底。 然后,在半导体衬底中形成电荷收集阱,电荷收集阱包含第一掺杂极性的掺杂剂。 接下来,在电荷收集阱中形成表面钉扎层,表面钉扎层包括与第一掺杂极性相反的第二掺杂极性的掺杂剂。 然后,导电的推动电极形成为与表面钉扎层直接物理接触,但不与电荷收集阱直接物理接触。 然后,在半导体衬底上形成传输晶体管。 传输晶体管包括第一和第二源极/漏极区域和沟道区域。 第一和第二源/漏区包括第一掺杂极性的掺杂剂。 第一源极/漏极区域与电荷收集阱直接物理接触。

    HIGH EFFICIENCY CMOS IMAGE SENSOR PIXEL EMPLOYING DYNAMIC VOLTAGE SUPPLY
    3.
    发明申请
    HIGH EFFICIENCY CMOS IMAGE SENSOR PIXEL EMPLOYING DYNAMIC VOLTAGE SUPPLY 有权
    高效CMOS图像传感器像素采用动态电压供应

    公开(公告)号:US20090236644A1

    公开(公告)日:2009-09-24

    申请号:US12050967

    申请日:2008-03-19

    摘要: A global shutter compatible pixel circuit comprising a reset gate (RG) transistor is provided in which a dynamic voltage is applied to the drain of the reset gate transistor in order to reduce a floating diffusion (FD) leakage therethrough during signal hold time. The drain voltage of the reset gate transistor is held at a lower voltage than a circuit supply voltage to minimize the off-state leakage through the RG transistor, thus reducing the change in the voltage at the floating diffusion during the signal hold time. In addition, a design structure for such a circuit providing a dynamic voltage to the drain of a reset gate of a pixel circuit is also provided.

    摘要翻译: 提供了包括复位栅极(RG)晶体管的全局快门兼容像素电路,其中动态电压被施加到复位栅极晶体管的漏极,以便减少在信号保持时间期间通过其的浮动扩散(FD)泄漏。 复位栅极晶体管的漏极电压保持在比电路电源电压更低的电压,以最小化通过RG晶体管的截止状态泄漏,从而减少在信号保持时间期间浮动扩散时的电压变化。 此外,还提供了用于向像素电路的复位栅极的漏极提供动态电压的这种电路的设计结构。

    HIGH EFFICIENCY CMOS IMAGE SENSOR PIXEL EMPLOYING DYNAMIC VOLTAGE SUPPLY
    4.
    发明申请
    HIGH EFFICIENCY CMOS IMAGE SENSOR PIXEL EMPLOYING DYNAMIC VOLTAGE SUPPLY 失效
    高效CMOS图像传感器像素采用动态电压供应

    公开(公告)号:US20100097511A1

    公开(公告)日:2010-04-22

    申请号:US12641589

    申请日:2009-12-18

    IPC分类号: H04N5/335 G06F17/50

    摘要: A global shutter compatible pixel circuit comprising a reset gate (RG) transistor is provided in which a dynamic voltage is applied to the drain of the reset gate transistor in order to reduce a floating diffusion (FD) leakage therethrough during signal hold time. The drain voltage of the reset gate transistor is held at a lower voltage than a circuit supply voltage to minimize the off-state leakage through the RG transistor, thus reducing the change in the voltage at the floating diffusion during the signal hold time. In addition, a design structure for such a circuit providing a dynamic voltage to the drain of a reset gate of a pixel circuit is also provided.

    摘要翻译: 提供了包括复位栅极(RG)晶体管的全局快门兼容像素电路,其中动态电压被施加到复位栅极晶体管的漏极,以便减少在信号保持时间期间通过其的浮动扩散(FD)泄漏。 复位栅极晶体管的漏极电压保持在比电路电源电压更低的电压,以最小化通过RG晶体管的截止状态泄漏,从而减少信号保持时间期间浮动扩散时的电压变化。 此外,还提供了用于向像素电路的复位栅极的漏极提供动态电压的这种电路的设计结构。

    High efficiency CMOS image sensor pixel employing dynamic voltage supply
    5.
    发明授权
    High efficiency CMOS image sensor pixel employing dynamic voltage supply 失效
    采用动态电压源的高效率CMOS图像传感器像素

    公开(公告)号:US08023021B2

    公开(公告)日:2011-09-20

    申请号:US12641589

    申请日:2009-12-18

    IPC分类号: H04N5/335

    摘要: A global shutter compatible pixel circuit comprising a reset gate (RG) transistor is provided in which a dynamic voltage is applied to the drain of the reset gate transistor in order to reduce a floating diffusion (FD) leakage therethrough during signal hold time. The drain voltage of the reset gate transistor is held at a lower voltage than a circuit supply voltage to minimize the off-state leakage through the RG transistor, thus reducing the change in the voltage at the floating diffusion during the signal hold time. In addition, a design structure for such a circuit providing a dynamic voltage to the drain of a reset gate of a pixel circuit is also provided.

    摘要翻译: 提供了包括复位栅极(RG)晶体管的全局快门兼容像素电路,其中动态电压被施加到复位栅极晶体管的漏极,以便减少在信号保持时间期间通过其的浮动扩散(FD)泄漏。 复位栅极晶体管的漏极电压保持在比电路电源电压更低的电压,以最小化通过RG晶体管的截止状态泄漏,从而减少信号保持时间期间浮动扩散时的电压变化。 此外,还提供了用于向像素电路的复位栅极的漏极提供动态电压的这种电路的设计结构。

    SILICIDE STRAPPING IN IMAGER TRANSFER GATE DEVICE
    6.
    发明申请
    SILICIDE STRAPPING IN IMAGER TRANSFER GATE DEVICE 有权
    图像转印门装置中的硅胶缠绕

    公开(公告)号:US20100136733A1

    公开(公告)日:2010-06-03

    申请号:US12699419

    申请日:2010-02-03

    IPC分类号: H01L31/18

    摘要: A CMOS active pixel sensor (APS) cell structure having dual workfunction transfer gate device and method of fabrication. The transfer gate device comprises a dielectric layer formed on a substrate and a dual workfunction gate conductor layer formed on the dielectric layer comprising a first conductivity type doped region and an abutting second conductivity type doped region. The transfer gate device defines a channel region where charge accumulated by a photosensing device is transferred to a diffusion region. A silicide structure is formed atop the dual workfunction gate conductor layer for electrically coupling the first and second conductivity type doped regions. In one embodiment, the silicide contact is smaller in area dimension than an area dimension of said dual workfunction gate conductor layer. Presence of the silicide strap prevents the diodic behavior from allowing one or the other side of the gate to float to an indeterminate voltage.

    摘要翻译: 具有双功能转移栅极器件和制造方法的CMOS有源像素传感器(APS)单元结构。 传输栅极器件包括形成在衬底上的电介质层和形成在包括第一导电类型掺杂区和邻接第二导电类型掺杂区的电介质层上的双功函数栅导体层。 传输门装置限定了由光敏装置累积的电荷被传送到扩散区的沟道区。 在双功函数栅极导体层顶部形成硅化物结构,用于电耦合第一和第二导电类型掺杂区域。 在一个实施例中,硅化物接触面积尺寸小于所述双功函数栅极导体层的面积尺寸。 硅化物带的存在防止了双极性行为允许栅极的一侧或另一侧浮动到不确定的电压。

    Silicide strapping in imager transfer gate device
    7.
    发明授权
    Silicide strapping in imager transfer gate device 有权
    成像器中的硅化物贴带传输门装置

    公开(公告)号:US07675097B2

    公开(公告)日:2010-03-09

    申请号:US11565801

    申请日:2006-12-01

    IPC分类号: H01L27/146

    摘要: A CMOS active pixel sensor (APS) cell structure having dual workfunction transfer gate device and method of fabrication. The transfer gate device comprises a dielectric layer formed on a substrate and a dual workfunction gate conductor layer formed on the dielectric layer comprising a first conductivity type doped region and an abutting second conductivity type doped region. The transfer gate device defines a channel region where charge accumulated by a photosensing device is transferred to a diffusion region. A silicide structure is formed atop the dual workfunction gate conductor layer for electrically coupling the first and second conductivity type doped regions. In one embodiment, the silicide contact is smaller in area dimension than an area dimension of said dual workfunction gate conductor layer. Presence of the silicide strap prevents the diodic behavior from allowing one or the other side of the gate to float to an indeterminate voltage.

    摘要翻译: 具有双功能转移栅极器件和制造方法的CMOS有源像素传感器(APS)单元结构。 传输栅极器件包括形成在衬底上的电介质层和形成在包括第一导电类型掺杂区和邻接第二导电类型掺杂区的电介质层上的双功函数栅导体层。 传输门装置限定了由光敏装置累积的电荷被传送到扩散区的沟道区。 在双功函数栅极导体层顶部形成硅化物结构,用于电耦合第一和第二导电类型掺杂区域。 在一个实施例中,硅化物接触面积尺寸小于所述双功函数栅极导体层的面积尺寸。 硅化物带的存在防止了双极性行为允许栅极的一侧或另一侧浮动到不确定的电压。

    SILICIDE STRAPPING IN IMAGER TRANSFER GATE DEVICE
    8.
    发明申请
    SILICIDE STRAPPING IN IMAGER TRANSFER GATE DEVICE 有权
    图像转印门装置中的硅胶缠绕

    公开(公告)号:US20080128767A1

    公开(公告)日:2008-06-05

    申请号:US11565801

    申请日:2006-12-01

    IPC分类号: H01L27/146 H01L31/18

    摘要: A CMOS active pixel sensor (APS) cell structure having dual workfunction transfer gate device and method of fabrication. The transfer gate device comprises a dielectric layer formed on a substrate and a dual workfunction gate conductor layer formed on the dielectric layer comprising a first conductivity type doped region and an abutting second conductivity type doped region. The transfer gate device defines a channel region where charge accumulated by a photosensing device is transferred to a diffusion region. A silicide structure is formed atop the dual workfunction gate conductor layer for electrically coupling the first and second conductivity type doped regions. In one embodiment, the silicide contact is smaller in area dimension than an area dimension of said dual workfunction gate conductor layer. Presence of the silicide strap prevents the diodic behavior from allowing one or the other side of the gate to float to an indeterminate voltage.

    摘要翻译: 具有双功能转移栅极器件和制造方法的CMOS有源像素传感器(APS)单元结构。 传输栅极器件包括形成在衬底上的电介质层和形成在包括第一导电类型掺杂区和邻接第二导电类型掺杂区的电介质层上的双功函数栅导体层。 传输门装置限定了由光敏装置累积的电荷被传送到扩散区的沟道区。 在双功函数栅极导体层顶部形成硅化物结构,用于电耦合第一和第二导电类型掺杂区域。 在一个实施例中,硅化物接触面积尺寸小于所述双功函数栅极导体层的面积尺寸。 硅化物带的存在防止了双极性行为允许栅极的一侧或另一侧浮动到不确定的电压。

    Methods of forming silicide strapping in imager transfer gate device
    9.
    发明授权
    Methods of forming silicide strapping in imager transfer gate device 有权
    在成像器传输门装置中形成硅化物带的方法

    公开(公告)号:US08158453B2

    公开(公告)日:2012-04-17

    申请号:US12699419

    申请日:2010-02-03

    IPC分类号: H01L21/336

    摘要: A CMOS active pixel sensor (APS) cell structure having dual workfunction transfer gate device and method of fabrication. The transfer gate device comprises a dielectric layer formed on a substrate and a dual workfunction gate conductor layer formed on the dielectric layer comprising a first conductivity type doped region and an abutting second conductivity type doped region. The transfer gate device defines a channel region where charge accumulated by a photosensing device is transferred to a diffusion region. A silicide structure is formed atop the dual workfunction gate conductor layer for electrically coupling the first and second conductivity type doped regions. In one embodiment, the silicide contact is smaller in area dimension than an area dimension of said dual workfunction gate conductor layer. Presence of the silicide strap prevents the diodic behavior from allowing one or the other side of the gate to float to an indeterminate voltage.

    摘要翻译: 具有双功能转移栅极器件和制造方法的CMOS有源像素传感器(APS)单元结构。 传输栅极器件包括形成在衬底上的电介质层和形成在包括第一导电类型掺杂区和邻接第二导电类型掺杂区的电介质层上的双功函数栅导体层。 传输门装置限定了由光敏装置累积的电荷被传送到扩散区的沟道区。 在双功函数栅极导体层顶部形成硅化物结构,用于电耦合第一和第二导电类型掺杂区域。 在一个实施例中,硅化物接触面积尺寸小于所述双功函数栅极导体层的面积尺寸。 硅化物带的存在防止了双极性行为允许栅极的一侧或另一侧浮动到不确定的电压。

    High efficiency CMOS image sensor pixel employing dynamic voltage supply
    10.
    发明授权
    High efficiency CMOS image sensor pixel employing dynamic voltage supply 有权
    采用动态电压源的高效率CMOS图像传感器像素

    公开(公告)号:US07655966B2

    公开(公告)日:2010-02-02

    申请号:US12050967

    申请日:2008-03-19

    IPC分类号: H04N3/14

    摘要: A global shutter compatible pixel circuit comprising a reset gate (RG) transistor is provided in which a dynamic voltage is applied to the drain of the reset gate transistor in order to reduce a floating diffusion (FD) leakage therethrough during signal hold time. The drain voltage of the reset gate transistor is held at a lower voltage than a circuit supply voltage to minimize the off-state leakage through the RG transistor, thus reducing the change in the voltage at the floating diffusion during the signal hold time. In addition, a design structure for such a circuit providing a dynamic voltage to the drain of a reset gate of a pixel circuit is also provided.

    摘要翻译: 提供了包括复位栅极(RG)晶体管的全局快门兼容像素电路,其中动态电压被施加到复位栅极晶体管的漏极,以便减少在信号保持时间期间通过其的浮动扩散(FD)泄漏。 复位栅极晶体管的漏极电压保持在比电路电源电压更低的电压,以最小化通过RG晶体管的截止状态泄漏,从而减少信号保持时间期间浮动扩散时的电压变化。 此外,还提供了用于向像素电路的复位栅极的漏极提供动态电压的这种电路的设计结构。