Insulation hanger and method
    1.
    发明授权
    Insulation hanger and method 失效
    绝缘衣架及方法

    公开(公告)号:US4592688A

    公开(公告)日:1986-06-03

    申请号:US522555

    申请日:1983-08-12

    申请人: James W. Kramer

    发明人: James W. Kramer

    IPC分类号: E04F13/08 F16B21/02 F27D1/14

    摘要: A hanger assembly for securing insulation or refractory linings to walls includes a circular stud which includes a flattened locking section of relatively short axial extent forming laterally projecting lugs, a somewhat less flattened anti-rotation section of substantial axial extent inwardly adjacent the locking section, and an unflattened or rotation section of short axial extent inwardly adjacent the anti-rotation section, whereby a quarter-turn retaining washer may be positioned over the stud to the rotation section, rotated a quarter turn and then moved outwardly along the anti-rotation section to engage and lock against the underside of the locking section. The locking and anti-rotation sections may be repeated throughout the length of the stud by a selective flattening of round metal stock so that insulation layers of various thickness may be held to the wall without the possibility of vibration permitting the retaining washer to vibrate free of the locking section, rotate, and become disengaged from the stud.

    摘要翻译: 用于将绝缘或耐火衬里固定到墙壁的衣架组件包括圆形螺柱,其包括形成横向突出的凸耳的相对短的轴向范围的扁平的锁定部分,相对于锁定部分向内相对轴向延伸的稍微平坦的防旋转部分,以及 一个短轴向范围内的未平坦或旋转部分,其内部相邻于防旋转部分,由此四分之一圈的保持垫圈可以定位在螺柱上方到旋转部分上,旋转四分之一转,然后沿着防旋转部分向外移动 接合并锁定在锁定部分的下侧。 锁定和防旋转部分可以通过圆形金属坯料的选择性扁平化在螺柱的整个长度上重复,使得各种厚度的绝缘层可以保持在壁上,而没有振动的可能性,使得保持垫圈不会振动 锁定部分旋转,并从螺柱脱离。

    Height scanning interferometry method and apparatus including phase gap analysis
    2.
    发明授权
    Height scanning interferometry method and apparatus including phase gap analysis 有权
    高度扫描​​干涉测量方法和装置包括相差分析

    公开(公告)号:US06775006B2

    公开(公告)日:2004-08-10

    申请号:US10053106

    申请日:2001-11-02

    IPC分类号: G01B902

    摘要: An analysis method for analyzing height-scanning interferometry data from a test surface, the method including: calculating a coherence profile and a phase profile for the test surface based on the data; calculating an experimental phase gap map based on a difference between the phase profile and the coherence profile; filtering the experimental phase gap map to remove noise; and using the filtered phase gap map to improve an estimate for a height profile of the test surface.

    摘要翻译: 一种用于从测试表面分析高度扫描干涉测量数据的分析方法,所述方法包括:基于所述数据计算所述测试表面的相干分布和相位分布; 基于相位轮廓和相干轮廓之间的差异计算实验相位差图; 过滤实验相位图去除噪声; 并且使用滤波相位图来改善测试表面的高度分布的估计。

    Height scanning interferometer for determining the absolute position and surface profile of an object with respect to a datum
    3.
    发明授权
    Height scanning interferometer for determining the absolute position and surface profile of an object with respect to a datum 有权
    用于确定物体相对于基准的绝对位置和表面轮廓的高度扫描干涉仪

    公开(公告)号:US06597460B2

    公开(公告)日:2003-07-22

    申请号:US09769891

    申请日:2001-01-25

    IPC分类号: G01B902

    摘要: The invention features a surface profiling method including: collecting interferometric data related to a surface profile of a measurement object; and calculating the surface profile based on the collected interferometric data and at least one value indicative of dispersion in the phase change on reflection (PCOR) of the profiled surface of the measurement object. The invention also features a surface profiling system including: an interferometry system which during operation provides interferometric data related to a surface profile of a measurement object; and an electronic processor coupled the interferometry system, wherein during operation the electronic processor calculates the surface profile based on the interferometric data and at least one parameter indicative of dispersion in the phase change on reflection (PCOR) of the profiled surface of the measurement object.

    摘要翻译: 本发明的特征在于一种表面分析方法,包括:收集与测量对象的表面轮廓相关的干涉测量数据; 以及基于所收集的干涉测量数据和指示测量对象的成型表面的反射相位变化(PCOR)中的色散的至少一个值来计算表面轮廓。 本发明还具有表面分布系统,其包括:干涉测量系统,其在操作期间提供与测量对象的表面轮廓相关的干涉测量数据; 以及耦合所述干涉测量系统的电子处理器,其中在操作期间,所述电子处理器基于所述干涉测量数据和指示所述测量对象的成型表面的反射相位变化(PCOR)上的色散的至少一个参数来计算所述表面轮廓。