公开(公告)号：US08396998B2

公开(公告)日：2013-03-12

申请号：US12965699

申请日：2010-12-10

申请人： Jerry N. Le ,  Ngoc V. Le ,  Tat Leung Lai ,  Ramon S. Co

发明人： Jerry N. Le ,  Ngoc V. Le ,  Tat Leung Lai ,  Ramon S. Co

IPC分类号： G06F3/00 ,  G06F5/00

CPC分类号： G06F11/273 ,  G11C11/406 ,  G11C29/56 ,  G11C2029/5602

摘要： A diagnostic extender card is plugged into a memory module socket on a personal computer (PC) motherboard. The extender card has a test socket that receives a memory module and an intercepting decoder chip that receives the chip-select (CS) from the motherboard that selects the memory module for access. When CS is activated, the intercepting decoder chip illuminates a visual indicator on the extender card, allowing a user to locate a memory module being accessed. The exact translation or mapping from logical addresses of test programs to physical addresses of the memory modules is not needed, since the visual indicator shows which memory module is really being accessed, regardless of proprietary address mapping by north bridge chips. Operating system memory accesses are filtered out by a counter that counts accesses during a period set by a timer. When the number of accesses exceeds a threshold, the visual indicator is lit.

摘要翻译： 诊断扩展卡插入个人计算机（PC）主板上的内存模块插槽。 扩展卡具有接收存储器模块的测试插座和从主板接收芯片选择（CS）的截取解码器芯片，其选择存储器模块进行访问。 当CS被激活时，拦截解码器芯片照亮扩展卡上的视觉指示符，允许用户定位被访问的存储器模块。 不需要将测试程序的逻辑地址到存储器模块的物理地址的精确翻译或映射，因为可视指示器显示了正在被访问的存储器模块，而不考虑北桥芯片的专有地址映射。 操作系统存储器访问由在定时器设置的周期内对存取进行计数的计数器滤除。 当访问次数超过阈值时，视觉指示灯亮起。

公开(公告)号：US20120151287A1

公开(公告)日：2012-06-14

申请号：US12965699

申请日：2010-12-10

申请人： Jerry N. Le ,  Ngoc V. Le ,  Tat Leung Lai ,  Ramon S. Co

发明人： Jerry N. Le ,  Ngoc V. Le ,  Tat Leung Lai ,  Ramon S. Co

IPC分类号： G11C29/00 ,  G11C29/56

CPC分类号： G06F11/273 ,  G11C11/406 ,  G11C29/56 ,  G11C2029/5602

摘要： A diagnostic extender card is plugged into a memory module socket on a personal computer (PC) motherboard. The extender card has a test socket that receives a memory module and an intercepting decoder chip that receives the chip-select (CS) from the motherboard that selects the memory module for access. When CS is activated, the intercepting decoder chip illuminates a visual indicator on the extender card, allowing a user to locate a memory module being accessed. The exact translation or mapping from logical addresses of test programs to physical addresses of the memory modules is not needed, since the visual indicator shows which memory module is really being accessed, regardless of proprietary address mapping by north bridge chips. Operating system memory accesses are filtered out by a counter that counts accesses during a period set by a timer. When the number of accesses exceeds a threshold, the visual indicator is lit.

摘要翻译： 诊断扩展卡插入个人计算机（PC）主板上的内存模块插槽。 扩展卡具有接收存储器模块的测试插座和从主板接收芯片选择（CS）的截取解码器芯片，其选择存储器模块进行访问。 当CS被激活时，拦截解码器芯片照亮扩展卡上的视觉指示符，允许用户定位被访问的存储器模块。 不需要将测试程序的逻辑地址到存储器模块的物理地址的精确翻译或映射，因为可视指示器显示了正在被访问的存储器模块，而不考虑北桥芯片的专有地址映射。 操作系统存储器访问由在定时器设置的周期内对存取进行计数的计数器滤除。 当访问次数超过阈值时，视觉指示灯亮起。

公开(公告)号：US20130151904A1

公开(公告)日：2013-06-13

申请号：US13760948

申请日：2013-02-06

申请人： Jerry N. Le ,  Ngoc V. Le ,  Tat Leung Lai ,  Ramon S. Co

发明人： Jerry N. Le ,  Ngoc V. Le ,  Tat Leung Lai ,  Ramon S. Co

IPC分类号： G06F11/273

CPC分类号： G06F11/273 ,  G11C11/406 ,  G11C29/56 ,  G11C2029/5602

摘要： A diagnostic extender card is plugged into a memory module socket on a personal computer (PC) motherboard. The extender card has a test socket that receives a memory module and an intercepting decoder chip that receives the chip-select (CS) from the motherboard that selects the memory module for access. When CS is activated, the intercepting decoder chip illuminates a visual indicator on the extender card, allowing a user to locate a memory module being accessed. The exact translation or mapping from logical addresses of test programs to physical addresses of the memory modules is not needed, since the visual indicator shows which memory module is really being accessed, regardless of proprietary address mapping by north bridge chips. Operating system memory accesses are filtered out by a counter that counts accesses during a period set by a timer. When the number of accesses exceeds a threshold, the visual indicator is lit.

摘要翻译： 诊断扩展卡插入个人计算机（PC）主板上的内存模块插槽。 扩展卡具有接收存储器模块的测试插座和从主板接收芯片选择（CS）的截取解码器芯片，其选择存储器模块进行访问。 当CS被激活时，拦截解码器芯片照亮扩展卡上的视觉指示符，允许用户定位被访问的存储器模块。 不需要将测试程序的逻辑地址到存储器模块的物理地址的精确翻译或映射，因为可视指示器显示了正在被访问的存储器模块，而不考虑北桥芯片的专有地址映射。 操作系统存储器访问由在定时器设置的周期内对存取进行计数的计数器滤除。 当访问次数超过阈值时，视觉指示灯亮起。

公开(公告)号：US08738819B2

公开(公告)日：2014-05-27

申请号：US13760948

申请日：2013-02-06

申请人： Jerry N. Le ,  Ngoc V. Le ,  Tat Leung Lai ,  Ramon S. Co

发明人： Jerry N. Le ,  Ngoc V. Le ,  Tat Leung Lai ,  Ramon S. Co

IPC分类号： G06F3/00

CPC分类号： G06F11/273 ,  G11C11/406 ,  G11C29/56 ,  G11C2029/5602

摘要： A diagnostic extender card is plugged into a memory module socket on a personal computer (PC) motherboard. The extender card has a test socket that receives a memory module and an intercepting decoder chip that receives the chip-select (CS) from the motherboard that selects the memory module for access. When CS is activated, the intercepting decoder chip illuminates a visual indicator on the extender card, allowing a user to locate a memory module being accessed. The exact translation or mapping from logical addresses of test programs to physical addresses of the memory modules is not needed, since the visual indicator shows which memory module is really being accessed, regardless of proprietary address mapping by north bridge chips. Operating system memory accesses are filtered out by a counter that counts accesses during a period set by a timer. When the number of accesses exceeds a threshold, the visual indicator is lit.

摘要翻译： 诊断扩展卡插入个人计算机（PC）主板上的内存模块插槽。 扩展卡具有接收存储器模块的测试插座和从主板接收芯片选择（CS）的截取解码器芯片，其选择存储器模块进行访问。 当CS被激活时，拦截解码器芯片照亮扩展卡上的视觉指示符，允许用户定位被访问的存储器模块。 不需要将测试程序的逻辑地址到存储器模块的物理地址的精确翻译或映射，因为可视指示器显示了正在被访问的存储器模块，而不考虑北桥芯片的专有地址映射。 操作系统存储器访问由在定时器设置的周期内对存取进行计数的计数器滤除。 当访问次数超过阈值时，视觉指示灯亮起。

公开(公告)号：US07163888B2

公开(公告)日：2007-01-16

申请号：US10995800

申请日：2004-11-22

申请人： Kathy A. Gehoski ,  William J. Dauksher ,  Ngoc V. Le ,  Douglas J. Resnick

发明人： Kathy A. Gehoski ,  William J. Dauksher ,  Ngoc V. Le ,  Douglas J. Resnick

IPC分类号： H01L21/4763

CPC分类号： G03F7/0002 ,  B82Y10/00 ,  B82Y30/00 ,  B82Y40/00 ,  H01L21/76814 ,  H01L21/76838

摘要： A direct imprinting process for Step and Flash Imprint Lithography includes providing (40) a substrate (12); forming (44) an etch barrier layer (14) on the substrate; patterning (46) the etch barrier layer with a template (16) while curing with ultraviolet light through the template, resulting in a patterned etch barrier layer and a residual layer (20) on the substrate; and performing (48) an etch to substantially remove the residual layer. Optionally, a patterning layer (52) may be formed on the substrate (12) prior to forming the etch barrier layer (14). Additionally, an adhesive layer (13) may be applied (42) between the substrate (12) and the etch barrier layer (14).

摘要翻译： 步进和闪光印记光刻技术的直接印刷工艺包括提供（40）基材（12）; 在衬底上形成（44）蚀刻阻挡层（14）; 在通过模板的紫外线固化的同时用模板（16）对蚀刻阻挡层进行图案化（46），从而在衬底上产生图案化的蚀刻阻挡层和残余层（20）; 并执行（48）蚀刻以基本上去除残留层。 可选地，在形成蚀刻阻挡层（14）之前，可以在衬底（12）上形成图案化层（52）。 另外，可以在衬底（12）和蚀刻阻挡层（14）之间施加粘合剂层（13）（42）。

公开(公告)号：US07378346B2

公开(公告)日：2008-05-27

申请号：US11387468

申请日：2006-03-22

申请人： Ngoc V. Le ,  Jeffrey H. Baker ,  Diana J. Convey ,  Paige M. Holm ,  Steven M. Smith

发明人： Ngoc V. Le ,  Jeffrey H. Baker ,  Diana J. Convey ,  Paige M. Holm ,  Steven M. Smith

IPC分类号： H01L21/302 ,  H01L21/461

CPC分类号： G01J3/26 ,  G02B5/284

摘要： A method is provided for forming a monolithically integrated optical filter, for example, a Fabry-Perot filter, over a substrate (10). The method comprises forming a first mirror (16) over the substrate (10). A plurality of etalon material layers (32, 34, 36, 38) are formed over the mirror (16), and a plurality of etch stop layers (42, 44, 46) are formed, one each between adjacent etalon material layers (32, 34, 36, 38). A photoresist is patterned to create an opening (54) over the top etalon material layer (38) and an etch (56) is performed down to the top etch stop layer (46). An oxygen plasma (58) may be applied to convert the etch stop layer (46) within the opening (54) to silicon dioxide (57). The photoresist patterning, etching, and applying of an oxygen plasma may be repeated as desired to obtain the desired number of levels (82, 84, 86, 88). A second mirror (72) is then formed on each of the levels (82, 84, 86, 88).

摘要翻译： 提供了一种用于在衬底（10）上形成单片集成滤光器（例如法布里 - 珀罗滤光片）的方法。 该方法包括在衬底（10）上形成第一反射镜（16）。 多个标准具材料层（32,34,36,38）形成在反射镜（16）上方，并且形成多个蚀刻停止层（42,44,46），每个蚀刻停止层之间相邻的标准具材料层（32 ，34,36,38）。 图案化光致抗蚀剂以在顶部标准具材料层（38）上方形成开口（54），并且向下蚀刻停止层（46）进行蚀刻（56）。 可以施加氧等离子体（58）以将开口（54）内的蚀刻停止层（46）转化为二氧化硅（57）。 可以根据需要重复光刻胶图案化，蚀刻和施加氧等离子体以获得所需数量的水平（82,84,86,88）。 然后在每个级（82,84,86,88）上形成第二反射镜（72）。

公开(公告)号：US07125796B2

公开(公告)日：2006-10-24

申请号：US11000832

申请日：2004-11-30

申请人： Donald F. Weston ,  William J. Dauksher ,  Ngoc V. Le

发明人： Donald F. Weston ,  William J. Dauksher ,  Ngoc V. Le

IPC分类号： H01L21/4763 ,  H01L21/461

CPC分类号： H01L21/76802 ,  H01L21/76838 ,  H01L23/5226 ,  H01L2924/0002 ,  H01L2924/00

摘要： A process is provided for fabricating a via 52 between bonded wafers without undercutting an organic bonding material 32. The process for forming the via 52 in a structure including a dielectric material 14 and an organic bonding material 32, comprises forming a resist material 42 on the dielectric layer 14 and etching through the dielectric layer 14 and the organic bonding material 32 with 60CF4/20Ar/60CHF3/20N2. The resist may then be removed with an anisotropic high density oxygen plasma.

摘要翻译： 提供了一种用于在接合的晶片之间制造通孔52的工艺，而没有切割有机粘合材料32。 在包括电介质材料14和有机接合材料32的结构中形成通孔52的工艺包括在电介质层14上形成抗蚀剂材料42，并通过电介质层14和有机接合材料32以60CF _{4 / 20Ar / 60CHF 3 / 20N 2 。 然后可以用各向异性高密度氧等离子体除去抗蚀剂。}